Pipelined analog to digital converter and fault diagnosis:
Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, the...
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Bristol, UK
IOP Publishing
[2020]
|
| Ausgabe: | Version: 20200301 |
| Schriftenreihe: | IOP ebooks
|
| Schlagworte: | |
| Online-Zugang: | UBR01 URL des Erstveröffentlichers Volltext |
| Zusammenfassung: | Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering |
| Beschreibung: | 1 Online-Ressource (xv, 1-33, 2-15, 3-32, 4-39, 5-47 Seiten) Illustrationen |
| Format: | Mode of access: World Wide Web System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader |
| ISBN: | 9780750317320 |
| DOI: | 10.1088/978-0-7503-1732-0 |
Internformat
MARC
| LEADER | 00000nmm a22000001c 4500 | ||
|---|---|---|---|
| 001 | BV047209447 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 210323s2020 |||| o||u| ||||||eng d | ||
| 020 | |a 9780750317320 |c ebook |9 978-0-7503-1732-0 | ||
| 024 | 7 | |a 10.1088/978-0-7503-1732-0 |2 doi | |
| 035 | |a (OCoLC)1245337363 | ||
| 035 | |a (DE-599)KEP055678548 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-355 | ||
| 082 | 0 | |a 621.3815/9 |2 23 | |
| 084 | |a ZN 5660 |0 (DE-625)157474: |2 rvk | ||
| 245 | 1 | 0 | |a Pipelined analog to digital converter and fault diagnosis |c edited by Alok Barua (Indian Institute of Technology, Kharagpur, India) |
| 250 | |a Version: 20200301 | ||
| 264 | 1 | |a Bristol, UK |b IOP Publishing |c [2020] | |
| 264 | 4 | |c © 2020 | |
| 300 | |a 1 Online-Ressource (xv, 1-33, 2-15, 3-32, 4-39, 5-47 Seiten) |b Illustrationen | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a IOP ebooks | |
| 520 | 3 | |a Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering | |
| 538 | |a Mode of access: World Wide Web | ||
| 538 | |a System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader | ||
| 653 | 0 | |a Analog-to-digital converters | |
| 653 | 0 | |a Analog-to-digital converters ; Testing | |
| 653 | 0 | |a Circuits & components ; bicssc | |
| 653 | 0 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI ; bisacsh | |
| 700 | 1 | |a Barua, Alok |4 edt | |
| 710 | 2 | |a Institute of Physics (Great Britain) |4 pbl | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-0-7503-1730-6 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-0-7503-1768-9 |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, MOBI |z 978-0-7503-1731-3 |
| 856 | 4 | 0 | |u https://doi.org/10.1088/978-0-7503-1732-0 |x Verlag |z URL des Erstveröffentlichers |
| 856 | 4 | 0 | |m X:IOP |u https://iopscience.iop.org/book/978-0-7503-1732-0 |x Verlag |3 Volltext |
| 912 | |a ZDB-135-IAL |a ZDB-135-IAL | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-032614279 | ||
| 966 | e | |u https://iopscience.iop.org/book/978-0-7503-1732-0 |l UBR01 |p ZDB-135-IAL |q UBR Paketkauf 2019 |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804182322482774016 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author2 | Barua, Alok |
| author2_role | edt |
| author2_variant | a b ab |
| author_facet | Barua, Alok |
| building | Verbundindex |
| bvnumber | BV047209447 |
| classification_rvk | ZN 5660 |
| collection | ZDB-135-IAL |
| ctrlnum | (OCoLC)1245337363 (DE-599)KEP055678548 |
| dewey-full | 621.3815/9 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/9 |
| dewey-search | 621.3815/9 |
| dewey-sort | 3621.3815 19 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1088/978-0-7503-1732-0 |
| edition | Version: 20200301 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03342nmm a22005051c 4500</leader><controlfield tag="001">BV047209447</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">210323s2020 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780750317320</subfield><subfield code="c">ebook</subfield><subfield code="9">978-0-7503-1732-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1088/978-0-7503-1732-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1245337363</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)KEP055678548</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/9</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 5660</subfield><subfield code="0">(DE-625)157474:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Pipelined analog to digital converter and fault diagnosis</subfield><subfield code="c">edited by Alok Barua (Indian Institute of Technology, Kharagpur, India)</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Version: 20200301</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bristol, UK</subfield><subfield code="b">IOP Publishing</subfield><subfield code="c">[2020]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2020</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xv, 1-33, 2-15, 3-32, 4-39, 5-47 Seiten)</subfield><subfield code="b">Illustrationen</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">IOP ebooks</subfield></datafield><datafield tag="520" ind1="3" ind2=" "><subfield code="a">Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering</subfield></datafield><datafield tag="538" ind1=" " ind2=" "><subfield code="a">Mode of access: World Wide Web</subfield></datafield><datafield tag="538" ind1=" " ind2=" "><subfield code="a">System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Analog-to-digital converters</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Analog-to-digital converters ; Testing</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Circuits & components ; bicssc</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI ; bisacsh</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Barua, Alok</subfield><subfield code="4">edt</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Physics (Great Britain)</subfield><subfield code="4">pbl</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-0-7503-1730-6</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-0-7503-1768-9</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe, MOBI</subfield><subfield code="z">978-0-7503-1731-3</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1088/978-0-7503-1732-0</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="m">X:IOP</subfield><subfield code="u">https://iopscience.iop.org/book/978-0-7503-1732-0</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-135-IAL</subfield><subfield code="a">ZDB-135-IAL</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032614279</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://iopscience.iop.org/book/978-0-7503-1732-0</subfield><subfield code="l">UBR01</subfield><subfield code="p">ZDB-135-IAL</subfield><subfield code="q">UBR Paketkauf 2019</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV047209447 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T16:53:51Z |
| indexdate | 2024-07-10T09:05:42Z |
| institution | BVB |
| isbn | 9780750317320 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032614279 |
| oclc_num | 1245337363 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR |
| owner_facet | DE-355 DE-BY-UBR |
| physical | 1 Online-Ressource (xv, 1-33, 2-15, 3-32, 4-39, 5-47 Seiten) Illustrationen |
| psigel | ZDB-135-IAL ZDB-135-IAL UBR Paketkauf 2019 |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | IOP Publishing |
| record_format | marc |
| series2 | IOP ebooks |
| spelling | Pipelined analog to digital converter and fault diagnosis edited by Alok Barua (Indian Institute of Technology, Kharagpur, India) Version: 20200301 Bristol, UK IOP Publishing [2020] © 2020 1 Online-Ressource (xv, 1-33, 2-15, 3-32, 4-39, 5-47 Seiten) Illustrationen txt rdacontent c rdamedia cr rdacarrier IOP ebooks Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering Mode of access: World Wide Web System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader Analog-to-digital converters Analog-to-digital converters ; Testing Circuits & components ; bicssc TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI ; bisacsh Barua, Alok edt Institute of Physics (Great Britain) pbl Erscheint auch als Druck-Ausgabe 978-0-7503-1730-6 Erscheint auch als Druck-Ausgabe 978-0-7503-1768-9 Erscheint auch als Online-Ausgabe, MOBI 978-0-7503-1731-3 https://doi.org/10.1088/978-0-7503-1732-0 Verlag URL des Erstveröffentlichers X:IOP https://iopscience.iop.org/book/978-0-7503-1732-0 Verlag Volltext |
| spellingShingle | Pipelined analog to digital converter and fault diagnosis |
| title | Pipelined analog to digital converter and fault diagnosis |
| title_auth | Pipelined analog to digital converter and fault diagnosis |
| title_exact_search | Pipelined analog to digital converter and fault diagnosis |
| title_exact_search_txtP | Pipelined analog to digital converter and fault diagnosis |
| title_full | Pipelined analog to digital converter and fault diagnosis edited by Alok Barua (Indian Institute of Technology, Kharagpur, India) |
| title_fullStr | Pipelined analog to digital converter and fault diagnosis edited by Alok Barua (Indian Institute of Technology, Kharagpur, India) |
| title_full_unstemmed | Pipelined analog to digital converter and fault diagnosis edited by Alok Barua (Indian Institute of Technology, Kharagpur, India) |
| title_short | Pipelined analog to digital converter and fault diagnosis |
| title_sort | pipelined analog to digital converter and fault diagnosis |
| url | https://doi.org/10.1088/978-0-7503-1732-0 https://iopscience.iop.org/book/978-0-7503-1732-0 |
| work_keys_str_mv | AT baruaalok pipelinedanalogtodigitalconverterandfaultdiagnosis AT instituteofphysicsgreatbritain pipelinedanalogtodigitalconverterandfaultdiagnosis |