Introduction to statistics in metrology:
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cham, Switzerland
Springer
[2020]
|
| Schlagworte: | |
| Beschreibung: | This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on the characterization of measurement system and the quantification of measurement uncertainty. It covers everything from fundamentals to special topics, each illustrated with case studies from the authors' work in the National Security Enterprise (NSE). The resulting work provides readers with a solid understanding of how to apply the covered techniques to metrology in a wide variety of contexts.The methodologies presented are supported with R script when appropriate, and the code has been made available to readers for use in their own applications. The volume also offers particular attention to design of experiments (DOEx), and addresses special topics such as statistical process control (SPC) in metrology, assessment of binary measurement systems, uncertainty quantification for "one-shot" devices, and new material on sample size selection in metrology studies. Designed to promote the collaboration between statistics and metrology, this book will be of use to practitioners using measurement science, researchers, and advanced undergraduate and graduate students in statistics and engineering disciplines 1. Introduction.- 2. Basic Concepts.- 3. The International System of Units (SI), Traceability, and Calibration.- 4. Introduction to Statistics and Probability.- 5. Measurement Uncertainty in Decision Making.- 6. The Measurement Model and Uncertainty.- 7. Analytical Methods for the Propagation of Uncertainties.- 8. Monte Carlo Methods for the Propagation of Uncertainties.- 9. Determining Uncertainties in Fitted Curves.- 10. Design of Experiments in Metrology.- 11. Special Topics in Metrology.- 12. Summary and Acknowledgments. |
| Beschreibung: | xxi, 347 Seiten Illustrationen, Diagramme 235 mm |
| ISBN: | 9783030533281 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV046964172 | ||
| 003 | DE-604 | ||
| 005 | 20210119 | ||
| 007 | t | ||
| 008 | 201027s2020 a||| |||| 00||| eng d | ||
| 020 | |a 9783030533281 |c hbk |9 978-3-030-53328-1 | ||
| 024 | 3 | |a 9783030533281 | |
| 035 | |a (OCoLC)1232509356 | ||
| 035 | |a (DE-599)BVBBV046964172 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 100 | 1 | |a Crowder, Stephen |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Introduction to statistics in metrology |c Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin |
| 264 | 1 | |a Cham, Switzerland |b Springer |c [2020] | |
| 300 | |a xxi, 347 Seiten |b Illustrationen, Diagramme |c 235 mm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on the characterization of measurement system and the quantification of measurement uncertainty. It covers everything from fundamentals to special topics, each illustrated with case studies from the authors' work in the National Security Enterprise (NSE). The resulting work provides readers with a solid understanding of how to apply the covered techniques to metrology in a wide variety of contexts.The methodologies presented are supported with R script when appropriate, and the code has been made available to readers for use in their own applications. The volume also offers particular attention to design of experiments (DOEx), and addresses special topics such as statistical process control (SPC) in metrology, assessment of binary measurement systems, uncertainty quantification for "one-shot" devices, and new material on sample size selection in metrology studies. Designed to promote the collaboration between statistics and metrology, this book will be of use to practitioners using measurement science, researchers, and advanced undergraduate and graduate students in statistics and engineering disciplines | ||
| 500 | |a 1. Introduction.- 2. Basic Concepts.- 3. The International System of Units (SI), Traceability, and Calibration.- 4. Introduction to Statistics and Probability.- 5. Measurement Uncertainty in Decision Making.- 6. The Measurement Model and Uncertainty.- 7. Analytical Methods for the Propagation of Uncertainties.- 8. Monte Carlo Methods for the Propagation of Uncertainties.- 9. Determining Uncertainties in Fitted Curves.- 10. Design of Experiments in Metrology.- 11. Special Topics in Metrology.- 12. Summary and Acknowledgments. | ||
| 650 | 4 | |a Statistics | |
| 650 | 4 | |a Physical measurements | |
| 650 | 4 | |a Measurement | |
| 650 | 4 | |a Statistics | |
| 650 | 4 | |a Electrical engineering | |
| 650 | 4 | |a Mechanical engineering | |
| 650 | 4 | |a Statistics | |
| 653 | |a Hardcover, Softcover / Naturwissenschaften allgemein | ||
| 700 | 1 | |a Delker, Collin |e Verfasser |4 aut | |
| 700 | 1 | |a Forrest, Eric |e Verfasser |4 aut | |
| 700 | 1 | |a Martin, Nevin |e Verfasser |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-030-53329-8 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-032372473 | ||
Datensatz im Suchindex
| _version_ | 1804181885097607168 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Crowder, Stephen Delker, Collin Forrest, Eric Martin, Nevin |
| author_facet | Crowder, Stephen Delker, Collin Forrest, Eric Martin, Nevin |
| author_role | aut aut aut aut |
| author_sort | Crowder, Stephen |
| author_variant | s c sc c d cd e f ef n m nm |
| building | Verbundindex |
| bvnumber | BV046964172 |
| ctrlnum | (OCoLC)1232509356 (DE-599)BVBBV046964172 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03137nam a2200433 c 4500</leader><controlfield tag="001">BV046964172</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20210119 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">201027s2020 a||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783030533281</subfield><subfield code="c">hbk</subfield><subfield code="9">978-3-030-53328-1</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9783030533281</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1232509356</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046964172</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Crowder, Stephen</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Introduction to statistics in metrology</subfield><subfield code="c">Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham, Switzerland</subfield><subfield code="b">Springer</subfield><subfield code="c">[2020]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxi, 347 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield><subfield code="c">235 mm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on the characterization of measurement system and the quantification of measurement uncertainty. It covers everything from fundamentals to special topics, each illustrated with case studies from the authors' work in the National Security Enterprise (NSE). The resulting work provides readers with a solid understanding of how to apply the covered techniques to metrology in a wide variety of contexts.The methodologies presented are supported with R script when appropriate, and the code has been made available to readers for use in their own applications. The volume also offers particular attention to design of experiments (DOEx), and addresses special topics such as statistical process control (SPC) in metrology, assessment of binary measurement systems, uncertainty quantification for "one-shot" devices, and new material on sample size selection in metrology studies. Designed to promote the collaboration between statistics and metrology, this book will be of use to practitioners using measurement science, researchers, and advanced undergraduate and graduate students in statistics and engineering disciplines</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">1. Introduction.- 2. Basic Concepts.- 3. The International System of Units (SI), Traceability, and Calibration.- 4. Introduction to Statistics and Probability.- 5. Measurement Uncertainty in Decision Making.- 6. The Measurement Model and Uncertainty.- 7. Analytical Methods for the Propagation of Uncertainties.- 8. Monte Carlo Methods for the Propagation of Uncertainties.- 9. Determining Uncertainties in Fitted Curves.- 10. Design of Experiments in Metrology.- 11. Special Topics in Metrology.- 12. Summary and Acknowledgments.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Statistics </subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical measurements</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement </subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Statistics </subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mechanical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Statistics</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Hardcover, Softcover / Naturwissenschaften allgemein</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Delker, Collin</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Forrest, Eric</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Martin, Nevin</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-3-030-53329-8</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032372473</subfield></datafield></record></collection> |
| id | DE-604.BV046964172 |
| illustrated | Illustrated |
| index_date | 2024-07-03T15:44:56Z |
| indexdate | 2024-07-10T08:58:45Z |
| institution | BVB |
| isbn | 9783030533281 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032372473 |
| oclc_num | 1232509356 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | xxi, 347 Seiten Illustrationen, Diagramme 235 mm |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Springer |
| record_format | marc |
| spelling | Crowder, Stephen Verfasser aut Introduction to statistics in metrology Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin Cham, Switzerland Springer [2020] xxi, 347 Seiten Illustrationen, Diagramme 235 mm txt rdacontent n rdamedia nc rdacarrier This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on the characterization of measurement system and the quantification of measurement uncertainty. It covers everything from fundamentals to special topics, each illustrated with case studies from the authors' work in the National Security Enterprise (NSE). The resulting work provides readers with a solid understanding of how to apply the covered techniques to metrology in a wide variety of contexts.The methodologies presented are supported with R script when appropriate, and the code has been made available to readers for use in their own applications. The volume also offers particular attention to design of experiments (DOEx), and addresses special topics such as statistical process control (SPC) in metrology, assessment of binary measurement systems, uncertainty quantification for "one-shot" devices, and new material on sample size selection in metrology studies. Designed to promote the collaboration between statistics and metrology, this book will be of use to practitioners using measurement science, researchers, and advanced undergraduate and graduate students in statistics and engineering disciplines 1. Introduction.- 2. Basic Concepts.- 3. The International System of Units (SI), Traceability, and Calibration.- 4. Introduction to Statistics and Probability.- 5. Measurement Uncertainty in Decision Making.- 6. The Measurement Model and Uncertainty.- 7. Analytical Methods for the Propagation of Uncertainties.- 8. Monte Carlo Methods for the Propagation of Uncertainties.- 9. Determining Uncertainties in Fitted Curves.- 10. Design of Experiments in Metrology.- 11. Special Topics in Metrology.- 12. Summary and Acknowledgments. Statistics Physical measurements Measurement Electrical engineering Mechanical engineering Statistics Hardcover, Softcover / Naturwissenschaften allgemein Delker, Collin Verfasser aut Forrest, Eric Verfasser aut Martin, Nevin Verfasser aut Erscheint auch als Online-Ausgabe 978-3-030-53329-8 |
| spellingShingle | Crowder, Stephen Delker, Collin Forrest, Eric Martin, Nevin Introduction to statistics in metrology Statistics Physical measurements Measurement Electrical engineering Mechanical engineering Statistics |
| title | Introduction to statistics in metrology |
| title_auth | Introduction to statistics in metrology |
| title_exact_search | Introduction to statistics in metrology |
| title_exact_search_txtP | Introduction to statistics in metrology |
| title_full | Introduction to statistics in metrology Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin |
| title_fullStr | Introduction to statistics in metrology Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin |
| title_full_unstemmed | Introduction to statistics in metrology Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin |
| title_short | Introduction to statistics in metrology |
| title_sort | introduction to statistics in metrology |
| topic | Statistics Physical measurements Measurement Electrical engineering Mechanical engineering Statistics |
| topic_facet | Statistics Physical measurements Measurement Electrical engineering Mechanical engineering Statistics |
| work_keys_str_mv | AT crowderstephen introductiontostatisticsinmetrology AT delkercollin introductiontostatisticsinmetrology AT forresteric introductiontostatisticsinmetrology AT martinnevin introductiontostatisticsinmetrology |