Reliable machine learning: applying SRE principles to ML in production
Gespeichert in:
Hauptverfasser: | , , , , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Beijing ; Boston ; Farnham ; Sebastopol ; Tokyo
O'Reilly
[September 2022]
|
Ausgabe: | First edition |
Schlagworte: | |
Beschreibung: | xxix, 376 Seiten Illustrationen 24 cm |
ISBN: | 9781098106225 1098106229 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV049504971 | ||
003 | DE-604 | ||
005 | 20240328 | ||
007 | t | ||
008 | 240117s2022 a||| |||| 00||| eng d | ||
015 | |a GBC2F8042 |2 dnb | ||
020 | |a 9781098106225 |9 978-1-098-10622-5 | ||
020 | |a 1098106229 |9 1-098-10622-9 | ||
035 | |a (OCoLC)1418690118 | ||
035 | |a (DE-599)BVBBV049504971 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-188 |a DE-11 | ||
084 | |a ST 300 |0 (DE-625)143650: |2 rvk | ||
100 | 1 | |a Chen, Yi |0 (DE-588)141164743 |4 aut | |
245 | 1 | 0 | |a Reliable machine learning |b applying SRE principles to ML in production |c Cathy Chen, Niall Richard Murphy, Kranti Parisa, D. Sculley, and Todd Underwood |
250 | |a First edition | ||
264 | 1 | |a Beijing ; Boston ; Farnham ; Sebastopol ; Tokyo |b O'Reilly |c [September 2022] | |
264 | 4 | |c © 2022 | |
300 | |a xxix, 376 Seiten |b Illustrationen |c 24 cm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Production engineering / Data processing | |
650 | 4 | |a Machine learning / Industrial applications | |
650 | 4 | |a Reliability (Engineering) | |
650 | 4 | |a Apprentissage automatique / Applications industrielles | |
650 | 4 | |a Fiabilité | |
700 | 1 | |a Murphy, Niall Richard |0 (DE-588)1112231773 |4 aut | |
700 | 1 | |a Parisa, Kranti |4 aut | |
700 | 1 | |a Sculley, D. |4 aut | |
700 | 1 | |a Underwood, Todd |4 aut | |
999 | |a oai:aleph.bib-bvb.de:BVB01-034850044 |
Datensatz im Suchindex
_version_ | 1804186314666409984 |
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adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Chen, Yi Murphy, Niall Richard Parisa, Kranti Sculley, D. Underwood, Todd |
author_GND | (DE-588)141164743 (DE-588)1112231773 |
author_facet | Chen, Yi Murphy, Niall Richard Parisa, Kranti Sculley, D. Underwood, Todd |
author_role | aut aut aut aut aut |
author_sort | Chen, Yi |
author_variant | y c yc n r m nr nrm k p kp d s ds t u tu |
building | Verbundindex |
bvnumber | BV049504971 |
classification_rvk | ST 300 |
ctrlnum | (OCoLC)1418690118 (DE-599)BVBBV049504971 |
discipline | Informatik |
discipline_str_mv | Informatik |
edition | First edition |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01476nam a2200421 c 4500</leader><controlfield tag="001">BV049504971</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20240328 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">240117s2022 a||| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBC2F8042</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781098106225</subfield><subfield code="9">978-1-098-10622-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1098106229</subfield><subfield code="9">1-098-10622-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1418690118</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV049504971</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-188</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 300</subfield><subfield code="0">(DE-625)143650:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Chen, Yi</subfield><subfield code="0">(DE-588)141164743</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliable machine learning</subfield><subfield code="b">applying SRE principles to ML in production</subfield><subfield code="c">Cathy Chen, Niall Richard Murphy, Kranti Parisa, D. Sculley, and Todd Underwood</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">First edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Beijing ; Boston ; Farnham ; Sebastopol ; Tokyo</subfield><subfield code="b">O'Reilly</subfield><subfield code="c">[September 2022]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2022</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxix, 376 Seiten</subfield><subfield code="b">Illustrationen</subfield><subfield code="c">24 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Production engineering / Data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Machine learning / Industrial applications</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability (Engineering)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Apprentissage automatique / Applications industrielles</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fiabilité</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Murphy, Niall Richard</subfield><subfield code="0">(DE-588)1112231773</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Parisa, Kranti</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sculley, D.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Underwood, Todd</subfield><subfield code="4">aut</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034850044</subfield></datafield></record></collection> |
id | DE-604.BV049504971 |
illustrated | Illustrated |
index_date | 2024-07-03T23:22:05Z |
indexdate | 2024-07-10T10:09:10Z |
institution | BVB |
isbn | 9781098106225 1098106229 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034850044 |
oclc_num | 1418690118 |
open_access_boolean | |
owner | DE-188 DE-11 |
owner_facet | DE-188 DE-11 |
physical | xxix, 376 Seiten Illustrationen 24 cm |
publishDate | 2022 |
publishDateSearch | 2022 |
publishDateSort | 2022 |
publisher | O'Reilly |
record_format | marc |
spelling | Chen, Yi (DE-588)141164743 aut Reliable machine learning applying SRE principles to ML in production Cathy Chen, Niall Richard Murphy, Kranti Parisa, D. Sculley, and Todd Underwood First edition Beijing ; Boston ; Farnham ; Sebastopol ; Tokyo O'Reilly [September 2022] © 2022 xxix, 376 Seiten Illustrationen 24 cm txt rdacontent n rdamedia nc rdacarrier Production engineering / Data processing Machine learning / Industrial applications Reliability (Engineering) Apprentissage automatique / Applications industrielles Fiabilité Murphy, Niall Richard (DE-588)1112231773 aut Parisa, Kranti aut Sculley, D. aut Underwood, Todd aut |
spellingShingle | Chen, Yi Murphy, Niall Richard Parisa, Kranti Sculley, D. Underwood, Todd Reliable machine learning applying SRE principles to ML in production Production engineering / Data processing Machine learning / Industrial applications Reliability (Engineering) Apprentissage automatique / Applications industrielles Fiabilité |
title | Reliable machine learning applying SRE principles to ML in production |
title_auth | Reliable machine learning applying SRE principles to ML in production |
title_exact_search | Reliable machine learning applying SRE principles to ML in production |
title_exact_search_txtP | Reliable machine learning applying SRE principles to ML in production |
title_full | Reliable machine learning applying SRE principles to ML in production Cathy Chen, Niall Richard Murphy, Kranti Parisa, D. Sculley, and Todd Underwood |
title_fullStr | Reliable machine learning applying SRE principles to ML in production Cathy Chen, Niall Richard Murphy, Kranti Parisa, D. Sculley, and Todd Underwood |
title_full_unstemmed | Reliable machine learning applying SRE principles to ML in production Cathy Chen, Niall Richard Murphy, Kranti Parisa, D. Sculley, and Todd Underwood |
title_short | Reliable machine learning |
title_sort | reliable machine learning applying sre principles to ml in production |
title_sub | applying SRE principles to ML in production |
topic | Production engineering / Data processing Machine learning / Industrial applications Reliability (Engineering) Apprentissage automatique / Applications industrielles Fiabilité |
topic_facet | Production engineering / Data processing Machine learning / Industrial applications Reliability (Engineering) Apprentissage automatique / Applications industrielles Fiabilité |
work_keys_str_mv | AT chenyi reliablemachinelearningapplyingsreprinciplestomlinproduction AT murphyniallrichard reliablemachinelearningapplyingsreprinciplestomlinproduction AT parisakranti reliablemachinelearningapplyingsreprinciplestomlinproduction AT sculleyd reliablemachinelearningapplyingsreprinciplestomlinproduction AT underwoodtodd reliablemachinelearningapplyingsreprinciplestomlinproduction |