Practical materials characterization:
X-ray diffraction and reflectivity / Mauro R. Sardela Jr. -- Introduction to optical characterization of materials / Julio A.N.T. Soares -- X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) / Richard T. Haasch -- Secondary ion mass spectrometry / Judith E. Baker -- Transmi...
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York ; Heidelberg ; Dordrecht
Springer
[2014]
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis Autorenbiografie Verlagsangaben |
| Zusammenfassung: | X-ray diffraction and reflectivity / Mauro R. Sardela Jr. -- Introduction to optical characterization of materials / Julio A.N.T. Soares -- X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) / Richard T. Haasch -- Secondary ion mass spectrometry / Judith E. Baker -- Transmission electron microscopy / Jian Guo Wen |
| Beschreibung: | Literaturangaben und Index |
| Beschreibung: | VII, 237 Seiten Illustrationen |
| ISBN: | 9781461492801 |
Internformat
MARC
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| 520 | 3 | |a X-ray diffraction and reflectivity / Mauro R. Sardela Jr. -- Introduction to optical characterization of materials / Julio A.N.T. Soares -- X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) / Richard T. Haasch -- Secondary ion mass spectrometry / Judith E. Baker -- Transmission electron microscopy / Jian Guo Wen | |
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| dewey-raw | 620.1/127 |
| dewey-search | 620.1/127 |
| dewey-sort | 3620.1 3127 |
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| discipline | Physik |
| discipline_str_mv | Physik |
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| id | DE-604.BV047190473 |
| illustrated | Illustrated |
| index_date | 2024-07-03T16:47:42Z |
| indexdate | 2024-07-10T09:05:10Z |
| institution | BVB |
| isbn | 9781461492801 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032595677 |
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| physical | VII, 237 Seiten Illustrationen |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| publisher | Springer |
| record_format | marc |
| spelling | Practical materials characterization Mauro Sardela New York ; Heidelberg ; Dordrecht Springer [2014] VII, 237 Seiten Illustrationen txt rdacontent n rdamedia nc rdacarrier Literaturangaben und Index X-ray diffraction and reflectivity / Mauro R. Sardela Jr. -- Introduction to optical characterization of materials / Julio A.N.T. Soares -- X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) / Richard T. Haasch -- Secondary ion mass spectrometry / Judith E. Baker -- Transmission electron microscopy / Jian Guo Wen Spektrometer (DE-588)4140820-2 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Materials / Testing Materials / Analysis Werkstoffprüfung (DE-588)4037934-6 s Spektroskopie (DE-588)4056138-0 s Spektrometer (DE-588)4140820-2 s DE-604 Sardela, Mauro edt Erscheint auch als Online-Ausgabe 978-1-4614-9281-8 B:DE-89 V:DE-601 pdf/application http://www.gbv.de/dms/tib-ub-hannover/79407720x.pdf 2016-02-22 Verlag Inhaltsverzeichnis Inhaltsverzeichnis https://www.loc.gov/catdir/enhancements/fy1622/2014941610-b.html 2017-01-03 Verlag Autorenbiografie https://www.loc.gov/catdir/enhancements/fy1622/2014941610-d.html 2017-01-03 Verlag Verlagsangaben |
| spellingShingle | Practical materials characterization Spektrometer (DE-588)4140820-2 gnd Spektroskopie (DE-588)4056138-0 gnd Werkstoffprüfung (DE-588)4037934-6 gnd |
| subject_GND | (DE-588)4140820-2 (DE-588)4056138-0 (DE-588)4037934-6 |
| title | Practical materials characterization |
| title_auth | Practical materials characterization |
| title_exact_search | Practical materials characterization |
| title_exact_search_txtP | Practical materials characterization |
| title_full | Practical materials characterization Mauro Sardela |
| title_fullStr | Practical materials characterization Mauro Sardela |
| title_full_unstemmed | Practical materials characterization Mauro Sardela |
| title_short | Practical materials characterization |
| title_sort | practical materials characterization |
| topic | Spektrometer (DE-588)4140820-2 gnd Spektroskopie (DE-588)4056138-0 gnd Werkstoffprüfung (DE-588)4037934-6 gnd |
| topic_facet | Spektrometer Spektroskopie Werkstoffprüfung |
| url | http://www.gbv.de/dms/tib-ub-hannover/79407720x.pdf https://www.loc.gov/catdir/enhancements/fy1622/2014941610-b.html https://www.loc.gov/catdir/enhancements/fy1622/2014941610-d.html |
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