Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures:
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Abschlussarbeit Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
München
Hochschule für Angewandte Wissenschaften München
2022
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| Online-Zugang: | Volltext |
| Beschreibung: | 1 Online-Ressource (105 Seiten) Illustrationen, Diagramme |
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Datensatz im Suchindex
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| index_date | 2024-07-03T20:41:38Z |
| indexdate | 2024-07-10T09:39:32Z |
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| spelling | Stadler, Sebastian aut Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures Sebastian Stadler München Hochschule für Angewandte Wissenschaften München 2022 1 Online-Ressource (105 Seiten) Illustrationen, Diagramme txt rdacontent c rdamedia cr rdacarrier Masterarbeit Hochschule für Angewandte Wissenschaften München, Fakultät für angewandte Naturwissenschaften und Mechatronik 2022 SOI-Technik (DE-588)4128029-5 gnd rswk-swf Halbleiterdetektor (DE-588)4158795-9 gnd rswk-swf Röntgenspektroskopie (DE-588)4050331-8 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Röntgenspektroskopie (DE-588)4050331-8 s Halbleiterdetektor (DE-588)4158795-9 s SOI-Technik (DE-588)4128029-5 s DE-604 https://opus4.kobv.de/opus4-hm/frontdoor/index/index/docId/406 Volltext |
| spellingShingle | Stadler, Sebastian Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures SOI-Technik (DE-588)4128029-5 gnd Halbleiterdetektor (DE-588)4158795-9 gnd Röntgenspektroskopie (DE-588)4050331-8 gnd |
| subject_GND | (DE-588)4128029-5 (DE-588)4158795-9 (DE-588)4050331-8 (DE-588)4113937-9 |
| title | Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures |
| title_auth | Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures |
| title_exact_search | Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures |
| title_exact_search_txtP | Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures |
| title_full | Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures Sebastian Stadler |
| title_fullStr | Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures Sebastian Stadler |
| title_full_unstemmed | Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures Sebastian Stadler |
| title_short | Proof of Concept for Single-phase SOI-based Microchannel Cooling of Large Semiconductor Detectors by Fabricating and Verifying Equivalent Test Structures |
| title_sort | proof of concept for single phase soi based microchannel cooling of large semiconductor detectors by fabricating and verifying equivalent test structures |
| topic | SOI-Technik (DE-588)4128029-5 gnd Halbleiterdetektor (DE-588)4158795-9 gnd Röntgenspektroskopie (DE-588)4050331-8 gnd |
| topic_facet | SOI-Technik Halbleiterdetektor Röntgenspektroskopie Hochschulschrift |
| url | https://opus4.kobv.de/opus4-hm/frontdoor/index/index/docId/406 |
| work_keys_str_mv | AT stadlersebastian proofofconceptforsinglephasesoibasedmicrochannelcoolingoflargesemiconductordetectorsbyfabricatingandverifyingequivalentteststructures |