International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990: [proceedings]
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
World Scientific
1991
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references |
| Beschreibung: | 1 Online-Ressource (492 Seiten) ill |
| ISBN: | 9789814539340 9814539341 9789810205317 9810205317 |
| DOI: | 10.1142/1310 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV047424353 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 210817s1991 |||| o||u| ||||||eng d | ||
| 020 | |a 9789814539340 |9 978-981-4539-34-0 | ||
| 020 | |a 9814539341 |9 981-4539-34-1 | ||
| 020 | |a 9789810205317 |9 978-981-02-0531-7 | ||
| 020 | |a 9810205317 |9 981-02-0531-7 | ||
| 024 | 7 | |a 10.1142/1310 |2 doi | |
| 035 | |a (ZDB-124-WOP)0001310 | ||
| 035 | |a (OCoLC)1264269541 | ||
| 035 | |a (DE-599)BVBBV047424353 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 502/.8/25 | |
| 110 | 2 | |a International Symposium on Electron Microscopy <1990, Beijing, China> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 |b [proceedings] |c editors, Kehsin Kuo and Junen Yao |
| 246 | 1 | 3 | |a Electron microscopy |
| 264 | 1 | |a Singapore |b World Scientific |c 1991 | |
| 300 | |a 1 Online-Ressource (492 Seiten) |b ill | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references | ||
| 650 | 4 | |a Electron microscopy |x Congresses | |
| 650 | 4 | |a Electron microscopy |x Technique |x Congresses | |
| 650 | 4 | |a Electron microscopy |x China |x Congresses | |
| 653 | |a Electronic books | ||
| 700 | 1 | |a Kuo, K o-hsin |e Sonstige |4 oth | |
| 700 | 1 | |a Yao, Ch un-en |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u https://doi.org/10.1142/1310 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-124-WOP | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-032826874 | ||
Datensatz im Suchindex
| _version_ | 1804182705240276992 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | International Symposium on Electron Microscopy <1990, Beijing, China> |
| author_corporate_role | aut |
| author_facet | International Symposium on Electron Microscopy <1990, Beijing, China> |
| author_sort | International Symposium on Electron Microscopy <1990, Beijing, China> |
| building | Verbundindex |
| bvnumber | BV047424353 |
| collection | ZDB-124-WOP |
| ctrlnum | (ZDB-124-WOP)0001310 (OCoLC)1264269541 (DE-599)BVBBV047424353 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| discipline_str_mv | Allgemeine Naturwissenschaft |
| doi_str_mv | 10.1142/1310 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01576nmm a2200433zc 4500</leader><controlfield tag="001">BV047424353</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">210817s1991 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814539340</subfield><subfield code="9">978-981-4539-34-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9814539341</subfield><subfield code="9">981-4539-34-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789810205317</subfield><subfield code="9">978-981-02-0531-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9810205317</subfield><subfield code="9">981-02-0531-7</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1142/1310</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-124-WOP)0001310</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1264269541</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047424353</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Symposium on Electron Microscopy <1990, Beijing, China></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990</subfield><subfield code="b">[proceedings]</subfield><subfield code="c">editors, Kehsin Kuo and Junen Yao</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">World Scientific</subfield><subfield code="c">1991</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (492 Seiten)</subfield><subfield code="b">ill</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">Technique</subfield><subfield code="x">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">China</subfield><subfield code="x">Congresses</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Electronic books</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kuo, K o-hsin</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yao, Ch un-en</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1142/1310</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-124-WOP</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032826874</subfield></datafield></record></collection> |
| id | DE-604.BV047424353 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T17:57:37Z |
| indexdate | 2024-07-10T09:11:48Z |
| institution | BVB |
| isbn | 9789814539340 9814539341 9789810205317 9810205317 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032826874 |
| oclc_num | 1264269541 |
| open_access_boolean | |
| physical | 1 Online-Ressource (492 Seiten) ill |
| psigel | ZDB-124-WOP |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | World Scientific |
| record_format | marc |
| spelling | International Symposium on Electron Microscopy <1990, Beijing, China> Verfasser aut International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] editors, Kehsin Kuo and Junen Yao Electron microscopy Singapore World Scientific 1991 1 Online-Ressource (492 Seiten) ill txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references Electron microscopy Congresses Electron microscopy Technique Congresses Electron microscopy China Congresses Electronic books Kuo, K o-hsin Sonstige oth Yao, Ch un-en Sonstige oth https://doi.org/10.1142/1310 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] Electron microscopy Congresses Electron microscopy Technique Congresses Electron microscopy China Congresses |
| title | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] |
| title_alt | Electron microscopy |
| title_auth | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] |
| title_exact_search | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] |
| title_exact_search_txtP | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] |
| title_full | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] editors, Kehsin Kuo and Junen Yao |
| title_fullStr | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] editors, Kehsin Kuo and Junen Yao |
| title_full_unstemmed | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 [proceedings] editors, Kehsin Kuo and Junen Yao |
| title_short | International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990 |
| title_sort | international symposium on electron microscopy beijing china october 22 23 1990 proceedings |
| title_sub | [proceedings] |
| topic | Electron microscopy Congresses Electron microscopy Technique Congresses Electron microscopy China Congresses |
| topic_facet | Electron microscopy Congresses Electron microscopy Technique Congresses Electron microscopy China Congresses |
| url | https://doi.org/10.1142/1310 |
| work_keys_str_mv | AT internationalsymposiumonelectronmicroscopy1990beijingchina internationalsymposiumonelectronmicroscopybeijingchinaoctober22231990proceedings AT kuokohsin internationalsymposiumonelectronmicroscopybeijingchinaoctober22231990proceedings AT yaochunen internationalsymposiumonelectronmicroscopybeijingchinaoctober22231990proceedings AT internationalsymposiumonelectronmicroscopy1990beijingchina electronmicroscopy AT kuokohsin electronmicroscopy AT yaochunen electronmicroscopy |