Reference Materials in Measurement and Technology: Proceedings of the Fourth International Scientific Conference
Gespeichert in:
| Weitere Verfasser: | , , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2022
Cham Springer |
| Ausgabe: | 1st ed. 2022 |
| Schlagworte: | |
| Online-Zugang: | BFB01 FKE01 TUM01 UBM01 UBT01 UBY01 Volltext |
| Beschreibung: | 1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color) |
| ISBN: | 9783031062858 |
| DOI: | 10.1007/978-3-031-06285-8 |
Internformat
MARC
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| 250 | |a 1st ed. 2022 | ||
| 264 | 1 | |a Cham |b Springer International Publishing |c 2022 | |
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| 650 | 4 | |a Measurement Science and Instrumentation | |
| 650 | 4 | |a Materials Characterization Technique | |
| 650 | 4 | |a Materials Engineering | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Measurement | |
| 650 | 4 | |a Measuring instruments | |
| 650 | 4 | |a Materials—Analysis | |
| 650 | 4 | |a Materials | |
| 650 | 4 | |a Spectrum analysis | |
| 700 | 1 | |a Medvedevskikh, Sergey V. |4 edt | |
| 700 | 1 | |a Sobina, Egor P. |4 edt | |
| 700 | 1 | |a Kremleva, Olga N. |4 edt | |
| 700 | 1 | |a Okrepilov, Mikhail V. |4 edt | |
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Datensatz im Suchindex
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| author2 | Medvedevskikh, Sergey V. Sobina, Egor P. Kremleva, Olga N. Okrepilov, Mikhail V. |
| author2_role | edt edt edt edt |
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| author_facet | Medvedevskikh, Sergey V. Sobina, Egor P. Kremleva, Olga N. Okrepilov, Mikhail V. |
| building | Verbundindex |
| bvnumber | BV048385133 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA |
| ctrlnum | (ZDB-2-PHA)9783031062858 (OCoLC)1339059816 (DE-599)BVBBV048385133 |
| dewey-full | 530.7 530.8 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.7 530.8 |
| dewey-search | 530.7 530.8 |
| dewey-sort | 3530.7 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| discipline_str_mv | Physik |
| doi_str_mv | 10.1007/978-3-031-06285-8 |
| edition | 1st ed. 2022 |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| index_date | 2024-07-03T20:19:49Z |
| indexdate | 2024-07-10T09:36:39Z |
| institution | BVB |
| isbn | 9783031062858 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-033763928 |
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| physical | 1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color) |
| psigel | ZDB-2-PHA ZDB-2-PHA_2022 |
| publishDate | 2022 |
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| publisher | Springer International Publishing Springer |
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| spelling | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov 1st ed. 2022 Cham Springer International Publishing 2022 Cham Springer 1 Online-Ressource (X, 218 p. 62 illus., 42 illus. in color) txt rdacontent c rdamedia cr rdacarrier Measurement Science and Instrumentation Materials Characterization Technique Materials Engineering Spectroscopy Measurement Measuring instruments Materials—Analysis Materials Spectrum analysis Medvedevskikh, Sergey V. edt Sobina, Egor P. edt Kremleva, Olga N. edt Okrepilov, Mikhail V. edt Erscheint auch als Druck-Ausgabe 978-3-031-06284-1 Erscheint auch als Druck-Ausgabe 978-3-031-06286-5 Erscheint auch als Druck-Ausgabe 978-3-031-06287-2 https://doi.org/10.1007/978-3-031-06285-8 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference Measurement Science and Instrumentation Materials Characterization Technique Materials Engineering Spectroscopy Measurement Measuring instruments Materials—Analysis Materials Spectrum analysis |
| title | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference |
| title_auth | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference |
| title_exact_search | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference |
| title_exact_search_txtP | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference |
| title_full | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov |
| title_fullStr | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov |
| title_full_unstemmed | Reference Materials in Measurement and Technology Proceedings of the Fourth International Scientific Conference edited by Sergey V. Medvedevskikh, Egor P. Sobina, Olga N. Kremleva, Mikhail V. Okrepilov |
| title_short | Reference Materials in Measurement and Technology |
| title_sort | reference materials in measurement and technology proceedings of the fourth international scientific conference |
| title_sub | Proceedings of the Fourth International Scientific Conference |
| topic | Measurement Science and Instrumentation Materials Characterization Technique Materials Engineering Spectroscopy Measurement Measuring instruments Materials—Analysis Materials Spectrum analysis |
| topic_facet | Measurement Science and Instrumentation Materials Characterization Technique Materials Engineering Spectroscopy Measurement Measuring instruments Materials—Analysis Materials Spectrum analysis |
| url | https://doi.org/10.1007/978-3-031-06285-8 |
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