Dealing with issues in VLSI interconnect scaling:

This tutorial discusses on-chip wires, how to model them, what are their problems (and their advantages) and some solutions. Topics that will be covered include: wire characteristics and how they determine performance; wires under technology scaling; and methods to improve wire performance

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Ho, Ron (VerfasserIn)
Format: Elektronisch Video
Sprache:English
Veröffentlicht: United States IEEE 2008
Schlagworte:
Online-Zugang:FHN01
TUM01
Zusammenfassung:This tutorial discusses on-chip wires, how to model them, what are their problems (and their advantages) and some solutions. Topics that will be covered include: wire characteristics and how they determine performance; wires under technology scaling; and methods to improve wire performance
Beschreibung:Description based on online resource; title from title screen (IEEE Xplore Digital Library, viewed November 13, 2020)
Beschreibung:1 Online-Resource (1 Videodatei, 60 Minuten) color illustrations
ISBN:9781424414505

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