Reliability of organic compounds in microelectronics and optoelectronics: from physics-of-failure to physics-of-degradation
This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and pet...
Gespeichert in:
Weitere Verfasser: | , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Cham
Springer
[2022]
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Schlagworte: | |
Zusammenfassung: | This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems |
Beschreibung: | viii, 550 Seiten Illustrationen, Diagramme 235 mm |
ISBN: | 9783030815752 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV047558686 | ||
003 | DE-604 | ||
005 | 20220322 | ||
007 | t | ||
008 | 211025s2022 a||| |||| 00||| eng d | ||
020 | |a 9783030815752 |9 978-3-030-81575-2 | ||
024 | 3 | |a 9783030815752 | |
035 | |a (OCoLC)1309103261 | ||
035 | |a (DE-599)BVBBV047558686 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-29T | ||
245 | 1 | 0 | |a Reliability of organic compounds in microelectronics and optoelectronics |b from physics-of-failure to physics-of-degradation |c Willem Dirk van Driel, Maryam Yazdan Mehr, editors |
264 | 1 | |a Cham |b Springer |c [2022] | |
300 | |a viii, 550 Seiten |b Illustrationen, Diagramme |c 235 mm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
520 | |a This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems | ||
650 | 4 | |a bicssc | |
650 | 4 | |a bicssc | |
650 | 4 | |a bisacsh | |
650 | 4 | |a bisacsh | |
650 | 4 | |a Electronic circuits | |
650 | 4 | |a Electronics | |
650 | 4 | |a Microelectronics | |
650 | 4 | |a Electronic circuits | |
650 | 4 | |a Engineering | |
653 | |a Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik | ||
700 | 1 | |a Driel, Willem van |0 (DE-588)1251327168 |4 edt | |
700 | 1 | |a Yazdan Mehr, Maryam |4 edt | |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-030-81576-9 |
999 | |a oai:aleph.bib-bvb.de:BVB01-032934175 |
Datensatz im Suchindex
_version_ | 1804182884182917120 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author2 | Driel, Willem van Yazdan Mehr, Maryam |
author2_role | edt edt |
author2_variant | w v d wv wvd m m y mm mmy |
author_GND | (DE-588)1251327168 |
author_facet | Driel, Willem van Yazdan Mehr, Maryam |
building | Verbundindex |
bvnumber | BV047558686 |
ctrlnum | (OCoLC)1309103261 (DE-599)BVBBV047558686 |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02003nam a2200421 c 4500</leader><controlfield tag="001">BV047558686</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220322 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">211025s2022 a||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783030815752</subfield><subfield code="9">978-3-030-81575-2</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9783030815752</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1309103261</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047558686</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability of organic compounds in microelectronics and optoelectronics</subfield><subfield code="b">from physics-of-failure to physics-of-degradation</subfield><subfield code="c">Willem Dirk van Driel, Maryam Yazdan Mehr, editors</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield><subfield code="c">[2022]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">viii, 550 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield><subfield code="c">235 mm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bicssc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bicssc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Driel, Willem van</subfield><subfield code="0">(DE-588)1251327168</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yazdan Mehr, Maryam</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-3-030-81576-9</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032934175</subfield></datafield></record></collection> |
id | DE-604.BV047558686 |
illustrated | Illustrated |
index_date | 2024-07-03T18:26:48Z |
indexdate | 2024-07-10T09:14:38Z |
institution | BVB |
isbn | 9783030815752 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032934175 |
oclc_num | 1309103261 |
open_access_boolean | |
owner | DE-29T |
owner_facet | DE-29T |
physical | viii, 550 Seiten Illustrationen, Diagramme 235 mm |
publishDate | 2022 |
publishDateSearch | 2022 |
publishDateSort | 2022 |
publisher | Springer |
record_format | marc |
spelling | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation Willem Dirk van Driel, Maryam Yazdan Mehr, editors Cham Springer [2022] viii, 550 Seiten Illustrationen, Diagramme 235 mm txt rdacontent n rdamedia nc rdacarrier This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems bicssc bisacsh Electronic circuits Electronics Microelectronics Engineering Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik Driel, Willem van (DE-588)1251327168 edt Yazdan Mehr, Maryam edt Erscheint auch als Online-Ausgabe 978-3-030-81576-9 |
spellingShingle | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation bicssc bisacsh Electronic circuits Electronics Microelectronics Engineering |
title | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation |
title_auth | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation |
title_exact_search | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation |
title_exact_search_txtP | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation |
title_full | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation Willem Dirk van Driel, Maryam Yazdan Mehr, editors |
title_fullStr | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation Willem Dirk van Driel, Maryam Yazdan Mehr, editors |
title_full_unstemmed | Reliability of organic compounds in microelectronics and optoelectronics from physics-of-failure to physics-of-degradation Willem Dirk van Driel, Maryam Yazdan Mehr, editors |
title_short | Reliability of organic compounds in microelectronics and optoelectronics |
title_sort | reliability of organic compounds in microelectronics and optoelectronics from physics of failure to physics of degradation |
title_sub | from physics-of-failure to physics-of-degradation |
topic | bicssc bisacsh Electronic circuits Electronics Microelectronics Engineering |
topic_facet | bicssc bisacsh Electronic circuits Electronics Microelectronics Engineering |
work_keys_str_mv | AT drielwillemvan reliabilityoforganiccompoundsinmicroelectronicsandoptoelectronicsfromphysicsoffailuretophysicsofdegradation AT yazdanmehrmaryam reliabilityoforganiccompoundsinmicroelectronicsandoptoelectronicsfromphysicsoffailuretophysicsofdegradation |