Electrical atomic force microscopy for nanoelectronics:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2019]
|
| Schriftenreihe: | NanoScience and Technology
|
| Schlagworte: | |
| Beschreibung: | XX, 408 pages illustrations |
| ISBN: | 9783030156145 |
| ISSN: | 1434-4904 |
Internformat
MARC
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| 001 | BV047136840 | ||
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| 020 | |a 9783030156145 |c softcover |9 9783030156145 | ||
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| 245 | 1 | 0 | |a Electrical atomic force microscopy for nanoelectronics |c Umberto Celano, editor |
| 264 | 1 | |a Cham |b Springer |c [2019] | |
| 300 | |a XX, 408 pages |b illustrations | ||
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| 337 | |b n |2 rdamedia | ||
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| 490 | 0 | |a NanoScience and Technology |x 1434-4904 | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
| 650 | 4 | |a Optical and Electronic Materials | |
| 650 | 4 | |a Nanoscale Science and Technology | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Electronics | |
| 650 | 4 | |a Optical materials | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 0 | 7 | |a Nanoelektronik |0 (DE-588)4732034-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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| building | Verbundindex |
| bvnumber | BV047136840 |
| ctrlnum | (OCoLC)1122805201 (DE-599)BVBBV047136840 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV047136840 |
| illustrated | Illustrated |
| index_date | 2024-07-03T16:34:17Z |
| indexdate | 2024-07-10T09:03:40Z |
| institution | BVB |
| isbn | 9783030156145 |
| issn | 1434-4904 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032542847 |
| oclc_num | 1122805201 |
| open_access_boolean | |
| owner | DE-29T DE-83 |
| owner_facet | DE-29T DE-83 |
| physical | XX, 408 pages illustrations |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | Springer |
| record_format | marc |
| series2 | NanoScience and Technology |
| spelling | Electrical atomic force microscopy for nanoelectronics Umberto Celano, editor Cham Springer [2019] XX, 408 pages illustrations txt rdacontent n rdamedia nc rdacarrier NanoScience and Technology 1434-4904 Spectroscopy and Microscopy Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Nanoscale Science and Technology Nanotechnology Surfaces (Physics) Electronics Optical materials Nanoelektronik (DE-588)4732034-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s Nanoelektronik (DE-588)4732034-5 s DE-604 Celano, Umberto edt Erscheint auch als Druck-Ausgabe, Hardcover 978-3-030-15611-4 Erscheint auch als Online-Ausgabe 978-3-030-15612-1 |
| spellingShingle | Electrical atomic force microscopy for nanoelectronics Spectroscopy and Microscopy Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Nanoscale Science and Technology Nanotechnology Surfaces (Physics) Electronics Optical materials Nanoelektronik (DE-588)4732034-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4732034-5 (DE-588)4274473-8 |
| title | Electrical atomic force microscopy for nanoelectronics |
| title_auth | Electrical atomic force microscopy for nanoelectronics |
| title_exact_search | Electrical atomic force microscopy for nanoelectronics |
| title_exact_search_txtP | Electrical atomic force microscopy for nanoelectronics |
| title_full | Electrical atomic force microscopy for nanoelectronics Umberto Celano, editor |
| title_fullStr | Electrical atomic force microscopy for nanoelectronics Umberto Celano, editor |
| title_full_unstemmed | Electrical atomic force microscopy for nanoelectronics Umberto Celano, editor |
| title_short | Electrical atomic force microscopy for nanoelectronics |
| title_sort | electrical atomic force microscopy for nanoelectronics |
| topic | Spectroscopy and Microscopy Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Nanoscale Science and Technology Nanotechnology Surfaces (Physics) Electronics Optical materials Nanoelektronik (DE-588)4732034-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Spectroscopy and Microscopy Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Nanoscale Science and Technology Nanotechnology Surfaces (Physics) Electronics Optical materials Nanoelektronik Rasterkraftmikroskopie |
| work_keys_str_mv | AT celanoumberto electricalatomicforcemicroscopyfornanoelectronics |