Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2024
Cham Springer |
| Ausgabe: | 1st ed. 2024 |
| Schlagworte: | |
| Online-Zugang: | TUM01 UBM01 UBT01 UBY01 Volltext |
| Beschreibung: | 1 Online-Ressource (XXIV, 366 p. 138 illus., 125 illus. in color) |
| ISBN: | 9783031442339 |
| DOI: | 10.1007/978-3-031-44233-9 |
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| 700 | 1 | |a Youcef-Toumi, Kamal |4 aut | |
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Datensatz im Suchindex
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| author | Xia, Fangzhou Rangelow, Ivo W. Youcef-Toumi, Kamal |
| author_facet | Xia, Fangzhou Rangelow, Ivo W. Youcef-Toumi, Kamal |
| author_role | aut aut aut |
| author_sort | Xia, Fangzhou |
| author_variant | f x fx i w r iw iwr k y t kyt |
| building | Verbundindex |
| bvnumber | BV049595161 |
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| dewey-full | 530.7 530.8 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.7 530.8 |
| dewey-search | 530.7 530.8 |
| dewey-sort | 3530.7 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| discipline_str_mv | Physik |
| doi_str_mv | 10.1007/978-3-031-44233-9 |
| edition | 1st ed. 2024 |
| format | Electronic eBook |
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| index_date | 2024-07-03T23:33:50Z |
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| institution | BVB |
| isbn | 9783031442339 |
| language | English |
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| physical | 1 Online-Ressource (XXIV, 366 p. 138 illus., 125 illus. in color) |
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| spelling | Xia, Fangzhou Verfasser aut Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi 1st ed. 2024 Cham Springer International Publishing 2024 Cham Springer 1 Online-Ressource (XXIV, 366 p. 138 illus., 125 illus. in color) txt rdacontent c rdamedia cr rdacarrier Measurement Science and Instrumentation Electronics and Microelectronics, Instrumentation Mechatronics Spectroscopy Microsystems and MEMS. Measurement Measuring instruments Electronics Spectrum analysis Microtechnology Microelectromechanical systems Rangelow, Ivo W. aut Youcef-Toumi, Kamal aut Erscheint auch als Druck-Ausgabe 978-3-031-44232-2 Erscheint auch als Druck-Ausgabe 978-3-031-44234-6 Erscheint auch als Druck-Ausgabe 978-3-031-44235-3 https://doi.org/10.1007/978-3-031-44233-9 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Xia, Fangzhou Rangelow, Ivo W. Youcef-Toumi, Kamal Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation Measurement Science and Instrumentation Electronics and Microelectronics, Instrumentation Mechatronics Spectroscopy Microsystems and MEMS. Measurement Measuring instruments Electronics Spectrum analysis Microtechnology Microelectromechanical systems |
| title | Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation |
| title_auth | Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation |
| title_exact_search | Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation |
| title_exact_search_txtP | Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation |
| title_full | Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi |
| title_fullStr | Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi |
| title_full_unstemmed | Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi |
| title_short | Active Probe Atomic Force Microscopy |
| title_sort | active probe atomic force microscopy a practical guide on precision instrumentation |
| title_sub | A Practical Guide on Precision Instrumentation |
| topic | Measurement Science and Instrumentation Electronics and Microelectronics, Instrumentation Mechatronics Spectroscopy Microsystems and MEMS. Measurement Measuring instruments Electronics Spectrum analysis Microtechnology Microelectromechanical systems |
| topic_facet | Measurement Science and Instrumentation Electronics and Microelectronics, Instrumentation Mechatronics Spectroscopy Microsystems and MEMS. Measurement Measuring instruments Electronics Spectrum analysis Microtechnology Microelectromechanical systems |
| url | https://doi.org/10.1007/978-3-031-44233-9 |
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