Optical metrology for precision engineering:
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Bibliographic Details
Main Authors: Gao, Wei (Author), Shimizu, Yuki (Author)
Format: Book
Language:English
Published: Berlin ; Boston De Gruyter [2022]
Subjects:
Online Access:https://www.degruyter.com/books/9783110541090
Physical Description:XI, 644 Seiten Illustrationen, Diagramme 24 cm x 17 cm
ISBN:9783110541090

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!