Functional safety for embedded systems:
Gespeichert in:
| Hauptverfasser: | , , , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton ; London ; New York
CRC Press
2023
|
| Ausgabe: | First edition |
| Schlagworte: | |
| Online-Zugang: | DE-91 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (xvii, 163 Seiten) Illustrationen, Diagramme |
| ISBN: | 9781000881318 9781003391517 |
| DOI: | 10.1201/9781003391517 |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV049432855 | ||
| 003 | DE-604 | ||
| 005 | 20250207 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 231127s2023 xx a||| o|||| 00||| eng d | ||
| 020 | |a 9781000881318 |9 978-1-00-088131-8 | ||
| 020 | |a 9781003391517 |9 978-1-003-39151-7 | ||
| 024 | 7 | |a 10.1201/9781003391517 |2 doi | |
| 035 | |a (ZDB-30-PQE)EBC7253350 | ||
| 035 | |a (ZDB-30-PAD)EBC7253350 | ||
| 035 | |a (ZDB-89-EBL)EBL7253350 | ||
| 035 | |a (OCoLC)1381093980 | ||
| 035 | |a (DE-599)BVBBV049432855 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 082 | 0 | |a 006.220289 | |
| 100 | 1 | |a Xie, Guoqi |e Verfasser |0 (DE-588)1202490239 |4 aut | |
| 245 | 1 | 0 | |a Functional safety for embedded systems |c Guoqi Xie, Yawen Zhang, Renfa Li, Kenli Li, Keqin Li |
| 250 | |a First edition | ||
| 264 | 1 | |a Boca Raton ; London ; New York |b CRC Press |c 2023 | |
| 264 | 4 | |c © 2023 | |
| 300 | |a 1 Online-Ressource (xvii, 163 Seiten) |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Embedded computer systems-Reliability | |
| 650 | 4 | |a Automatic control-Safety measures | |
| 650 | 4 | |a Automotive computers-Reliability | |
| 650 | 4 | |a Fault-tolerant computing | |
| 650 | 4 | |a Fault tolerance (Engineering) | |
| 700 | 1 | |a Zhang, Yawen |e Verfasser |4 aut | |
| 700 | 1 | |a Li, Renfa |e Verfasser |0 (DE-588)1042173141 |4 aut | |
| 700 | 1 | |a Li, Kenli |e Verfasser |0 (DE-588)1299852270 |4 aut | |
| 700 | 1 | |a Li, Keqin |e Verfasser |0 (DE-588)1202490832 |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |a Xie, Guoqi |t Functional Safety for Embedded Systems |d Milton : Taylor & Francis Group,c2023 |n Druck-Ausgabe, Hardcover |z 978-1-032-48936-0 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Paperback |z 978-1-032-48938-4 |
| 856 | 4 | 0 | |u https://doi.org/10.1201/9781003391517 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-30-PQE | ||
| 912 | |a ZDB-7-TFC | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-034778941 | |
| 966 | e | |u https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=7253350 |l DE-91 |p ZDB-30-PQE |q TUM_PDA_PQE_Kauf |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1823418742895280128 |
|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Xie, Guoqi Zhang, Yawen Li, Renfa Li, Kenli Li, Keqin |
| author_GND | (DE-588)1202490239 (DE-588)1042173141 (DE-588)1299852270 (DE-588)1202490832 |
| author_facet | Xie, Guoqi Zhang, Yawen Li, Renfa Li, Kenli Li, Keqin |
| author_role | aut aut aut aut aut |
| author_sort | Xie, Guoqi |
| author_variant | g x gx y z yz r l rl k l kl k l kl |
| building | Verbundindex |
| bvnumber | BV049432855 |
| collection | ZDB-30-PQE ZDB-7-TFC |
| ctrlnum | (ZDB-30-PQE)EBC7253350 (ZDB-30-PAD)EBC7253350 (ZDB-89-EBL)EBL7253350 (OCoLC)1381093980 (DE-599)BVBBV049432855 |
| dewey-full | 006.220289 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 006 - Special computer methods |
| dewey-raw | 006.220289 |
| dewey-search | 006.220289 |
| dewey-sort | 16.220289 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Informatik |
| discipline_str_mv | Informatik |
| doi_str_mv | 10.1201/9781003391517 |
| edition | First edition |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000zc 4500</leader><controlfield tag="001">BV049432855</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20250207</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">231127s2023 xx a||| o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781000881318</subfield><subfield code="9">978-1-00-088131-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781003391517</subfield><subfield code="9">978-1-003-39151-7</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1201/9781003391517</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PQE)EBC7253350</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC7253350</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL7253350</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1381093980</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV049432855</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">006.220289</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Xie, Guoqi</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1202490239</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Functional safety for embedded systems</subfield><subfield code="c">Guoqi Xie, Yawen Zhang, Renfa Li, Kenli Li, Keqin Li</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">First edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton ; London ; New York</subfield><subfield code="b">CRC Press</subfield><subfield code="c">2023</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2023</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xvii, 163 Seiten)</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Embedded computer systems-Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Automatic control-Safety measures</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Automotive computers-Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault-tolerant computing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault tolerance (Engineering)</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zhang, Yawen</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Li, Renfa</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1042173141</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Li, Kenli</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1299852270</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Li, Keqin</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1202490832</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="a">Xie, Guoqi</subfield><subfield code="t">Functional Safety for Embedded Systems</subfield><subfield code="d">Milton : Taylor & Francis Group,c2023</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-1-032-48936-0</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Paperback</subfield><subfield code="z">978-1-032-48938-4</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1201/9781003391517</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PQE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-7-TFC</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034778941</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=7253350</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-30-PQE</subfield><subfield code="q">TUM_PDA_PQE_Kauf</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV049432855 |
| illustrated | Illustrated |
| index_date | 2024-07-03T23:10:36Z |
| indexdate | 2025-02-07T17:00:22Z |
| institution | BVB |
| isbn | 9781000881318 9781003391517 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034778941 |
| oclc_num | 1381093980 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (xvii, 163 Seiten) Illustrationen, Diagramme |
| psigel | ZDB-30-PQE ZDB-7-TFC ZDB-30-PQE TUM_PDA_PQE_Kauf |
| publishDate | 2023 |
| publishDateSearch | 2023 |
| publishDateSort | 2023 |
| publisher | CRC Press |
| record_format | marc |
| spelling | Xie, Guoqi Verfasser (DE-588)1202490239 aut Functional safety for embedded systems Guoqi Xie, Yawen Zhang, Renfa Li, Kenli Li, Keqin Li First edition Boca Raton ; London ; New York CRC Press 2023 © 2023 1 Online-Ressource (xvii, 163 Seiten) Illustrationen, Diagramme txt rdacontent c rdamedia cr rdacarrier Embedded computer systems-Reliability Automatic control-Safety measures Automotive computers-Reliability Fault-tolerant computing Fault tolerance (Engineering) Zhang, Yawen Verfasser aut Li, Renfa Verfasser (DE-588)1042173141 aut Li, Kenli Verfasser (DE-588)1299852270 aut Li, Keqin Verfasser (DE-588)1202490832 aut Erscheint auch als Xie, Guoqi Functional Safety for Embedded Systems Milton : Taylor & Francis Group,c2023 Druck-Ausgabe, Hardcover 978-1-032-48936-0 Erscheint auch als Druck-Ausgabe, Paperback 978-1-032-48938-4 https://doi.org/10.1201/9781003391517 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Xie, Guoqi Zhang, Yawen Li, Renfa Li, Kenli Li, Keqin Functional safety for embedded systems Embedded computer systems-Reliability Automatic control-Safety measures Automotive computers-Reliability Fault-tolerant computing Fault tolerance (Engineering) |
| title | Functional safety for embedded systems |
| title_auth | Functional safety for embedded systems |
| title_exact_search | Functional safety for embedded systems |
| title_exact_search_txtP | Functional Safety for Embedded Systems |
| title_full | Functional safety for embedded systems Guoqi Xie, Yawen Zhang, Renfa Li, Kenli Li, Keqin Li |
| title_fullStr | Functional safety for embedded systems Guoqi Xie, Yawen Zhang, Renfa Li, Kenli Li, Keqin Li |
| title_full_unstemmed | Functional safety for embedded systems Guoqi Xie, Yawen Zhang, Renfa Li, Kenli Li, Keqin Li |
| title_short | Functional safety for embedded systems |
| title_sort | functional safety for embedded systems |
| topic | Embedded computer systems-Reliability Automatic control-Safety measures Automotive computers-Reliability Fault-tolerant computing Fault tolerance (Engineering) |
| topic_facet | Embedded computer systems-Reliability Automatic control-Safety measures Automotive computers-Reliability Fault-tolerant computing Fault tolerance (Engineering) |
| url | https://doi.org/10.1201/9781003391517 |
| work_keys_str_mv | AT xieguoqi functionalsafetyforembeddedsystems AT zhangyawen functionalsafetyforembeddedsystems AT lirenfa functionalsafetyforembeddedsystems AT likenli functionalsafetyforembeddedsystems AT likeqin functionalsafetyforembeddedsystems |