Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2021
Cham Springer |
| Ausgabe: | 1st ed. 2021 |
| Schlagworte: | |
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| Beschreibung: | 1 Online-Ressource (XXI, 164 p. 47 illus., 25 illus. in color) |
| ISBN: | 9783030692094 |
| DOI: | 10.1007/978-3-030-69209-4 |
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| discipline_str_mv | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/978-3-030-69209-4 |
| edition | 1st ed. 2021 |
| format | Electronic eBook |
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| indexdate | 2024-08-01T16:11:54Z |
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| language | English |
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| physical | 1 Online-Ressource (XXI, 164 p. 47 illus., 25 illus. in color) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2021_Fremddaten |
| publishDate | 2021 |
| publishDateSearch | 2021 |
| publishDateSort | 2021 |
| publisher | Springer International Publishing Springer |
| record_format | marc |
| spellingShingle | Huhn, Sebastian Drechsler, Rolf Design for Testability, Debug and Reliability Next Generation Measures Using Formal Techniques Circuits and Systems Processor Architectures Electronic circuits Microprocessors |
| title | Design for Testability, Debug and Reliability Next Generation Measures Using Formal Techniques |
| title_auth | Design for Testability, Debug and Reliability Next Generation Measures Using Formal Techniques |
| title_exact_search | Design for Testability, Debug and Reliability Next Generation Measures Using Formal Techniques |
| title_exact_search_txtP | Design for Testability, Debug and Reliability Next Generation Measures Using Formal Techniques |
| title_full | Design for Testability, Debug and Reliability Next Generation Measures Using Formal Techniques by Sebastian Huhn, Rolf Drechsler |
| title_fullStr | Design for Testability, Debug and Reliability Next Generation Measures Using Formal Techniques by Sebastian Huhn, Rolf Drechsler |
| title_full_unstemmed | Design for Testability, Debug and Reliability Next Generation Measures Using Formal Techniques by Sebastian Huhn, Rolf Drechsler |
| title_short | Design for Testability, Debug and Reliability |
| title_sort | design for testability debug and reliability next generation measures using formal techniques |
| title_sub | Next Generation Measures Using Formal Techniques |
| topic | Circuits and Systems Processor Architectures Electronic circuits Microprocessors |
| topic_facet | Circuits and Systems Processor Architectures Electronic circuits Microprocessors |
| url | https://doi.org/10.1007/978-3-030-69209-4 |
| work_keys_str_mv | AT huhnsebastian designfortestabilitydebugandreliabilitynextgenerationmeasuresusingformaltechniques AT drechslerrolf designfortestabilitydebugandreliabilitynextgenerationmeasuresusingformaltechniques |