APA (7th ed.) Citation

Xia, F., Rangelow, I. W., & Youcef-Toumi, K. (2024). Active probe atomic force microscopy: A practical guide on precision instrumentation. Springer.

Chicago Style (17th ed.) Citation

Xia, Fangzhou, Ivo W. Rangelow, and Kamal Youcef-Toumi. Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation. Cham, Switzerland: Springer, 2024.

MLA (9th ed.) Citation

Xia, Fangzhou, et al. Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation. Springer, 2024.