Material characterization using electron holography:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Weinheim
Wiley-VCH
[2023]
|
| Schlagworte: | |
| Beschreibung: | xii, 227 Seiten Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9783527348046 3527348042 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV048825599 | ||
| 003 | DE-604 | ||
| 005 | 20241113 | ||
| 007 | t| | ||
| 008 | 230222s2023 gw a||| |||| 00||| eng d | ||
| 015 | |a 22,N10 |2 dnb | ||
| 016 | 7 | |a 125288690X |2 DE-101 | |
| 020 | |a 9783527348046 |c : circa EUR 139.00 (DE) (freier Preis) |9 978-3-527-34804-6 | ||
| 020 | |a 3527348042 |9 3-527-34804-2 | ||
| 024 | 3 | |a 9783527348046 | |
| 028 | 5 | 2 | |a Bestellnummer: 1134804 000 |
| 035 | |a (OCoLC)1370938605 | ||
| 035 | |a (DE-599)DNB125288690X | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BW | ||
| 049 | |a DE-11 |a DE-703 | ||
| 084 | |a UH 5450 |0 (DE-625)145662: |2 rvk | ||
| 084 | |a UQ 8010 |0 (DE-625)146585: |2 rvk | ||
| 084 | |a 540 |2 23sdnb | ||
| 100 | 1 | |a Shindo, Daisuke |d 1953- |e Verfasser |0 (DE-588)120559463 |4 aut | |
| 245 | 1 | 0 | |a Material characterization using electron holography |c Daisuke Shindo, Takeshi Tomita |
| 264 | 1 | |a Weinheim |b Wiley-VCH |c [2023] | |
| 264 | 4 | |c © 2023 | |
| 300 | |a xii, 227 Seiten |b Illustrationen, Diagramme (teilweise farbig) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 653 | |a Chemie | ||
| 653 | |a Chemistry | ||
| 653 | |a Electrical & Electronics Engineering | ||
| 653 | |a Electronic Materials | ||
| 653 | |a Elektronische Materialien | ||
| 653 | |a Elektrotechnik u. Elektronik | ||
| 653 | |a Materials Characterization | ||
| 653 | |a Materials Science | ||
| 653 | |a Materialwissenschaften | ||
| 653 | |a Microscopy | ||
| 653 | |a Mikroskopie | ||
| 653 | |a Werkstoffprüfung | ||
| 653 | |a CH1A: Mikroskopie | ||
| 653 | |a EEB0: Elektronische Materialien | ||
| 653 | |a MSA0: Werkstoffprüfung | ||
| 700 | 1 | |a Tomita, Takeshi |e Verfasser |0 (DE-588)1274695724 |4 aut | |
| 710 | 2 | |a Wiley-VCH |0 (DE-588)16179388-5 |4 pbl | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, PDF |z 978-3-527-82969-9 |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, EPUB |z 978-3-527-82970-5 |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-527-82971-2 |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-034091253 | |
Datensatz im Suchindex
| _version_ | 1815619896756666368 |
|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Shindo, Daisuke 1953- Tomita, Takeshi |
| author_GND | (DE-588)120559463 (DE-588)1274695724 |
| author_facet | Shindo, Daisuke 1953- Tomita, Takeshi |
| author_role | aut aut |
| author_sort | Shindo, Daisuke 1953- |
| author_variant | d s ds t t tt |
| building | Verbundindex |
| bvnumber | BV048825599 |
| classification_rvk | UH 5450 UQ 8010 |
| ctrlnum | (OCoLC)1370938605 (DE-599)DNB125288690X |
| discipline | Physik |
| discipline_str_mv | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV048825599</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20241113</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">230222s2023 gw a||| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">22,N10</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">125288690X</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527348046</subfield><subfield code="c">: circa EUR 139.00 (DE) (freier Preis)</subfield><subfield code="9">978-3-527-34804-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3527348042</subfield><subfield code="9">3-527-34804-2</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9783527348046</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">Bestellnummer: 1134804 000</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1370938605</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DNB125288690X</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BW</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5450</subfield><subfield code="0">(DE-625)145662:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 8010</subfield><subfield code="0">(DE-625)146585:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">540</subfield><subfield code="2">23sdnb</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shindo, Daisuke</subfield><subfield code="d">1953-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)120559463</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Material characterization using electron holography</subfield><subfield code="c">Daisuke Shindo, Takeshi Tomita</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Weinheim</subfield><subfield code="b">Wiley-VCH</subfield><subfield code="c">[2023]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2023</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xii, 227 Seiten</subfield><subfield code="b">Illustrationen, Diagramme (teilweise farbig)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Chemie</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Chemistry</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Electrical & Electronics Engineering</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Electronic Materials</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Elektronische Materialien</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Elektrotechnik u. Elektronik</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Materials Characterization</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Materials Science</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Materialwissenschaften</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Microscopy</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Mikroskopie</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Werkstoffprüfung</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">CH1A: Mikroskopie</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">EEB0: Elektronische Materialien</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">MSA0: Werkstoffprüfung</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tomita, Takeshi</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1274695724</subfield><subfield code="4">aut</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Wiley-VCH</subfield><subfield code="0">(DE-588)16179388-5</subfield><subfield code="4">pbl</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe, PDF</subfield><subfield code="z">978-3-527-82969-9</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe, EPUB</subfield><subfield code="z">978-3-527-82970-5</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-3-527-82971-2</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034091253</subfield></datafield></record></collection> |
| id | DE-604.BV048825599 |
| illustrated | Illustrated |
| index_date | 2024-07-03T21:34:20Z |
| indexdate | 2024-11-13T15:01:03Z |
| institution | BVB |
| institution_GND | (DE-588)16179388-5 |
| isbn | 9783527348046 3527348042 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034091253 |
| oclc_num | 1370938605 |
| open_access_boolean | |
| owner | DE-11 DE-703 |
| owner_facet | DE-11 DE-703 |
| physical | xii, 227 Seiten Illustrationen, Diagramme (teilweise farbig) |
| publishDate | 2023 |
| publishDateSearch | 2023 |
| publishDateSort | 2023 |
| publisher | Wiley-VCH |
| record_format | marc |
| spelling | Shindo, Daisuke 1953- Verfasser (DE-588)120559463 aut Material characterization using electron holography Daisuke Shindo, Takeshi Tomita Weinheim Wiley-VCH [2023] © 2023 xii, 227 Seiten Illustrationen, Diagramme (teilweise farbig) txt rdacontent n rdamedia nc rdacarrier Chemie Chemistry Electrical & Electronics Engineering Electronic Materials Elektronische Materialien Elektrotechnik u. Elektronik Materials Characterization Materials Science Materialwissenschaften Microscopy Mikroskopie Werkstoffprüfung CH1A: Mikroskopie EEB0: Elektronische Materialien MSA0: Werkstoffprüfung Tomita, Takeshi Verfasser (DE-588)1274695724 aut Wiley-VCH (DE-588)16179388-5 pbl Erscheint auch als Online-Ausgabe, PDF 978-3-527-82969-9 Erscheint auch als Online-Ausgabe, EPUB 978-3-527-82970-5 Erscheint auch als Online-Ausgabe 978-3-527-82971-2 |
| spellingShingle | Shindo, Daisuke 1953- Tomita, Takeshi Material characterization using electron holography |
| title | Material characterization using electron holography |
| title_auth | Material characterization using electron holography |
| title_exact_search | Material characterization using electron holography |
| title_exact_search_txtP | Material characterization using electron holography |
| title_full | Material characterization using electron holography Daisuke Shindo, Takeshi Tomita |
| title_fullStr | Material characterization using electron holography Daisuke Shindo, Takeshi Tomita |
| title_full_unstemmed | Material characterization using electron holography Daisuke Shindo, Takeshi Tomita |
| title_short | Material characterization using electron holography |
| title_sort | material characterization using electron holography |
| work_keys_str_mv | AT shindodaisuke materialcharacterizationusingelectronholography AT tomitatakeshi materialcharacterizationusingelectronholography AT wileyvch materialcharacterizationusingelectronholography |