X-ray structure analysis:
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Bibliographic Details
Main Author: Siegrist, Theo (Author)
Format: Book
Language:English
Published: Berlin De Gruyter [2022]
Series:De Gruyter graduate
Subjects:
Online Access:Beschreibung für Leser
Physical Description:X, 239 Seiten Illustrationen, Diagramme 24 cm x 17 cm
ISBN:3110610701
9783110610703

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!