APA (7th ed.) Citation

Shah, A. P., Dasgupta, S., Darji, A., & Tudu, J. (2022). VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers (1st ed. 2022.). Springer Nature Switzerland. https://doi.org/10.1007/978-3-031-21514-8

Chicago Style (17th ed.) Citation

Shah, Ambika Prasad, Sudeb Dasgupta, Anand Darji, and Jaynarayan Tudu. VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers. 1st ed. 2022. Cham: Springer Nature Switzerland, 2022. https://doi.org/10.1007/978-3-031-21514-8.

MLA (9th ed.) Citation

Shah, Ambika Prasad, et al. VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers. 1st ed. 2022. Springer Nature Switzerland, 2022. https://doi.org/10.1007/978-3-031-21514-8.