Hyperspectral imaging microscopy for atomic layer mapping of two-dimensional materials:
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Bibliographic Details
Main Author: Dong, Xingchen (Author)
Format: Thesis Book
Language:English
Published: Düren Shaker Verlag 2022
Series:Reports on measurement and sensor systems
Subjects:
Online Access:Inhaltsverzeichnis
Inhaltsverzeichnis
Physical Description:iii, 164 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 260 g
ISBN:9783844085174
3844085173

There is no print copy available.

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