VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers
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Bibliographic Details
Other Authors: Shah, Ambika Prasad (Editor), Dasgupta, Sudeb (Editor), Darji, Anand (Editor), Tudu, Jaynarayan (Editor)
Format: Electronic eBook
Language:English
Published: Cham Springer Nature Switzerland 2022
Cham Springer
Edition:1st ed. 2022
Series:Communications in Computer and Information Science 1687
Subjects:
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Volltext
Physical Description:1 Online-Ressource (XVIII, 596 p. 410 illus., 316 illus. in color)
ISBN:9783031215148
ISSN:1865-0937
DOI:10.1007/978-3-031-21514-8