The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategi...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Hurst, Stanley L. (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Stevenage IET 1998
Schriftenreihe:	IEE circuits, devices and systems series 9
Schlagworte:	VLSI Prüftechnik Application-specific integrated circuits Integrated circuits > Testing Integrated circuits > Very large scale integration Signal processing integrated circuit testing mixed analogue-digital integrated circuits signal processing
Online-Zugang:	UBY01 URL des Erstveröffentlichers
Zusammenfassung:	The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategies should be part of every circuit and system designer's education. This book is a comprehensive introduction and reference for all aspects of IC testing. It includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing. In addition to detailed coverage of digital network testing, VLSI testing also considers in depth the growing area of testing analogue and mixed analogue/digital ICs, used particularly in signal processing
Beschreibung:	1 Online-Ressource
ISBN:	9781849191654
DOI:	10.1049/PBCS009E