Active probe atomic force microscopy: a practical guide on precision instrumentation
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, sys...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cham, Switzerland
Springer
[2024]
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| Schlagworte: | |
| Zusammenfassung: | From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. Presents the instrument design details of atomic force microscopy with focus on active cantilever probes;- Includes examples and exercises to boost understanding of AFM subsystem design, fabrication and integration;- Imparts a hands-on curriculum for precision mechatronics and instrumentation with AFM and digital twin simulators |
| Beschreibung: | Introduction.- Active Probe Design and Fabrication.- Advanced Applications of Active Probes.- Atomic Force Microscope Designs.- AFM System using Active Probe.- A Low-cost AFM Design for Engineering Education.- Appendix |
| Beschreibung: | xxiv, 366 Seiten Illustrationen, Diagramme 823 gr |
| ISBN: | 9783031442322 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV049597237 | ||
| 003 | DE-604 | ||
| 005 | 20240521 | ||
| 007 | t | ||
| 008 | 240304s2024 a||| |||| 00||| eng d | ||
| 020 | |a 9783031442322 |9 978-3-031-44232-2 | ||
| 024 | 3 | |a 9783031442322 | |
| 035 | |a (OCoLC)1437878059 | ||
| 035 | |a (DE-599)BVBBV049597237 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 100 | 1 | |a Xia, Fangzhou |e Verfasser |0 (DE-588)1325852201 |4 aut | |
| 245 | 1 | 0 | |a Active probe atomic force microscopy |b a practical guide on precision instrumentation |c Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi |
| 264 | 1 | |a Cham, Switzerland |b Springer |c [2024] | |
| 300 | |a xxiv, 366 Seiten |b Illustrationen, Diagramme |c 823 gr | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Introduction.- Active Probe Design and Fabrication.- Advanced Applications of Active Probes.- Atomic Force Microscope Designs.- AFM System using Active Probe.- A Low-cost AFM Design for Engineering Education.- Appendix | ||
| 520 | |a From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. Presents the instrument design details of atomic force microscopy with focus on active cantilever probes;- Includes examples and exercises to boost understanding of AFM subsystem design, fabrication and integration;- Imparts a hands-on curriculum for precision mechatronics and instrumentation with AFM and digital twin simulators | ||
| 650 | 4 | |a bicssc | |
| 650 | 4 | |a bicssc | |
| 650 | 4 | |a bicssc | |
| 650 | 4 | |a bicssc | |
| 650 | 4 | |a bisacsh | |
| 650 | 4 | |a bisacsh | |
| 650 | 4 | |a bisacsh | |
| 650 | 4 | |a bisacsh | |
| 650 | 4 | |a Measuring instruments | |
| 650 | 4 | |a Electronics | |
| 650 | 4 | |a Mechatronics | |
| 650 | 4 | |a Spectrum analysis | |
| 650 | 4 | |a Microtechnology | |
| 650 | 4 | |a Microelectromechanical systems | |
| 650 | 4 | |a Measurement | |
| 650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Präzisionsinstrument |0 (DE-588)4276048-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Digitaler Zwilling |0 (DE-588)1213471362 |2 gnd |9 rswk-swf |
| 653 | |a Hardcover, Softcover / Technik/Allgemeines, Lexika | ||
| 689 | 0 | 0 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |D s |
| 689 | 0 | 1 | |a Präzisionsinstrument |0 (DE-588)4276048-3 |D s |
| 689 | 0 | 2 | |a Digitaler Zwilling |0 (DE-588)1213471362 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Rangelow, Ivo W. |e Verfasser |0 (DE-588)137611803 |4 aut | |
| 700 | 1 | |a Youcef-Toumi, Kamal |e Verfasser |0 (DE-588)105581082X |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-031-44233-9 |
Datensatz im Suchindex
| _version_ | 1805081946823327744 |
|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Xia, Fangzhou Rangelow, Ivo W. Youcef-Toumi, Kamal |
| author_GND | (DE-588)1325852201 (DE-588)137611803 (DE-588)105581082X |
| author_facet | Xia, Fangzhou Rangelow, Ivo W. Youcef-Toumi, Kamal |
| author_role | aut aut aut |
| author_sort | Xia, Fangzhou |
| author_variant | f x fx i w r iw iwr k y t kyt |
| building | Verbundindex |
| bvnumber | BV049597237 |
| ctrlnum | (OCoLC)1437878059 (DE-599)BVBBV049597237 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV049597237</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20240521</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">240304s2024 a||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783031442322</subfield><subfield code="9">978-3-031-44232-2</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9783031442322</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1437878059</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV049597237</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Xia, Fangzhou</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1325852201</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Active probe atomic force microscopy</subfield><subfield code="b">a practical guide on precision instrumentation</subfield><subfield code="c">Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham, Switzerland</subfield><subfield code="b">Springer</subfield><subfield code="c">[2024]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxiv, 366 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield><subfield code="c">823 gr</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Introduction.- Active Probe Design and Fabrication.- Advanced Applications of Active Probes.- Atomic Force Microscope Designs.- AFM System using Active Probe.- A Low-cost AFM Design for Engineering Education.- Appendix</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. Presents the instrument design details of atomic force microscopy with focus on active cantilever probes;- Includes examples and exercises to boost understanding of AFM subsystem design, fabrication and integration;- Imparts a hands-on curriculum for precision mechatronics and instrumentation with AFM and digital twin simulators</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bicssc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bicssc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bicssc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bicssc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measuring instruments</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mechatronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectrum analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microtechnology</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectromechanical systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Präzisionsinstrument</subfield><subfield code="0">(DE-588)4276048-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Digitaler Zwilling</subfield><subfield code="0">(DE-588)1213471362</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Hardcover, Softcover / Technik/Allgemeines, Lexika</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Präzisionsinstrument</subfield><subfield code="0">(DE-588)4276048-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Digitaler Zwilling</subfield><subfield code="0">(DE-588)1213471362</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rangelow, Ivo W.</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)137611803</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Youcef-Toumi, Kamal</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)105581082X</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-3-031-44233-9</subfield></datafield></record></collection> |
| id | DE-604.BV049597237 |
| illustrated | Illustrated |
| index_date | 2024-07-03T23:34:08Z |
| indexdate | 2024-07-20T07:24:51Z |
| institution | BVB |
| isbn | 9783031442322 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034941759 |
| oclc_num | 1437878059 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | xxiv, 366 Seiten Illustrationen, Diagramme 823 gr |
| publishDate | 2024 |
| publishDateSearch | 2024 |
| publishDateSort | 2024 |
| publisher | Springer |
| record_format | marc |
| spelling | Xia, Fangzhou Verfasser (DE-588)1325852201 aut Active probe atomic force microscopy a practical guide on precision instrumentation Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi Cham, Switzerland Springer [2024] xxiv, 366 Seiten Illustrationen, Diagramme 823 gr txt rdacontent n rdamedia nc rdacarrier Introduction.- Active Probe Design and Fabrication.- Advanced Applications of Active Probes.- Atomic Force Microscope Designs.- AFM System using Active Probe.- A Low-cost AFM Design for Engineering Education.- Appendix From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. Presents the instrument design details of atomic force microscopy with focus on active cantilever probes;- Includes examples and exercises to boost understanding of AFM subsystem design, fabrication and integration;- Imparts a hands-on curriculum for precision mechatronics and instrumentation with AFM and digital twin simulators bicssc bisacsh Measuring instruments Electronics Mechatronics Spectrum analysis Microtechnology Microelectromechanical systems Measurement Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Präzisionsinstrument (DE-588)4276048-3 gnd rswk-swf Digitaler Zwilling (DE-588)1213471362 gnd rswk-swf Hardcover, Softcover / Technik/Allgemeines, Lexika Rasterkraftmikroskopie (DE-588)4274473-8 s Präzisionsinstrument (DE-588)4276048-3 s Digitaler Zwilling (DE-588)1213471362 s DE-604 Rangelow, Ivo W. Verfasser (DE-588)137611803 aut Youcef-Toumi, Kamal Verfasser (DE-588)105581082X aut Erscheint auch als Online-Ausgabe 978-3-031-44233-9 |
| spellingShingle | Xia, Fangzhou Rangelow, Ivo W. Youcef-Toumi, Kamal Active probe atomic force microscopy a practical guide on precision instrumentation bicssc bisacsh Measuring instruments Electronics Mechatronics Spectrum analysis Microtechnology Microelectromechanical systems Measurement Rasterkraftmikroskopie (DE-588)4274473-8 gnd Präzisionsinstrument (DE-588)4276048-3 gnd Digitaler Zwilling (DE-588)1213471362 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)4276048-3 (DE-588)1213471362 |
| title | Active probe atomic force microscopy a practical guide on precision instrumentation |
| title_auth | Active probe atomic force microscopy a practical guide on precision instrumentation |
| title_exact_search | Active probe atomic force microscopy a practical guide on precision instrumentation |
| title_exact_search_txtP | Active probe atomic force microscopy a practical guide on precision instrumentation |
| title_full | Active probe atomic force microscopy a practical guide on precision instrumentation Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi |
| title_fullStr | Active probe atomic force microscopy a practical guide on precision instrumentation Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi |
| title_full_unstemmed | Active probe atomic force microscopy a practical guide on precision instrumentation Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi |
| title_short | Active probe atomic force microscopy |
| title_sort | active probe atomic force microscopy a practical guide on precision instrumentation |
| title_sub | a practical guide on precision instrumentation |
| topic | bicssc bisacsh Measuring instruments Electronics Mechatronics Spectrum analysis Microtechnology Microelectromechanical systems Measurement Rasterkraftmikroskopie (DE-588)4274473-8 gnd Präzisionsinstrument (DE-588)4276048-3 gnd Digitaler Zwilling (DE-588)1213471362 gnd |
| topic_facet | bicssc bisacsh Measuring instruments Electronics Mechatronics Spectrum analysis Microtechnology Microelectromechanical systems Measurement Rasterkraftmikroskopie Präzisionsinstrument Digitaler Zwilling |
| work_keys_str_mv | AT xiafangzhou activeprobeatomicforcemicroscopyapracticalguideonprecisioninstrumentation AT rangelowivow activeprobeatomicforcemicroscopyapracticalguideonprecisioninstrumentation AT youceftoumikamal activeprobeatomicforcemicroscopyapracticalguideonprecisioninstrumentation |