MOS interface physics, process and characterization:
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Milton
Taylor & Francis Group
2022
|
Ausgabe: | First edition |
Schlagworte: | |
Beschreibung: | xi, 161 Seiten Illustrationen, Diagramme |
ISBN: | 9781032106274 |
Internformat
MARC
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003 | DE-604 | ||
005 | 20220208 | ||
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008 | 211015s2022 a||| |||| 00||| eng d | ||
020 | |a 9781032106274 |9 978-1-032-10627-4 | ||
035 | |a (OCoLC)1296352314 | ||
035 | |a (DE-599)BVBBV047514263 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-83 | ||
082 | 0 | |a 621.3815/284 | |
084 | |a ZN 4960 |0 (DE-625)157426: |2 rvk | ||
100 | 1 | |a Wang, Shengkai |d 1984- |e Verfasser |0 (DE-588)1249435919 |4 aut | |
245 | 1 | 0 | |a MOS interface physics, process and characterization |c Shengkai Wan and Xiaolei Wang |
250 | |a First edition | ||
264 | 1 | |a Milton |b Taylor & Francis Group |c 2022 | |
300 | |a xi, 161 Seiten |b Illustrationen, Diagramme | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 0 | 7 | |a MOS |0 (DE-588)4130209-6 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a MOS |0 (DE-588)4130209-6 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Wang, Xiaolei |4 aut | |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-1-00-045576-2 |
999 | |a oai:aleph.bib-bvb.de:BVB01-032915068 |
Datensatz im Suchindex
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adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Wang, Shengkai 1984- Wang, Xiaolei |
author_GND | (DE-588)1249435919 |
author_facet | Wang, Shengkai 1984- Wang, Xiaolei |
author_role | aut aut |
author_sort | Wang, Shengkai 1984- |
author_variant | s w sw x w xw |
building | Verbundindex |
bvnumber | BV047514263 |
classification_rvk | ZN 4960 |
ctrlnum | (OCoLC)1296352314 (DE-599)BVBBV047514263 |
dewey-full | 621.3815/284 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/284 |
dewey-search | 621.3815/284 |
dewey-sort | 3621.3815 3284 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | First edition |
format | Book |
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id | DE-604.BV047514263 |
illustrated | Illustrated |
index_date | 2024-07-03T18:22:49Z |
indexdate | 2024-07-10T09:14:11Z |
institution | BVB |
isbn | 9781032106274 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032915068 |
oclc_num | 1296352314 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | xi, 161 Seiten Illustrationen, Diagramme |
publishDate | 2022 |
publishDateSearch | 2022 |
publishDateSort | 2022 |
publisher | Taylor & Francis Group |
record_format | marc |
spelling | Wang, Shengkai 1984- Verfasser (DE-588)1249435919 aut MOS interface physics, process and characterization Shengkai Wan and Xiaolei Wang First edition Milton Taylor & Francis Group 2022 xi, 161 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier MOS (DE-588)4130209-6 gnd rswk-swf MOS (DE-588)4130209-6 s DE-604 Wang, Xiaolei aut Erscheint auch als Online-Ausgabe 978-1-00-045576-2 |
spellingShingle | Wang, Shengkai 1984- Wang, Xiaolei MOS interface physics, process and characterization MOS (DE-588)4130209-6 gnd |
subject_GND | (DE-588)4130209-6 |
title | MOS interface physics, process and characterization |
title_auth | MOS interface physics, process and characterization |
title_exact_search | MOS interface physics, process and characterization |
title_exact_search_txtP | MOS interface physics, process and characterization |
title_full | MOS interface physics, process and characterization Shengkai Wan and Xiaolei Wang |
title_fullStr | MOS interface physics, process and characterization Shengkai Wan and Xiaolei Wang |
title_full_unstemmed | MOS interface physics, process and characterization Shengkai Wan and Xiaolei Wang |
title_short | MOS interface physics, process and characterization |
title_sort | mos interface physics process and characterization |
topic | MOS (DE-588)4130209-6 gnd |
topic_facet | MOS |
work_keys_str_mv | AT wangshengkai mosinterfacephysicsprocessandcharacterization AT wangxiaolei mosinterfacephysicsprocessandcharacterization |