Verfügbarkeit: An introduction to surface analysis by XPS and AES

An introduction to surface analysis by XPS and AES:

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Watts, John F. (VerfasserIn), Wolstenholme, John (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Hoboken Wiley 2020
Ausgabe:	Second edition
Schlagworte:	Elektronenspektroskopie Oberflächenanalyse Röntgen-Photoelektronenspektroskopie Auger-Spektroskopie Auger effect Photoelectron spectroscopy Electron spectroscopy Surfaces (Technology) / Analysis
Online-Zugang:	Volltext Cover
Beschreibung:	1 Online-Ressource (xviii, 267 Seiten) Illustrationen, Diagramme (teilweise farbig)
ISBN:	9781119417651 9781119417644 9781119417620

Internformat

MARC


LEADER	00000nmm a2200000 c 4500
001	BV047266326
003	DE-604
007	cr\|uuu---uuuuu
008	210503s2020 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 9781119417651 \|c Online \|9 978-1-119-41765-1
020			\|a 9781119417644 \|c epub \|9 978-1-119-41764-4
020			\|a 9781119417620 \|c adobe pdf \|9 978-1-119-41762-0
024	7		\|a 10.1002/9781119417651 \|2 doi
035			\|a (OCoLC)1249668244
035			\|a (DE-599)BVBBV047266326
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-11
050		0	\|a TP156.S95
082	0		\|a 620/.44
084			\|a UP 7500 \|0 (DE-625)146433: \|2 rvk
084			\|a UP 9000 \|0 (DE-625)146451: \|2 rvk
084			\|a VG 9700 \|0 (DE-625)147242:253 \|2 rvk
084			\|a UP 9330 \|0 (DE-625)146460: \|2 rvk
084			\|a VG 8700 \|0 (DE-625)147225:253 \|2 rvk
100	1		\|a Watts, John F. \|e Verfasser \|0 (DE-588)140940685 \|4 aut
245	1	0	\|a An introduction to surface analysis by XPS and AES \|c John F. Watts (University of Surrey, UK), John Wolstenholme (Crowborough, UK)
250			\|a Second edition
264		1	\|a Hoboken \|b Wiley \|c 2020
300			\|a 1 Online-Ressource (xviii, 267 Seiten) \|b Illustrationen, Diagramme (teilweise farbig)
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
650	0	7	\|a Elektronenspektroskopie \|0 (DE-588)4014332-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Oberflächenanalyse \|0 (DE-588)4172243-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Röntgen-Photoelektronenspektroskopie \|0 (DE-588)4076787-5 \|2 gnd \|9 rswk-swf
650	0	7	\|a Auger-Spektroskopie \|0 (DE-588)4122843-1 \|2 gnd \|9 rswk-swf
653		0	\|a Auger effect
653		0	\|a Photoelectron spectroscopy
653		0	\|a Electron spectroscopy
653		0	\|a Surfaces (Technology) / Analysis
689	0	0	\|a Oberflächenanalyse \|0 (DE-588)4172243-7 \|D s
689	0	1	\|a Auger-Spektroskopie \|0 (DE-588)4122843-1 \|D s
689	0		\|5 DE-604
689	1	0	\|a Oberflächenanalyse \|0 (DE-588)4172243-7 \|D s
689	1	1	\|a Röntgen-Photoelektronenspektroskopie \|0 (DE-588)4076787-5 \|D s
689	1		\|5 DE-604
689	2	0	\|a Oberflächenanalyse \|0 (DE-588)4172243-7 \|D s
689	2	1	\|a Elektronenspektroskopie \|0 (DE-588)4014332-6 \|D s
689	2		\|5 DE-604
700	1		\|a Wolstenholme, John \|e Verfasser \|4 aut
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-1-119-41758-3
856	4	0	\|u https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417651 \|x Verlag \|z URL des Erstveröffentlichers \|3 Volltext
856	4	2	\|m V:DE-576;X:WILEY \|q image/jpeg \|u http://swbplus.bsz-bw.de/bsz1679256211cov.htm \|v 20191024160408 \|3 Cover
912			\|a ZDB-35-UBC \|a ZDB-35-WIC
940	1		\|q FHR_PDA_WIC

Datensatz im Suchindex

_version_	1805069244762685440
adam_text
adam_txt
any_adam_object
any_adam_object_boolean
author	Watts, John F. Wolstenholme, John
author_GND	(DE-588)140940685
author_facet	Watts, John F. Wolstenholme, John
author_role	aut aut
author_sort	Watts, John F.
author_variant	j f w jf jfw j w jw
building	Verbundindex
bvnumber	BV047266326
callnumber-first	T - Technology
callnumber-label	TP156
callnumber-raw	TP156.S95
callnumber-search	TP156.S95
callnumber-sort	TP 3156 S95
callnumber-subject	TP - Chemical Technology
classification_rvk	UP 7500 UP 9000 VG 9700 UP 9330 VG 8700
collection	ZDB-35-UBC ZDB-35-WIC
ctrlnum	(OCoLC)1249668244 (DE-599)BVBBV047266326
dewey-full	620/.44
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	620 - Engineering and allied operations
dewey-raw	620/.44
dewey-search	620/.44
dewey-sort	3620 244
dewey-tens	620 - Engineering and allied operations
discipline	Chemie / Pharmazie Physik
discipline_str_mv	Chemie / Pharmazie Physik
edition	Second edition
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000 c 4500</leader><controlfield tag="001">BV047266326</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">210503s2020 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119417651</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-119-41765-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119417644</subfield><subfield code="c">epub</subfield><subfield code="9">978-1-119-41764-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119417620</subfield><subfield code="c">adobe pdf</subfield><subfield code="9">978-1-119-41762-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1002/9781119417651</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1249668244</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047266326</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TP156.S95</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620/.44</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7500</subfield><subfield code="0">(DE-625)146433:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 9000</subfield><subfield code="0">(DE-625)146451:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9700</subfield><subfield code="0">(DE-625)147242:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 9330</subfield><subfield code="0">(DE-625)146460:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 8700</subfield><subfield code="0">(DE-625)147225:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Watts, John F.</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)140940685</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">An introduction to surface analysis by XPS and AES</subfield><subfield code="c">John F. Watts (University of Surrey, UK), John Wolstenholme (Crowborough, UK)</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Second edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken</subfield><subfield code="b">Wiley</subfield><subfield code="c">2020</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xviii, 267 Seiten)</subfield><subfield code="b">Illustrationen, Diagramme (teilweise farbig)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenspektroskopie</subfield><subfield code="0">(DE-588)4014332-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgen-Photoelektronenspektroskopie</subfield><subfield code="0">(DE-588)4076787-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Auger-Spektroskopie</subfield><subfield code="0">(DE-588)4122843-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Auger effect</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Photoelectron spectroscopy</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Electron spectroscopy</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Surfaces (Technology) / Analysis</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Auger-Spektroskopie</subfield><subfield code="0">(DE-588)4122843-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Röntgen-Photoelektronenspektroskopie</subfield><subfield code="0">(DE-588)4076787-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Elektronenspektroskopie</subfield><subfield code="0">(DE-588)4014332-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wolstenholme, John</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-1-119-41758-3</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417651</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">V:DE-576;X:WILEY</subfield><subfield code="q">image/jpeg</subfield><subfield code="u">http://swbplus.bsz-bw.de/bsz1679256211cov.htm</subfield><subfield code="v">20191024160408</subfield><subfield code="3">Cover</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-UBC</subfield><subfield code="a">ZDB-35-WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FHR_PDA_WIC</subfield></datafield></record></collection>
id	DE-604.BV047266326
illustrated	Not Illustrated
index_date	2024-07-03T17:12:44Z
indexdate	2024-07-20T04:02:57Z
institution	BVB
isbn	9781119417651 9781119417644 9781119417620
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-032670087
oclc_num	1249668244
open_access_boolean
owner	DE-11
owner_facet	DE-11
physical	1 Online-Ressource (xviii, 267 Seiten) Illustrationen, Diagramme (teilweise farbig)
psigel	ZDB-35-UBC ZDB-35-WIC FHR_PDA_WIC
publishDate	2020
publishDateSearch	2020
publishDateSort	2020
publisher	Wiley
record_format	marc
spelling	Watts, John F. Verfasser (DE-588)140940685 aut An introduction to surface analysis by XPS and AES John F. Watts (University of Surrey, UK), John Wolstenholme (Crowborough, UK) Second edition Hoboken Wiley 2020 1 Online-Ressource (xviii, 267 Seiten) Illustrationen, Diagramme (teilweise farbig) txt rdacontent c rdamedia cr rdacarrier Elektronenspektroskopie (DE-588)4014332-6 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd rswk-swf Auger-Spektroskopie (DE-588)4122843-1 gnd rswk-swf Auger effect Photoelectron spectroscopy Electron spectroscopy Surfaces (Technology) / Analysis Oberflächenanalyse (DE-588)4172243-7 s Auger-Spektroskopie (DE-588)4122843-1 s DE-604 Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 s Elektronenspektroskopie (DE-588)4014332-6 s Wolstenholme, John Verfasser aut Erscheint auch als Druck-Ausgabe 978-1-119-41758-3 https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417651 Verlag URL des Erstveröffentlichers Volltext V:DE-576;X:WILEY image/jpeg http://swbplus.bsz-bw.de/bsz1679256211cov.htm 20191024160408 Cover
spellingShingle	Watts, John F. Wolstenholme, John An introduction to surface analysis by XPS and AES Elektronenspektroskopie (DE-588)4014332-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd
subject_GND	(DE-588)4014332-6 (DE-588)4172243-7 (DE-588)4076787-5 (DE-588)4122843-1
title	An introduction to surface analysis by XPS and AES
title_auth	An introduction to surface analysis by XPS and AES
title_exact_search	An introduction to surface analysis by XPS and AES
title_exact_search_txtP	An introduction to surface analysis by XPS and AES
title_full	An introduction to surface analysis by XPS and AES John F. Watts (University of Surrey, UK), John Wolstenholme (Crowborough, UK)
title_fullStr	An introduction to surface analysis by XPS and AES John F. Watts (University of Surrey, UK), John Wolstenholme (Crowborough, UK)
title_full_unstemmed	An introduction to surface analysis by XPS and AES John F. Watts (University of Surrey, UK), John Wolstenholme (Crowborough, UK)
title_short	An introduction to surface analysis by XPS and AES
title_sort	an introduction to surface analysis by xps and aes
topic	Elektronenspektroskopie (DE-588)4014332-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd
topic_facet	Elektronenspektroskopie Oberflächenanalyse Röntgen-Photoelektronenspektroskopie Auger-Spektroskopie
url	https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417651 http://swbplus.bsz-bw.de/bsz1679256211cov.htm
work_keys_str_mv	AT wattsjohnf anintroductiontosurfaceanalysisbyxpsandaes AT wolstenholmejohn anintroductiontosurfaceanalysisbyxpsandaes

Verfügbarkeit

Es ist kein Print-Exemplar vorhanden.

Fernleihe Bestellen Achtung: Nicht im THWS-Bestand! Volltext öffnen

MARC

Datensatz im Suchindex

Es ist kein Print-Exemplar vorhanden.

Ähnliche Einträge