Optical Metrology for Precision Engineering:
Saved in:
Bibliographic Details
Main Authors: Gao, Wei (Author), Shimizu, Yuki (Author)
Format: Electronic eBook
Language:English
Published: Berlin De Gruyter [2022]
Subjects:
Online Access:DE-1043
DE-1046
DE-858
DE-898
DE-859
DE-860
DE-863
DE-862
DE-91
DE-706
DE-739
Volltext
Physical Description:1 Online-Ressource
ISBN:9783110542363
DOI:10.1515/9783110542363