Reliable machine learning: applying SRE principles to ML in production
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Bibliographic Details
Main Authors: Chen, Yi (Author), Murphy, Niall Richard (Author), Parisa, Kranti (Author), Sculley, D. (Author), Underwood, Todd (Author)
Format: Book
Language:English
Published: Beijing ; Boston ; Farnham ; Sebastopol ; Tokyo O'Reilly [September 2022]
Edition:First edition
Subjects:
Physical Description:xxix, 376 Seiten Illustrationen 24 cm
ISBN:9781098106225
1098106229

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Interlibrary loan Place Request Caution: Not in THWS collection!