Short circuit requirements of power converters based upon wide-bandgap semiconductors:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Abschlussarbeit Buch |
Sprache: | English |
Veröffentlicht: |
Kassel, Hess
Kassel University Press
[2021]
|
Schriftenreihe: | Elektrische Energiesysteme
20 |
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | xiv, 253 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm |
ISBN: | 9783737609777 3737609772 |
Internformat
MARC
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Datensatz im Suchindex
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adam_text |
CONTENTS
1
INTRODUCTION
1
1.1
MOTIVATION
.
1
1.2
OVERVIEW
OF
SHORT
CIRCUIT
ON
ACTIVE
POWER
SEMICONDUCTORS
.
.
7
1.3
RESEARCH
OBJECTIVES
AND
APPROACHES
.
10
1.4
DISSERTATION
ORGANIZATION
.
10
2
SHORT
CIRCUIT
CAPABILITY
OF
LOW-VOLTAGE
IGBTS
13
2.1
OBJECTIVE
.
13
2.2
IGBT
SHORT
CIRCUIT:
STATE-OF-THE-ART
.
13
2.2.1
INTRODUCTION
.
13
2.2.2
FAILURE
MECHANISMS
.
14
2.2.3
EXCEEDING
THERMAL
LIMIT
.
17
2.2.4
ELECTRICAL
FAILURE
.
20
2.2.5
TYPES
OF
SHORT
CIRCUIT
FAULTS
.
23
2.2.6
IGBT
SAFE
OPERATION
AREA
(SOA)
.
29
2.2.7
MAXIMUM
SAFE
SHORT
CIRCUIT
TIME
UNDER
EXTREME
WORKING
CONDITIONS
.
30
2.3
EXPERIMENTAL
INVESTIGATION
.
32
2.3.1
TEST
SETUP
.
33
2.3.2
PERFORMED
MEASUREMENTS
AND
TESTS
.
35
2.4
CHAPTER
CONCLUSIONS
.
53
3
SHORT
CIRCUIT
CAPABILITY
OF
SIC
MOSFETS
55
3.1
OBJECTIVE
.
55
3.2
INTRODUCTION
.
55
3.3
OVERVIEW
OF
SHORT
CIRCUIT
ON
SIC
MOSFETS
.
57
3.4
EXPERIMENTAL
INVESTIGATION
.
60
3.4.1
TEST
SETUP
.
61
3.4.2
PLANAR
SIC
MOSFET
.
64
3.4.3
TRENCH
SIC
MOSFET
.
70
3.5
FAILURE
ANALYSIS
OF
THE
TESTED
SIC
MOSFETS
.
80
3.5.1
PERFORMANCE
OF
THE
TESTED
DEVICES
.
80
3.6
CHAPTER
CONCLUSION
.
97
4
SHORT
CIRCUIT
CAPABILITY
OF
GAN
DEVICES
99
4.1
OBJECTIVE
.
99
4.2
INTRODUCTION
.
99
4.3
OVERVIEW
OF
GAN
HEMT
.
101
4.4
SHORT
CIRCUIT
ON
GAN
HEMT
.
104
4.5
EXPERIMENTAL
INVESTIGATION
.
107
4.5.1
PERFORMED
TESTS
.
107
4.6
FAILURE
ANALYSIS
.
121
4.7
DISCUSSION
.
129
4.8
CHAPTER
CONCLUSIONS
.
131
5
SC
REQUIREMENTS
AND
PROTECTION
133
5.1
APPLICATION
REQUIREMENTS
.
133
5.2
SHORT
CIRCUIT
IN
VOLTAGE-SOURCE
INVERTERS
.
135
5.2.1
SHORT
CIRCUIT
ON
MULTILEVEL
INVERTERS
.
137
5.3
SC
DRIVER
REQUIREMENTS
.
139
5.4
PROTECTION
SCHEMES
.
140
5.4.1
SHUNT
RESISTOR
.
142
5.4.2
SOLID-STATE
CIRCUIT
BREAKER
.
143
5.4.3
DESATURATION
.
143
5.4.4
FAULT
CURRENT
EVALUATION
.
145
5.5
SOFT
TURN-OFF
.
147
5.6
DISCUSSION
.
149
5.7
CHAPTER
CONCLUSION
.
150
6
CONCLUSION
151
6.1
SUMMARY
.
151
6.2
FUTURE
WORK
.
154
APPENDICES
157
A
REPETITIVE
SHORT
CIRCUIT
TESTS
159
B
SIC
MOSFET
ELECTRO-THERMAL
SIMULATION
189
B.L
PHYSICAL
MODEL
.
190
B.2
SOLUTION
OF
THE
UNIDIMENSIONAL
HEAT
EQUATION
.
193
B.2.1
FIXED
BOUNDARY
CONDITION
.
193
B.2.
2
INSULATED
BOUNDARIES
.
201
B.2.
3
HEAT
SOURCE
.
203
B.2.
4
MATLAB
SCRIPT
.
206
C
DYNAMIC
MODEL
OF
THE
GAN
SHORT
CIRCUIT
215
REFERENCES
219 |
adam_txt |
CONTENTS
1
INTRODUCTION
1
1.1
MOTIVATION
.
1
1.2
OVERVIEW
OF
SHORT
CIRCUIT
ON
ACTIVE
POWER
SEMICONDUCTORS
.
.
7
1.3
RESEARCH
OBJECTIVES
AND
APPROACHES
.
10
1.4
DISSERTATION
ORGANIZATION
.
10
2
SHORT
CIRCUIT
CAPABILITY
OF
LOW-VOLTAGE
IGBTS
13
2.1
OBJECTIVE
.
13
2.2
IGBT
SHORT
CIRCUIT:
STATE-OF-THE-ART
.
13
2.2.1
INTRODUCTION
.
13
2.2.2
FAILURE
MECHANISMS
.
14
2.2.3
EXCEEDING
THERMAL
LIMIT
.
17
2.2.4
ELECTRICAL
FAILURE
.
20
2.2.5
TYPES
OF
SHORT
CIRCUIT
FAULTS
.
23
2.2.6
IGBT
SAFE
OPERATION
AREA
(SOA)
.
29
2.2.7
MAXIMUM
SAFE
SHORT
CIRCUIT
TIME
UNDER
EXTREME
WORKING
CONDITIONS
.
30
2.3
EXPERIMENTAL
INVESTIGATION
.
32
2.3.1
TEST
SETUP
.
33
2.3.2
PERFORMED
MEASUREMENTS
AND
TESTS
.
35
2.4
CHAPTER
CONCLUSIONS
.
53
3
SHORT
CIRCUIT
CAPABILITY
OF
SIC
MOSFETS
55
3.1
OBJECTIVE
.
55
3.2
INTRODUCTION
.
55
3.3
OVERVIEW
OF
SHORT
CIRCUIT
ON
SIC
MOSFETS
.
57
3.4
EXPERIMENTAL
INVESTIGATION
.
60
3.4.1
TEST
SETUP
.
61
3.4.2
PLANAR
SIC
MOSFET
.
64
3.4.3
TRENCH
SIC
MOSFET
.
70
3.5
FAILURE
ANALYSIS
OF
THE
TESTED
SIC
MOSFETS
.
80
3.5.1
PERFORMANCE
OF
THE
TESTED
DEVICES
.
80
3.6
CHAPTER
CONCLUSION
.
97
4
SHORT
CIRCUIT
CAPABILITY
OF
GAN
DEVICES
99
4.1
OBJECTIVE
.
99
4.2
INTRODUCTION
.
99
4.3
OVERVIEW
OF
GAN
HEMT
.
101
4.4
SHORT
CIRCUIT
ON
GAN
HEMT
.
104
4.5
EXPERIMENTAL
INVESTIGATION
.
107
4.5.1
PERFORMED
TESTS
.
107
4.6
FAILURE
ANALYSIS
.
121
4.7
DISCUSSION
.
129
4.8
CHAPTER
CONCLUSIONS
.
131
5
SC
REQUIREMENTS
AND
PROTECTION
133
5.1
APPLICATION
REQUIREMENTS
.
133
5.2
SHORT
CIRCUIT
IN
VOLTAGE-SOURCE
INVERTERS
.
135
5.2.1
SHORT
CIRCUIT
ON
MULTILEVEL
INVERTERS
.
137
5.3
SC
DRIVER
REQUIREMENTS
.
139
5.4
PROTECTION
SCHEMES
.
140
5.4.1
SHUNT
RESISTOR
.
142
5.4.2
SOLID-STATE
CIRCUIT
BREAKER
.
143
5.4.3
DESATURATION
.
143
5.4.4
FAULT
CURRENT
EVALUATION
.
145
5.5
SOFT
TURN-OFF
.
147
5.6
DISCUSSION
.
149
5.7
CHAPTER
CONCLUSION
.
150
6
CONCLUSION
151
6.1
SUMMARY
.
151
6.2
FUTURE
WORK
.
154
APPENDICES
157
A
REPETITIVE
SHORT
CIRCUIT
TESTS
159
B
SIC
MOSFET
ELECTRO-THERMAL
SIMULATION
189
B.L
PHYSICAL
MODEL
.
190
B.2
SOLUTION
OF
THE
UNIDIMENSIONAL
HEAT
EQUATION
.
193
B.2.1
FIXED
BOUNDARY
CONDITION
.
193
B.2.
2
INSULATED
BOUNDARIES
.
201
B.2.
3
HEAT
SOURCE
.
203
B.2.
4
MATLAB
SCRIPT
.
206
C
DYNAMIC
MODEL
OF
THE
GAN
SHORT
CIRCUIT
215
REFERENCES
219 |
any_adam_object | 1 |
any_adam_object_boolean | 1 |
author | Pappis, Douglas |
author_GND | (DE-588)1248916484 |
author_facet | Pappis, Douglas |
author_role | aut |
author_sort | Pappis, Douglas |
author_variant | d p dp |
building | Verbundindex |
bvnumber | BV047512167 |
classification_rvk | ZN 8340 |
ctrlnum | (OCoLC)1302327117 (DE-599)DNB1242284788 |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Thesis Book |
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genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV047512167 |
illustrated | Illustrated |
index_date | 2024-07-03T18:22:16Z |
indexdate | 2024-11-14T11:02:32Z |
institution | BVB |
isbn | 9783737609777 3737609772 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032913027 |
oclc_num | 1302327117 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | xiv, 253 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm |
publishDate | 2021 |
publishDateSearch | 2021 |
publishDateSort | 2021 |
publisher | Kassel University Press |
record_format | marc |
series | Elektrische Energiesysteme |
series2 | Elektrische Energiesysteme |
spelling | Pappis, Douglas Verfasser (DE-588)1248916484 aut Short circuit requirements of power converters based upon wide-bandgap semiconductors Douglas Pappis Kassel, Hess Kassel University Press [2021] © 2021 xiv, 253 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm txt rdacontent sti rdacontent n rdamedia nc rdacarrier Elektrische Energiesysteme 20 Dissertation Universität Kassel 2020 Kurzschluss (DE-588)4166241-6 gnd rswk-swf Funktionssicherheit (DE-588)4760707-5 gnd rswk-swf Leistungselektronik (DE-588)4035235-3 gnd rswk-swf Leistungshalbleiter (DE-588)4167286-0 gnd rswk-swf MOS-FET (DE-588)4207266-9 gnd rswk-swf Siliciumcarbid (DE-588)4055009-6 gnd rswk-swf GaN HEMT Short Circuit IGBT SiC MOSFET Power Semiconductors (DE-588)4113937-9 Hochschulschrift gnd-content Leistungselektronik (DE-588)4035235-3 s Kurzschluss (DE-588)4166241-6 s Funktionssicherheit (DE-588)4760707-5 s MOS-FET (DE-588)4207266-9 s Leistungshalbleiter (DE-588)4167286-0 s Siliciumcarbid (DE-588)4055009-6 s DE-604 Elektrische Energiesysteme 20 (DE-604)BV037185707 20 DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=032913027&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p vlb 20211001 DE-101 https://d-nb.info/provenance/plan#vlb |
spellingShingle | Pappis, Douglas Short circuit requirements of power converters based upon wide-bandgap semiconductors Elektrische Energiesysteme Kurzschluss (DE-588)4166241-6 gnd Funktionssicherheit (DE-588)4760707-5 gnd Leistungselektronik (DE-588)4035235-3 gnd Leistungshalbleiter (DE-588)4167286-0 gnd MOS-FET (DE-588)4207266-9 gnd Siliciumcarbid (DE-588)4055009-6 gnd |
subject_GND | (DE-588)4166241-6 (DE-588)4760707-5 (DE-588)4035235-3 (DE-588)4167286-0 (DE-588)4207266-9 (DE-588)4055009-6 (DE-588)4113937-9 |
title | Short circuit requirements of power converters based upon wide-bandgap semiconductors |
title_auth | Short circuit requirements of power converters based upon wide-bandgap semiconductors |
title_exact_search | Short circuit requirements of power converters based upon wide-bandgap semiconductors |
title_exact_search_txtP | Short circuit requirements of power converters based upon wide-bandgap semiconductors |
title_full | Short circuit requirements of power converters based upon wide-bandgap semiconductors Douglas Pappis |
title_fullStr | Short circuit requirements of power converters based upon wide-bandgap semiconductors Douglas Pappis |
title_full_unstemmed | Short circuit requirements of power converters based upon wide-bandgap semiconductors Douglas Pappis |
title_short | Short circuit requirements of power converters based upon wide-bandgap semiconductors |
title_sort | short circuit requirements of power converters based upon wide bandgap semiconductors |
topic | Kurzschluss (DE-588)4166241-6 gnd Funktionssicherheit (DE-588)4760707-5 gnd Leistungselektronik (DE-588)4035235-3 gnd Leistungshalbleiter (DE-588)4167286-0 gnd MOS-FET (DE-588)4207266-9 gnd Siliciumcarbid (DE-588)4055009-6 gnd |
topic_facet | Kurzschluss Funktionssicherheit Leistungselektronik Leistungshalbleiter MOS-FET Siliciumcarbid Hochschulschrift |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=032913027&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
volume_link | (DE-604)BV037185707 |
work_keys_str_mv | AT pappisdouglas shortcircuitrequirementsofpowerconvertersbaseduponwidebandgapsemiconductors |