Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems:
Gespeichert in:
1. Verfasser: | |
---|---|
Körperschaft: | |
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York,NY,United States
Association for Computing Machinery
1995
|
Schriftenreihe: | ACM Conferences
|
Online-Zugang: | UBM01 URL des Erstveröffentlichers |
Beschreibung: | 1 Online-Ressource (340 Seiten) |
ISBN: | 9780897916950 |
Internformat
MARC
LEADER | 00000nmm a2200000 c 4500 | ||
---|---|---|---|
001 | BV048953142 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 230510m1995 |||| o||u| ||||||eng d | ||
020 | |a 9780897916950 |9 978-0-89791-695-0 | ||
035 | |a (ZDB-15-ACM)10.1145/223587 | ||
035 | |a (OCoLC)1379383703 | ||
035 | |a (DE-599)BVBBV048953142 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-19 | ||
100 | 1 | |a Gaither, Blaine D |e Verfasser |4 aut | |
245 | 1 | 0 | |a Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems |c Edited by Blaine D. Gaither |
246 | 1 | 0 | |a SIGMETRICS '95/PERFORMANCE '95 |
264 | 1 | |a New York,NY,United States |b Association for Computing Machinery |c 1995 | |
300 | |a 1 Online-Ressource (340 Seiten) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a ACM Conferences | |
700 | 1 | |a Gaither, Blaine D. |e Sonstige |4 oth | |
710 | 2 | |a SIGMETRICS95: ACM SIGMETRICS Conference on Measurement & Modeling of Computer Systems |d 1995 |c Ottawa Ontario Canada |e Verfasser |4 aut | |
710 | 2 | |a Association for Computing Machinery-Digital Library |e Sonstige |4 oth | |
710 | 2 | |a ACM Special Interest Group on Measurement and Evaluation |e Sonstige |4 oth | |
710 | 2 | |a ACM SIGs |e Sonstige |4 oth | |
856 | 4 | 0 | |u https://dl.acm.org/action/showBook?doi=10.1145%2F223587 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-15-ACM | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-034216990 | ||
966 | e | |u https://dl.acm.org/action/showBook?doi=10.1145%2F223587 |l UBM01 |p ZDB-15-ACM |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804185177693356032 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Gaither, Blaine D |
author_corporate | SIGMETRICS95: ACM SIGMETRICS Conference on Measurement & Modeling of Computer Systems |
author_corporate_role | aut |
author_facet | Gaither, Blaine D SIGMETRICS95: ACM SIGMETRICS Conference on Measurement & Modeling of Computer Systems |
author_role | aut |
author_sort | Gaither, Blaine D |
author_variant | b d g bd bdg |
building | Verbundindex |
bvnumber | BV048953142 |
collection | ZDB-15-ACM |
ctrlnum | (ZDB-15-ACM)10.1145/223587 (OCoLC)1379383703 (DE-599)BVBBV048953142 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01647nmm a2200385 c 4500</leader><controlfield tag="001">BV048953142</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">230510m1995 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780897916950</subfield><subfield code="9">978-0-89791-695-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-15-ACM)10.1145/223587</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1379383703</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV048953142</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-19</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Gaither, Blaine D</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems</subfield><subfield code="c">Edited by Blaine D. Gaither</subfield></datafield><datafield tag="246" ind1="1" ind2="0"><subfield code="a">SIGMETRICS '95/PERFORMANCE '95</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York,NY,United States</subfield><subfield code="b">Association for Computing Machinery</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (340 Seiten)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">ACM Conferences</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gaither, Blaine D.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">SIGMETRICS95: ACM SIGMETRICS Conference on Measurement & Modeling of Computer Systems</subfield><subfield code="d">1995</subfield><subfield code="c">Ottawa Ontario Canada</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Association for Computing Machinery-Digital Library</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ACM Special Interest Group on Measurement and Evaluation</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ACM SIGs</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://dl.acm.org/action/showBook?doi=10.1145%2F223587</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-15-ACM</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034216990</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://dl.acm.org/action/showBook?doi=10.1145%2F223587</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-15-ACM</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV048953142 |
illustrated | Not Illustrated |
index_date | 2024-07-03T21:58:56Z |
indexdate | 2024-07-10T09:51:05Z |
institution | BVB |
isbn | 9780897916950 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034216990 |
oclc_num | 1379383703 |
open_access_boolean | |
owner | DE-19 DE-BY-UBM |
owner_facet | DE-19 DE-BY-UBM |
physical | 1 Online-Ressource (340 Seiten) |
psigel | ZDB-15-ACM |
publishDate | 1995 |
publishDateSearch | 1995 |
publishDateSort | 1995 |
publisher | Association for Computing Machinery |
record_format | marc |
series2 | ACM Conferences |
spelling | Gaither, Blaine D Verfasser aut Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems Edited by Blaine D. Gaither SIGMETRICS '95/PERFORMANCE '95 New York,NY,United States Association for Computing Machinery 1995 1 Online-Ressource (340 Seiten) txt rdacontent c rdamedia cr rdacarrier ACM Conferences Gaither, Blaine D. Sonstige oth SIGMETRICS95: ACM SIGMETRICS Conference on Measurement & Modeling of Computer Systems 1995 Ottawa Ontario Canada Verfasser aut Association for Computing Machinery-Digital Library Sonstige oth ACM Special Interest Group on Measurement and Evaluation Sonstige oth ACM SIGs Sonstige oth https://dl.acm.org/action/showBook?doi=10.1145%2F223587 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Gaither, Blaine D Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems |
title | Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems |
title_alt | SIGMETRICS '95/PERFORMANCE '95 |
title_auth | Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems |
title_exact_search | Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems |
title_exact_search_txtP | Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems |
title_full | Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems Edited by Blaine D. Gaither |
title_fullStr | Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems Edited by Blaine D. Gaither |
title_full_unstemmed | Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems Edited by Blaine D. Gaither |
title_short | Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems |
title_sort | proceedings of the 1995 acm sigmetrics joint international conference on measurement and modeling of computer systems |
url | https://dl.acm.org/action/showBook?doi=10.1145%2F223587 |
work_keys_str_mv | AT gaitherblained proceedingsofthe1995acmsigmetricsjointinternationalconferenceonmeasurementandmodelingofcomputersystems AT sigmetrics95acmsigmetricsconferenceonmeasurementmodelingofcomputersystems proceedingsofthe1995acmsigmetricsjointinternationalconferenceonmeasurementandmodelingofcomputersystems AT associationforcomputingmachinerydigitallibrary proceedingsofthe1995acmsigmetricsjointinternationalconferenceonmeasurementandmodelingofcomputersystems AT acmspecialinterestgrouponmeasurementandevaluation proceedingsofthe1995acmsigmetricsjointinternationalconferenceonmeasurementandmodelingofcomputersystems AT acmsigs proceedingsofthe1995acmsigmetricsjointinternationalconferenceonmeasurementandmodelingofcomputersystems AT gaitherblained sigmetrics95performance95 AT sigmetrics95acmsigmetricsconferenceonmeasurementmodelingofcomputersystems sigmetrics95performance95 AT associationforcomputingmachinerydigitallibrary sigmetrics95performance95 AT acmspecialinterestgrouponmeasurementandevaluation sigmetrics95performance95 AT acmsigs sigmetrics95performance95 |