Secondary electron energy spectroscopy in the scanning electron microscope:
"This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpos...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
World Scientific
2020
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | "This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions"--Publisher's website |
| Beschreibung: | 1 Online-Ressource (xv, 327 Seiten) |
| ISBN: | 9789811227035 |
Internformat
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| 520 | |a "This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions"--Publisher's website | ||
| 650 | 4 | |a Scanning electron microscopes / Design and construction | |
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| 650 | 4 | |a Electrons / Scattering | |
| 650 | 4 | |a Photoelectron spectroscopy | |
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Datensatz im Suchindex
| _version_ | 1804182171247706112 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Khursheed, Anjam |
| author_facet | Khursheed, Anjam |
| author_role | aut |
| author_sort | Khursheed, Anjam |
| author_variant | a k ak |
| building | Verbundindex |
| bvnumber | BV047124441 |
| collection | ZDB-124-WOP |
| ctrlnum | (ZDB-124-WOP)00012010 (OCoLC)1237587798 (DE-599)BVBBV047124441 |
| dewey-full | 681.413 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 681 - Precision instruments and other devices |
| dewey-raw | 681.413 |
| dewey-search | 681.413 |
| dewey-sort | 3681.413 |
| dewey-tens | 680 - Manufacture of products for specific uses |
| discipline | Handwerk und Gewerbe / Verschiedene Technologien |
| discipline_str_mv | Handwerk und Gewerbe / Verschiedene Technologien |
| format | Electronic eBook |
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| id | DE-604.BV047124441 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T16:30:25Z |
| indexdate | 2024-07-10T09:03:18Z |
| institution | BVB |
| isbn | 9789811227035 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032530681 |
| oclc_num | 1237587798 |
| open_access_boolean | |
| physical | 1 Online-Ressource (xv, 327 Seiten) |
| psigel | ZDB-124-WOP |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | World Scientific |
| record_format | marc |
| spelling | Khursheed, Anjam Verfasser aut Secondary electron energy spectroscopy in the scanning electron microscope by Anjam Khursheed Singapore World Scientific 2020 1 Online-Ressource (xv, 327 Seiten) txt rdacontent c rdamedia cr rdacarrier "This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions"--Publisher's website Scanning electron microscopes / Design and construction Electron spectroscopy Electrons / Scattering Photoelectron spectroscopy https://www.worldscientific.com/worldscibooks/10.1142/12010#t=toc Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Khursheed, Anjam Secondary electron energy spectroscopy in the scanning electron microscope Scanning electron microscopes / Design and construction Electron spectroscopy Electrons / Scattering Photoelectron spectroscopy |
| title | Secondary electron energy spectroscopy in the scanning electron microscope |
| title_auth | Secondary electron energy spectroscopy in the scanning electron microscope |
| title_exact_search | Secondary electron energy spectroscopy in the scanning electron microscope |
| title_exact_search_txtP | Secondary electron energy spectroscopy in the scanning electron microscope |
| title_full | Secondary electron energy spectroscopy in the scanning electron microscope by Anjam Khursheed |
| title_fullStr | Secondary electron energy spectroscopy in the scanning electron microscope by Anjam Khursheed |
| title_full_unstemmed | Secondary electron energy spectroscopy in the scanning electron microscope by Anjam Khursheed |
| title_short | Secondary electron energy spectroscopy in the scanning electron microscope |
| title_sort | secondary electron energy spectroscopy in the scanning electron microscope |
| topic | Scanning electron microscopes / Design and construction Electron spectroscopy Electrons / Scattering Photoelectron spectroscopy |
| topic_facet | Scanning electron microscopes / Design and construction Electron spectroscopy Electrons / Scattering Photoelectron spectroscopy |
| url | https://www.worldscientific.com/worldscibooks/10.1142/12010#t=toc |
| work_keys_str_mv | AT khursheedanjam secondaryelectronenergyspectroscopyinthescanningelectronmicroscope |