Dealing with issues in VLSI interconnect scaling:

This tutorial discusses on-chip wires, how to model them, what are their problems (and their advantages) and some solutions. Topics that will be covered include: wire characteristics and how they determine performance; wires under technology scaling; and methods to improve wire performance

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Bibliographic Details
Main Author: Ho, Ron (Author)
Format: Electronic Video
Language:English
Published: United States IEEE 2008
Subjects:
Online Access:FHN01
TUM01
Summary:This tutorial discusses on-chip wires, how to model them, what are their problems (and their advantages) and some solutions. Topics that will be covered include: wire characteristics and how they determine performance; wires under technology scaling; and methods to improve wire performance
Item Description:Description based on online resource; title from title screen (IEEE Xplore Digital Library, viewed November 13, 2020)
Physical Description:1 Online-Resource (1 Videodatei, 60 Minuten) color illustrations
ISBN:9781424414505

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!