Verfügbarkeit: The techlash and tech crisis communication

The techlash and tech crisis communication:

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Bibliographische Detailangaben
1. Verfasser:	Weiss-Blatt, Nirit (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	United Kingdom ; North America ; Japan ; India ; Malaysia ; China ; Bingley, UK Emerald Publishing 2021
Ausgabe:	First edition
Schlagworte:	Technikbewertung Informationstechnik Technologieunternehmen Communication of technical information Science journalism Electronic books
Online-Zugang:	EUV01 FAW01 FAW02 FWS01 FWS02 TUM01 UBY01 UEI01 UER01 FHN01 Volltext
Beschreibung:	1 Online-Ressource (xxi, 185 Seiten) Illustrationen, Diagramme
ISBN:	9781800430853 9781800430877
DOI:	10.1108/9781800430853

Internformat

MARC


LEADER	00000nmm a22000001c 4500
001	BV047285131
003	DE-604
005	20220316
007	cr\|uuu---uuuuu
008	210517s2021 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 9781800430853 \|c Online, pdf \|9 978-1-80043-085-3
020			\|a 9781800430877 \|c Epub \|9 978-1-80043-087-7
024	7		\|a 10.1108/9781800430853 \|2 doi
035			\|a (ZDB-55-BME)978-1-80043-085-3
035			\|a (OCoLC)1252707533
035			\|a (DE-599)BVBBV047285131
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-29 \|a DE-1046 \|a DE-1047 \|a DE-706 \|a DE-521 \|a DE-863 \|a DE-862 \|a DE-824 \|a DE-91 \|a DE-92
084			\|a QR 760 \|0 (DE-625)142080: \|2 rvk
084			\|a QC 344 \|0 (DE-625)141272: \|2 rvk
084			\|a ZG 8645 \|0 (DE-625)155995: \|2 rvk
084			\|a TEC 006 \|2 stub
084			\|a KOM 050 \|2 stub
100	1		\|a Weiss-Blatt, Nirit \|4 aut
245	1	0	\|a The techlash and tech crisis communication \|c Nirit Weiss-Blatt, University of Southern California, Los Angeles, CA, United States
250			\|a First edition
264		1	\|a United Kingdom ; North America ; Japan ; India ; Malaysia ; China ; Bingley, UK \|b Emerald Publishing \|c 2021
300			\|a 1 Online-Ressource (xxi, 185 Seiten) \|b Illustrationen, Diagramme
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
505	8		\|a THE PRE-TECHLASH ERA Section Chapter 1. Tech News and Tech Public Relations THE TECHLASH ERA Section Chapter 2. Big Tech -- Big Scandals Chapter 3. Tech Crisis Communication Chapter 4. Evolving Techlash Issues THE POST-TECHLASH ERA Section Chapter 5. Never-Ending Criticism?
650	0	7	\|a Technikbewertung \|0 (DE-588)4078176-8 \|2 gnd \|9 rswk-swf
650	0	7	\|a Informationstechnik \|0 (DE-588)4026926-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Technologieunternehmen \|0 (DE-588)7853364-8 \|2 gnd \|9 rswk-swf
653		0	\|a Communication of technical information
653		0	\|a Science journalism
653		0	\|a Communication of technical information
653		0	\|a Science journalism
653		6	\|a Electronic books
689	0	0	\|a Informationstechnik \|0 (DE-588)4026926-7 \|D s
689	0	1	\|a Technologieunternehmen \|0 (DE-588)7853364-8 \|D s
689	0	2	\|a Technikbewertung \|0 (DE-588)4078176-8 \|D s
689	0		\|5 DE-604
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-1-80043-086-0
856	4	0	\|u https://doi.org/10.1108/9781800430853 \|x Verlag \|z URL des Erstveröffentlichers \|3 Volltext
912			\|a ZDB-30-PQE \|a ZDB-55-BME \|a ZDB-55-ESS
940	1		\|q ZDB-55-BME21
999			\|a oai:aleph.bib-bvb.de:BVB01-032688601
966	e		\|u https://ebookcentral.proquest.com/lib/viadrina-ebooks/detail.action?docID=6518948 \|l EUV01 \|p ZDB-30-PQE \|q EUV_EK_EBC \|x Aggregator \|3 Volltext
966	e		\|u https://doi.org/10.1108/9781800430853 \|l FAW01 \|p ZDB-55-BME \|q BME-Paket \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1108/9781800430853 \|l FAW02 \|p ZDB-55-BME \|q BME-Paket \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1108/9781800430853 \|l FWS01 \|p ZDB-55-ESS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1108/9781800430853 \|l FWS02 \|p ZDB-55-ESS \|x Verlag \|3 Volltext
966	e		\|u https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=6518948 \|l TUM01 \|p ZDB-30-PQE \|q TUM_Einzelkauf \|x Aggregator \|3 Volltext
966	e		\|u https://doi.org/10.1108/9781800430853 \|l UBY01 \|p ZDB-55-BME \|q UBY_BMEPaket21 \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1108/9781800430853 \|l UEI01 \|p ZDB-55-BME \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1108/9781800430853 \|l UER01 \|p ZDB-55-BME \|q UER_Paketkauf_2021 \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1108/9781800430853 \|l FHN01 \|p ZDB-55-BME \|x Verlag \|3 Volltext

Datensatz im Suchindex

DE-BY-FWS_katkey	928302
_version_	1806194916601102336
adam_txt
any_adam_object
any_adam_object_boolean
author	Weiss-Blatt, Nirit
author_facet	Weiss-Blatt, Nirit
author_role	aut
author_sort	Weiss-Blatt, Nirit
author_variant	n w b nwb
building	Verbundindex
bvnumber	BV047285131
classification_rvk	QR 760 QC 344 ZG 8645
classification_tum	TEC 006 KOM 050
collection	ZDB-30-PQE ZDB-55-BME ZDB-55-ESS
contents	THE PRE-TECHLASH ERA Section Chapter 1. Tech News and Tech Public Relations THE TECHLASH ERA Section Chapter 2. Big Tech -- Big Scandals Chapter 3. Tech Crisis Communication Chapter 4. Evolving Techlash Issues THE POST-TECHLASH ERA Section Chapter 5. Never-Ending Criticism?
ctrlnum	(ZDB-55-BME)978-1-80043-085-3 (OCoLC)1252707533 (DE-599)BVBBV047285131
discipline	Technik Technik Kommunikationswesen Wirtschaftswissenschaften
discipline_str_mv	Technik Technik Kommunikationswesen Wirtschaftswissenschaften
doi_str_mv	10.1108/9781800430853
edition	First edition
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03616nmm a22006851c 4500</leader><controlfield tag="001">BV047285131</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220316 </controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">210517s2021 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781800430853</subfield><subfield code="c">Online, pdf</subfield><subfield code="9">978-1-80043-085-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781800430877</subfield><subfield code="c">Epub</subfield><subfield code="9">978-1-80043-087-7</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1108/9781800430853</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-55-BME)978-1-80043-085-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1252707533</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047285131</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1047</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-521</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-824</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">QR 760</subfield><subfield code="0">(DE-625)142080:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">QC 344</subfield><subfield code="0">(DE-625)141272:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZG 8645</subfield><subfield code="0">(DE-625)155995:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">TEC 006</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">KOM 050</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Weiss-Blatt, Nirit</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">The techlash and tech crisis communication</subfield><subfield code="c">Nirit Weiss-Blatt, University of Southern California, Los Angeles, CA, United States</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">First edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">United Kingdom ; North America ; Japan ; India ; Malaysia ; China ; Bingley, UK</subfield><subfield code="b">Emerald Publishing</subfield><subfield code="c">2021</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xxi, 185 Seiten)</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">THE PRE-TECHLASH ERA Section Chapter 1. Tech News and Tech Public Relations THE TECHLASH ERA Section Chapter 2. Big Tech -- Big Scandals Chapter 3. Tech Crisis Communication Chapter 4. Evolving Techlash Issues THE POST-TECHLASH ERA Section Chapter 5. Never-Ending Criticism?</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Technikbewertung</subfield><subfield code="0">(DE-588)4078176-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Informationstechnik</subfield><subfield code="0">(DE-588)4026926-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Technologieunternehmen</subfield><subfield code="0">(DE-588)7853364-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Communication of technical information</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Science journalism</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Communication of technical information</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Science journalism</subfield></datafield><datafield tag="653" ind1=" " ind2="6"><subfield code="a">Electronic books</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Informationstechnik</subfield><subfield code="0">(DE-588)4026926-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Technologieunternehmen</subfield><subfield code="0">(DE-588)7853364-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Technikbewertung</subfield><subfield code="0">(DE-588)4078176-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-1-80043-086-0</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PQE</subfield><subfield code="a">ZDB-55-BME</subfield><subfield code="a">ZDB-55-ESS</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-55-BME21</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032688601</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/viadrina-ebooks/detail.action?docID=6518948</subfield><subfield code="l">EUV01</subfield><subfield code="p">ZDB-30-PQE</subfield><subfield code="q">EUV_EK_EBC</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-55-BME</subfield><subfield code="q">BME-Paket</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="l">FAW02</subfield><subfield code="p">ZDB-55-BME</subfield><subfield code="q">BME-Paket</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-55-ESS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-55-ESS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=6518948</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-30-PQE</subfield><subfield code="q">TUM_Einzelkauf</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-55-BME</subfield><subfield code="q">UBY_BMEPaket21</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="l">UEI01</subfield><subfield code="p">ZDB-55-BME</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="l">UER01</subfield><subfield code="p">ZDB-55-BME</subfield><subfield code="q">UER_Paketkauf_2021</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1108/9781800430853</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-55-BME</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id	DE-604.BV047285131
illustrated	Not Illustrated
index_date	2024-07-03T17:18:17Z
indexdate	2024-08-01T16:15:02Z
institution	BVB
isbn	9781800430853 9781800430877
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-032688601
oclc_num	1252707533
open_access_boolean
owner	DE-29 DE-1046 DE-1047 DE-706 DE-521 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-824 DE-91 DE-BY-TUM DE-92
owner_facet	DE-29 DE-1046 DE-1047 DE-706 DE-521 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-824 DE-91 DE-BY-TUM DE-92
physical	1 Online-Ressource (xxi, 185 Seiten) Illustrationen, Diagramme
psigel	ZDB-30-PQE ZDB-55-BME ZDB-55-ESS ZDB-55-BME21 ZDB-30-PQE EUV_EK_EBC ZDB-55-BME BME-Paket ZDB-30-PQE TUM_Einzelkauf ZDB-55-BME UBY_BMEPaket21 ZDB-55-BME UER_Paketkauf_2021
publishDate	2021
publishDateSearch	2021
publishDateSort	2021
publisher	Emerald Publishing
record_format	marc
spellingShingle	Weiss-Blatt, Nirit The techlash and tech crisis communication THE PRE-TECHLASH ERA Section Chapter 1. Tech News and Tech Public Relations THE TECHLASH ERA Section Chapter 2. Big Tech -- Big Scandals Chapter 3. Tech Crisis Communication Chapter 4. Evolving Techlash Issues THE POST-TECHLASH ERA Section Chapter 5. Never-Ending Criticism? Technikbewertung (DE-588)4078176-8 gnd Informationstechnik (DE-588)4026926-7 gnd Technologieunternehmen (DE-588)7853364-8 gnd
subject_GND	(DE-588)4078176-8 (DE-588)4026926-7 (DE-588)7853364-8
title	The techlash and tech crisis communication
title_auth	The techlash and tech crisis communication
title_exact_search	The techlash and tech crisis communication
title_exact_search_txtP	The techlash and tech crisis communication
title_full	The techlash and tech crisis communication Nirit Weiss-Blatt, University of Southern California, Los Angeles, CA, United States
title_fullStr	The techlash and tech crisis communication Nirit Weiss-Blatt, University of Southern California, Los Angeles, CA, United States
title_full_unstemmed	The techlash and tech crisis communication Nirit Weiss-Blatt, University of Southern California, Los Angeles, CA, United States
title_short	The techlash and tech crisis communication
title_sort	the techlash and tech crisis communication
topic	Technikbewertung (DE-588)4078176-8 gnd Informationstechnik (DE-588)4026926-7 gnd Technologieunternehmen (DE-588)7853364-8 gnd
topic_facet	Technikbewertung Informationstechnik Technologieunternehmen
url	https://doi.org/10.1108/9781800430853
work_keys_str_mv	AT weissblattnirit thetechlashandtechcrisiscommunication

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