Failure Analysis: High Technology Devices
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Boston
De Gruyter
[2022]
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| Schriftenreihe: | De Gruyter STEM
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| Schlagworte: | |
| Online-Zugang: | FAW01 FAB01 FCO01 FHA01 FKE01 FLA01 UPA01 Volltext |
| Zusammenfassung: | The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies |
| Beschreibung: | Description based on online resource; title from PDF title page (publisher's Web site, viewed 07. Nov 2022) |
| Beschreibung: | 1 Online-Ressource (VIII, 120 Seiten) |
| ISBN: | 9781501524790 |
| DOI: | 10.1515/9781501524790 |
Internformat
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Datensatz im Suchindex
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|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Sullivan, Daniel J. D. |
| author_facet | Sullivan, Daniel J. D. |
| author_role | aut |
| author_sort | Sullivan, Daniel J. D. |
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| building | Verbundindex |
| bvnumber | BV048571303 |
| classification_rvk | ZN 4030 |
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| ctrlnum | (ZDB-23-DGG)9781501524790 (OCoLC)1403381614 (DE-599)BVBBV048571303 |
| dewey-full | 620.00452 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.00452 |
| dewey-search | 620.00452 |
| dewey-sort | 3620.00452 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1515/9781501524790 |
| format | Electronic eBook |
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| id | DE-604.BV048571303 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T21:02:19Z |
| indexdate | 2024-07-10T09:41:45Z |
| institution | BVB |
| isbn | 9781501524790 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-033947332 |
| oclc_num | 1403381614 |
| open_access_boolean | |
| owner | DE-1043 DE-1046 DE-858 DE-Aug4 DE-859 DE-860 DE-739 |
| owner_facet | DE-1043 DE-1046 DE-858 DE-Aug4 DE-859 DE-860 DE-739 |
| physical | 1 Online-Ressource (VIII, 120 Seiten) |
| psigel | ZDB-23-DGG ZDB-23-DGG FAW_PDA_DGG ZDB-23-DGG FAB_PDA_DGG ZDB-23-DGG FCO_PDA_DGG ZDB-23-DGG FHA_PDA_DGG ZDB-23-DGG FKE_PDA_DGG ZDB-23-DGG FLA_PDA_DGG ZDB-23-DGG UPA_PDA_DGG |
| publishDate | 2022 |
| publishDateSearch | 2022 |
| publishDateSort | 2022 |
| publisher | De Gruyter |
| record_format | marc |
| series2 | De Gruyter STEM |
| spelling | Sullivan, Daniel J. D. Verfasser aut Failure Analysis High Technology Devices Daniel J. D. Sullivan, Eric J. Carleton Berlin ; Boston De Gruyter [2022] © 2022 1 Online-Ressource (VIII, 120 Seiten) txt rdacontent c rdamedia cr rdacarrier De Gruyter STEM Description based on online resource; title from PDF title page (publisher's Web site, viewed 07. Nov 2022) The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies In English Technology & Engineering / Materials Science / General bisacsh Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Fehlersuche (DE-588)4016615-6 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 s Fehlersuche (DE-588)4016615-6 s DE-604 Elektronische Schaltung (DE-588)4113419-9 s Carleton, Eric J. Sonstige oth Erscheint auch als Druck-Ausgabe 9781501524783 https://doi.org/10.1515/9781501524790 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Sullivan, Daniel J. D. Failure Analysis High Technology Devices Technology & Engineering / Materials Science / General bisacsh Elektronische Schaltung (DE-588)4113419-9 gnd Fehlersuche (DE-588)4016615-6 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| subject_GND | (DE-588)4113419-9 (DE-588)4016615-6 (DE-588)4014360-0 |
| title | Failure Analysis High Technology Devices |
| title_auth | Failure Analysis High Technology Devices |
| title_exact_search | Failure Analysis High Technology Devices |
| title_exact_search_txtP | Failure Analysis High Technology Devices |
| title_full | Failure Analysis High Technology Devices Daniel J. D. Sullivan, Eric J. Carleton |
| title_fullStr | Failure Analysis High Technology Devices Daniel J. D. Sullivan, Eric J. Carleton |
| title_full_unstemmed | Failure Analysis High Technology Devices Daniel J. D. Sullivan, Eric J. Carleton |
| title_short | Failure Analysis |
| title_sort | failure analysis high technology devices |
| title_sub | High Technology Devices |
| topic | Technology & Engineering / Materials Science / General bisacsh Elektronische Schaltung (DE-588)4113419-9 gnd Fehlersuche (DE-588)4016615-6 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| topic_facet | Technology & Engineering / Materials Science / General Elektronische Schaltung Fehlersuche Elektronisches Bauelement |
| url | https://doi.org/10.1515/9781501524790 |
| work_keys_str_mv | AT sullivandanieljd failureanalysishightechnologydevices AT carletonericj failureanalysishightechnologydevices |