Reliability of semiconductor lasers and optoelectronic devices:
Front Cover -- Reliability of Semiconductor Lasers and Optoelectronic Devices -- Copyright Page -- Dedication -- Contents -- List of contributors -- Preface -- Acknowledgments -- 1 Introduction to optoelectronic devices -- 1.1 Introduction -- 1.2 Optoelectronic applications -- 1.2.1 InGaN-based ligh...
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
San Diego
Elsevier
[2021]
|
| Schriftenreihe: | Woodhead Publishing Series in Electronic and Optical Materials
|
| Schlagworte: | |
| Zusammenfassung: | Front Cover -- Reliability of Semiconductor Lasers and Optoelectronic Devices -- Copyright Page -- Dedication -- Contents -- List of contributors -- Preface -- Acknowledgments -- 1 Introduction to optoelectronic devices -- 1.1 Introduction -- 1.2 Optoelectronic applications -- 1.2.1 InGaN-based light-emitting diodes for high-efficiency lighting -- 1.2.2 Lasers for sensing arrays -- 1.2.3 Lasers for data- and telecommunications -- 1.2.4 The history of the laser -- 1.3 Principles of operation for optoelectronic components -- 1.3.1 Light emission -- 1.3.1.1 Light emission in gas plasmas: a review -- 1.3.1.2 Stimulated emission in gas lasers -- 1.3.1.3 Spontaneous and stimulated emission from semiconductors -- 1.3.2 Light-emitting diodes -- 1.3.2.1 Carrier confinement -- 1.3.2.2 Light extraction -- 1.3.2.3 Heat extraction -- 1.3.2.4 "Rollover" or "droop" -- 1.3.2.5 "The green gap" -- 1.3.3 Lasers -- 1.3.3.1 What additional design features exist with lasers that are not present with an light-emitting diode? -- Adding a "population inversion" -- Adding waveguiding -- Adding mirrors -- 1.3.3.2 Vertical-cavity surface-emitting lasers -- 1.3.3.3 Direct modulation -- 1.3.4 Modulators -- 1.3.5 Photodetectors -- 1.3.5.1 Photodiodes -- 1.3.5.2 Avalanche photodiodes -- 1.4 Method of fabrication -- 1.4.1 Epitaxial growth -- 1.4.2 Wafer fabrication -- 1.4.3 Wafer test -- 1.4.4 Singulation and packaging -- 1.4.5 Burn-in -- 1.5 Critical metrics -- 1.5.1 Beam divergence -- 1.5.2 Single mode versus multimode -- 1.5.3 Coherence length -- 1.5.4 Power -- 1.5.5 Modulation rate -- 1.6 Laser and light-emitting diode reliability -- 1.6.1 Reliability qualification -- 1.6.2 Quality control -- 1.7 New technology developments -- 1.7.1 Fiber optics -- 1.7.2 The future of optoelectronic devices -- 1.7.2.1 Photonic integrated circuits -- 1.7.2.2 LiDAR. |
| Beschreibung: | Description based on publisher supplied metadata and other sources |
| Beschreibung: | xvi, 318 Seiten |
| ISBN: | 9780128192542 |
Internformat
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Datensatz im Suchindex
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| id | DE-604.BV047504628 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T18:19:57Z |
| indexdate | 2024-07-10T09:13:55Z |
| institution | BVB |
| isbn | 9780128192542 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032905609 |
| oclc_num | 1296292718 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | xvi, 318 Seiten |
| publishDate | 2021 |
| publishDateSearch | 2021 |
| publishDateSort | 2021 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Woodhead Publishing Series in Electronic and Optical Materials |
| spelling | Reliability of semiconductor lasers and optoelectronic devices edited by Robert W. Herrick, Osamu Ueda San Diego Elsevier [2021] © 2021 xvi, 318 Seiten txt rdacontent n rdamedia nc rdacarrier Woodhead Publishing Series in Electronic and Optical Materials Description based on publisher supplied metadata and other sources Front Cover -- Reliability of Semiconductor Lasers and Optoelectronic Devices -- Copyright Page -- Dedication -- Contents -- List of contributors -- Preface -- Acknowledgments -- 1 Introduction to optoelectronic devices -- 1.1 Introduction -- 1.2 Optoelectronic applications -- 1.2.1 InGaN-based light-emitting diodes for high-efficiency lighting -- 1.2.2 Lasers for sensing arrays -- 1.2.3 Lasers for data- and telecommunications -- 1.2.4 The history of the laser -- 1.3 Principles of operation for optoelectronic components -- 1.3.1 Light emission -- 1.3.1.1 Light emission in gas plasmas: a review -- 1.3.1.2 Stimulated emission in gas lasers -- 1.3.1.3 Spontaneous and stimulated emission from semiconductors -- 1.3.2 Light-emitting diodes -- 1.3.2.1 Carrier confinement -- 1.3.2.2 Light extraction -- 1.3.2.3 Heat extraction -- 1.3.2.4 "Rollover" or "droop" -- 1.3.2.5 "The green gap" -- 1.3.3 Lasers -- 1.3.3.1 What additional design features exist with lasers that are not present with an light-emitting diode? -- Adding a "population inversion" -- Adding waveguiding -- Adding mirrors -- 1.3.3.2 Vertical-cavity surface-emitting lasers -- 1.3.3.3 Direct modulation -- 1.3.4 Modulators -- 1.3.5 Photodetectors -- 1.3.5.1 Photodiodes -- 1.3.5.2 Avalanche photodiodes -- 1.4 Method of fabrication -- 1.4.1 Epitaxial growth -- 1.4.2 Wafer fabrication -- 1.4.3 Wafer test -- 1.4.4 Singulation and packaging -- 1.4.5 Burn-in -- 1.5 Critical metrics -- 1.5.1 Beam divergence -- 1.5.2 Single mode versus multimode -- 1.5.3 Coherence length -- 1.5.4 Power -- 1.5.5 Modulation rate -- 1.6 Laser and light-emitting diode reliability -- 1.6.1 Reliability qualification -- 1.6.2 Quality control -- 1.7 New technology developments -- 1.7.1 Fiber optics -- 1.7.2 The future of optoelectronic devices -- 1.7.2.1 Photonic integrated circuits -- 1.7.2.2 LiDAR. Optoelektronisches Bauelement (DE-588)4043689-5 gnd rswk-swf Halbleiterlaser (DE-588)4139556-6 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Optoelektronisches Bauelement (DE-588)4043689-5 s Halbleiterlaser (DE-588)4139556-6 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Herrick, Robert edt Ueda, Osamu (DE-588)1060843390 ctb Erscheint auch als Online-Ausgabe 978-0-12-819255-9 |
| spellingShingle | Reliability of semiconductor lasers and optoelectronic devices Optoelektronisches Bauelement (DE-588)4043689-5 gnd Halbleiterlaser (DE-588)4139556-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4043689-5 (DE-588)4139556-6 (DE-588)4059245-5 |
| title | Reliability of semiconductor lasers and optoelectronic devices |
| title_auth | Reliability of semiconductor lasers and optoelectronic devices |
| title_exact_search | Reliability of semiconductor lasers and optoelectronic devices |
| title_exact_search_txtP | Reliability of semiconductor lasers and optoelectronic devices |
| title_full | Reliability of semiconductor lasers and optoelectronic devices edited by Robert W. Herrick, Osamu Ueda |
| title_fullStr | Reliability of semiconductor lasers and optoelectronic devices edited by Robert W. Herrick, Osamu Ueda |
| title_full_unstemmed | Reliability of semiconductor lasers and optoelectronic devices edited by Robert W. Herrick, Osamu Ueda |
| title_short | Reliability of semiconductor lasers and optoelectronic devices |
| title_sort | reliability of semiconductor lasers and optoelectronic devices |
| topic | Optoelektronisches Bauelement (DE-588)4043689-5 gnd Halbleiterlaser (DE-588)4139556-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Optoelektronisches Bauelement Halbleiterlaser Zuverlässigkeit |
| work_keys_str_mv | AT herrickrobert reliabilityofsemiconductorlasersandoptoelectronicdevices AT uedaosamu reliabilityofsemiconductorlasersandoptoelectronicdevices |