Advanced analytical techniques for characterization of 2d materials:
This timely and comprehensive book focuses on various analytical techniques used for 2D materials. It explores different characterization techniques to understand the structural features and properties of as-synthesized 2D materials and explores optical microscopy, atomic force microscopy (AFM), sca...
Gespeichert in:
| Weitere Verfasser: | , |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Melville
AIP Publishing
2022
|
| Ausgabe: | First edition |
| Schlagworte: | |
| Online-Zugang: | UBT01 URL des Erstveröffentlichers |
| Zusammenfassung: | This timely and comprehensive book focuses on various analytical techniques used for 2D materials. It explores different characterization techniques to understand the structural features and properties of as-synthesized 2D materials and explores optical microscopy, atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS). Advanced Analytical Techniques for Characterization of 2D Materials: -- Compiles a range of modern material characterizations of 2D materials for the first time. -- Includes a review of recent advances and provides a practical guide for traditional analytical techniques. -- Offers a pragmatic approach to the various analytical methods and recent advances Research scholars and experienced researchers, scientists, technologists, and industrialists beginning their research into the exciting field of 2D nanotechnology will find this book a valuable resource and excellent guideline to explore novel materials and their properties |
| Beschreibung: | 1 Online-Ressource Illustrationen |
| ISBN: | 9780735425422 9780735425415 9780735425439 |
| DOI: | 10.1063/9780735425422 |
Internformat
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| 245 | 1 | 0 | |a Advanced analytical techniques for characterization of 2d materials |c Chandra Sekhar Rout, Dattatray J. Late, editors |
| 250 | |a First edition | ||
| 264 | 1 | |a Melville |b AIP Publishing |c 2022 | |
| 300 | |a 1 Online-Ressource |b Illustrationen | ||
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| 505 | 8 | |a Introduction -- Optical Based Techniques for 2D Layered Materials -- Raman Spectroscopy-Based Techniques for 2D Layered Materials -- X-Ray-Based Techniques for 2D Materials -- Probe-Based Techniques for 2D Layered Materials -- Electron Diffraction-Based Techniques for 2D Layered Materials -- Analytical Techniques for Hardness, Nanoindentation, and Elastic Modulus -- Analytical Techniques for Pore Size and Specific Surface Area Analysis -- Analytical Techniques for the Wettability and Contact Angle -- Twistronics: Investigating Twist Angles in 2D Materials -- Density Functional Theory: An Investigative and Predictive Tool for the Study of 2D Materials -- Summary -- Index | |
| 520 | 3 | |a This timely and comprehensive book focuses on various analytical techniques used for 2D materials. It explores different characterization techniques to understand the structural features and properties of as-synthesized 2D materials and explores optical microscopy, atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS). Advanced Analytical Techniques for Characterization of 2D Materials: -- Compiles a range of modern material characterizations of 2D materials for the first time. -- Includes a review of recent advances and provides a practical guide for traditional analytical techniques. -- Offers a pragmatic approach to the various analytical methods and recent advances Research scholars and experienced researchers, scientists, technologists, and industrialists beginning their research into the exciting field of 2D nanotechnology will find this book a valuable resource and excellent guideline to explore novel materials and their properties | |
| 653 | 0 | |a Microscopy | |
| 653 | 0 | |a Atomic force microscopy (AFM) | |
| 653 | 0 | |a Scanning electron microscopy (SEM) | |
| 653 | 0 | |a Transmission electron microscopy (TEM) | |
| 653 | 0 | |a Raman spectroscopy | |
| 653 | 0 | |a X-ray diffraction (XRD) | |
| 653 | 0 | |a X-ray photoelectron spectroscopy (XPS) | |
| 653 | 0 | |a Microscopie | |
| 653 | 0 | |a Spectroscopie Raman | |
| 653 | 0 | |a microscopy | |
| 653 | 0 | |a SCIENCE / Chemistry/Analytic | |
| 653 | 0 | |a TECHNOLOGY & ENGINEERING / Materials Science/Thin Films, Surfaces & Interfaces | |
| 653 | 0 | |a SCIENCE / Spectroscopy & Spectrum Analysis | |
| 653 | 0 | |a Microscopy | |
| 653 | 0 | |a Raman spectroscopy | |
| 700 | 1 | |a Rout, Chandra Sekhar |0 (DE-588)1241125201 |4 edt | |
| 700 | 1 | |a Late, Dattatray J. |4 edt | |
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| contents | Introduction -- Optical Based Techniques for 2D Layered Materials -- Raman Spectroscopy-Based Techniques for 2D Layered Materials -- X-Ray-Based Techniques for 2D Materials -- Probe-Based Techniques for 2D Layered Materials -- Electron Diffraction-Based Techniques for 2D Layered Materials -- Analytical Techniques for Hardness, Nanoindentation, and Elastic Modulus -- Analytical Techniques for Pore Size and Specific Surface Area Analysis -- Analytical Techniques for the Wettability and Contact Angle -- Twistronics: Investigating Twist Angles in 2D Materials -- Density Functional Theory: An Investigative and Predictive Tool for the Study of 2D Materials -- Summary -- Index |
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| edition | First edition |
| format | Electronic eBook |
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| index_date | 2024-07-03T23:35:04Z |
| indexdate | 2024-07-10T10:11:52Z |
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| isbn | 9780735425422 9780735425415 9780735425439 |
| language | English |
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| spelling | Advanced analytical techniques for characterization of 2d materials Chandra Sekhar Rout, Dattatray J. Late, editors First edition Melville AIP Publishing 2022 1 Online-Ressource Illustrationen txt rdacontent c rdamedia cr rdacarrier Introduction -- Optical Based Techniques for 2D Layered Materials -- Raman Spectroscopy-Based Techniques for 2D Layered Materials -- X-Ray-Based Techniques for 2D Materials -- Probe-Based Techniques for 2D Layered Materials -- Electron Diffraction-Based Techniques for 2D Layered Materials -- Analytical Techniques for Hardness, Nanoindentation, and Elastic Modulus -- Analytical Techniques for Pore Size and Specific Surface Area Analysis -- Analytical Techniques for the Wettability and Contact Angle -- Twistronics: Investigating Twist Angles in 2D Materials -- Density Functional Theory: An Investigative and Predictive Tool for the Study of 2D Materials -- Summary -- Index This timely and comprehensive book focuses on various analytical techniques used for 2D materials. It explores different characterization techniques to understand the structural features and properties of as-synthesized 2D materials and explores optical microscopy, atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS). Advanced Analytical Techniques for Characterization of 2D Materials: -- Compiles a range of modern material characterizations of 2D materials for the first time. -- Includes a review of recent advances and provides a practical guide for traditional analytical techniques. -- Offers a pragmatic approach to the various analytical methods and recent advances Research scholars and experienced researchers, scientists, technologists, and industrialists beginning their research into the exciting field of 2D nanotechnology will find this book a valuable resource and excellent guideline to explore novel materials and their properties Microscopy Atomic force microscopy (AFM) Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) Raman spectroscopy X-ray diffraction (XRD) X-ray photoelectron spectroscopy (XPS) Microscopie Spectroscopie Raman microscopy SCIENCE / Chemistry/Analytic TECHNOLOGY & ENGINEERING / Materials Science/Thin Films, Surfaces & Interfaces SCIENCE / Spectroscopy & Spectrum Analysis Rout, Chandra Sekhar (DE-588)1241125201 edt Late, Dattatray J. edt Erscheint auch als Druck-Ausgabe 978-0-7354-2540-8 https://doi.org/10.1063/9780735425422 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advanced analytical techniques for characterization of 2d materials Introduction -- Optical Based Techniques for 2D Layered Materials -- Raman Spectroscopy-Based Techniques for 2D Layered Materials -- X-Ray-Based Techniques for 2D Materials -- Probe-Based Techniques for 2D Layered Materials -- Electron Diffraction-Based Techniques for 2D Layered Materials -- Analytical Techniques for Hardness, Nanoindentation, and Elastic Modulus -- Analytical Techniques for Pore Size and Specific Surface Area Analysis -- Analytical Techniques for the Wettability and Contact Angle -- Twistronics: Investigating Twist Angles in 2D Materials -- Density Functional Theory: An Investigative and Predictive Tool for the Study of 2D Materials -- Summary -- Index |
| title | Advanced analytical techniques for characterization of 2d materials |
| title_auth | Advanced analytical techniques for characterization of 2d materials |
| title_exact_search | Advanced analytical techniques for characterization of 2d materials |
| title_exact_search_txtP | Advanced analytical techniques for characterization of 2d materials |
| title_full | Advanced analytical techniques for characterization of 2d materials Chandra Sekhar Rout, Dattatray J. Late, editors |
| title_fullStr | Advanced analytical techniques for characterization of 2d materials Chandra Sekhar Rout, Dattatray J. Late, editors |
| title_full_unstemmed | Advanced analytical techniques for characterization of 2d materials Chandra Sekhar Rout, Dattatray J. Late, editors |
| title_short | Advanced analytical techniques for characterization of 2d materials |
| title_sort | advanced analytical techniques for characterization of 2d materials |
| url | https://doi.org/10.1063/9780735425422 |
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