Structural, syntactic, and statistical pattern recognition: Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022 : proceedings
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Bibliographic Details
Corporate Author: IAPR Joint International Workshops on Statistical Techniques in Pattern Recognition and Structural and Syntactic Pattern Recognition Montréal (Author)
Other Authors: Krzyzak, Adam (Editor), Suen, Ching Y. (Editor), Torsello, Andrea (Editor), Nobile, Nicola (Editor)
Format: Electronic Conference Proceeding eBook
Language:English
Published: Cham, Switzerland Springer [2022]
Edition:1st ed. 2022
Series:Lecture notes in computer science 13813
Subjects:
Online Access:DE-634
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Volltext
Physical Description:1 Online-Ressource (XIII, 324 Seiten)
ISBN:9783031230288
ISSN:1611-3349
DOI:10.1007/978-3-031-23028-8