Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2021
Cham Springer |
| Ausgabe: | 1st ed. 2021 |
| Schlagworte: | |
| Online-Zugang: | BTU01 FAB01 FAW01 FCO01 FHA01 FHD01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 UER01 Volltext |
| Beschreibung: | 1 Online-Ressource (XIII, 114 p. 39 illus., 9 illus. in color) |
| ISBN: | 9783030516109 |
| DOI: | 10.1007/978-3-030-51610-9 |
Internformat
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Datensatz im Suchindex
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| discipline_str_mv | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/978-3-030-51610-9 |
| edition | 1st ed. 2021 |
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| illustrated | Not Illustrated |
| index_date | 2024-07-03T15:48:18Z |
| indexdate | 2024-08-01T15:49:55Z |
| institution | BVB |
| isbn | 9783030516109 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032383208 |
| oclc_num | 1220887523 |
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| owner | DE-859 DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 DE-29 DE-858 |
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| physical | 1 Online-Ressource (XIII, 114 p. 39 illus., 9 illus. in color) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2021_Fremddaten |
| publishDate | 2021 |
| publishDateSearch | 2021 |
| publishDateSort | 2021 |
| publisher | Springer International Publishing Springer |
| record_format | marc |
| spellingShingle | Ghavami, Behnam Raji, Mohsen Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques Circuits and Systems Electronics and Microelectronics, Instrumentation Cyber-physical systems, IoT. Electronic circuits Electronics Microelectronics Computer engineering Internet of things Embedded computer systems |
| title | Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques |
| title_auth | Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques |
| title_exact_search | Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques |
| title_exact_search_txtP | Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques |
| title_full | Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques by Behnam Ghavami, Mohsen Raji |
| title_fullStr | Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques by Behnam Ghavami, Mohsen Raji |
| title_full_unstemmed | Soft Error Reliability of VLSI Circuits Analysis and Mitigation Techniques by Behnam Ghavami, Mohsen Raji |
| title_short | Soft Error Reliability of VLSI Circuits |
| title_sort | soft error reliability of vlsi circuits analysis and mitigation techniques |
| title_sub | Analysis and Mitigation Techniques |
| topic | Circuits and Systems Electronics and Microelectronics, Instrumentation Cyber-physical systems, IoT. Electronic circuits Electronics Microelectronics Computer engineering Internet of things Embedded computer systems |
| topic_facet | Circuits and Systems Electronics and Microelectronics, Instrumentation Cyber-physical systems, IoT. Electronic circuits Electronics Microelectronics Computer engineering Internet of things Embedded computer systems |
| url | https://doi.org/10.1007/978-3-030-51610-9 |
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