X-ray fluorescence spectroscopy for laboratory applications:
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Weinheim
Wiley-VCH
[2021]
|
Schlagworte: | |
Online-Zugang: | http://www.wiley-vch.de/publish/dt/books/ISBN978-3-527-34463-5/ Inhaltsverzeichnis |
Beschreibung: | xxiii, 464 Seiten Illustrationen, Diagramme |
ISBN: | 9783527344635 |
Internformat
MARC
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003 | DE-604 | ||
005 | 20221128 | ||
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008 | 200907s2021 gw a||| |||| 00||| eng d | ||
016 | 7 | |a 1207011274 |2 DE-101 | |
020 | |a 9783527344635 |c hbk. |9 978-3-527-34463-5 | ||
035 | |a (OCoLC)1241667553 | ||
035 | |a (DE-599)DNB1207011274 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
044 | |a gw |c XA-DE-BW | ||
049 | |a DE-11 |a DE-29 |a DE-19 |a DE-634 | ||
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084 | |a VG 8970 |0 (DE-625)147234:253 |2 rvk | ||
084 | |a 540 |2 sdnb | ||
100 | 1 | |a Haschke, Michael |d 1948- |e Verfasser |0 (DE-588)1128449366 |4 aut | |
245 | 1 | 0 | |a X-ray fluorescence spectroscopy for laboratory applications |c Michael Haschke, Jörg Flock, Michael Haller |
264 | 1 | |a Weinheim |b Wiley-VCH |c [2021] | |
264 | 4 | |c © 2021 | |
300 | |a xxiii, 464 Seiten |b Illustrationen, Diagramme | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 0 | 7 | |a Röntgenfluoreszenzspektroskopie |0 (DE-588)4135992-6 |2 gnd |9 rswk-swf |
653 | |a Analytical Chemistry | ||
653 | |a Analytische Chemie | ||
653 | |a Biotechnologie | ||
653 | |a Biotechnologie i. d. Biowissenschaften | ||
653 | |a Biotechnology | ||
653 | |a Biowissenschaften | ||
653 | |a Chemie | ||
653 | |a Chemistry | ||
653 | |a Life Sciences | ||
653 | |a Materials Characterization | ||
653 | |a Materials Science | ||
653 | |a Materialwissenschaften | ||
653 | |a Werkstoffprüfung | ||
653 | |a CH10: Analytische Chemie | ||
653 | |a LS35: Biotechnologie i. d. Biowissenschaften | ||
653 | |a MSA0: Werkstoffprüfung | ||
689 | 0 | 0 | |a Röntgenfluoreszenzspektroskopie |0 (DE-588)4135992-6 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Flock, Jörg |e Verfasser |0 (DE-588)1128449544 |4 aut | |
700 | 1 | |a Haller, Michael |d 1974- |e Verfasser |0 (DE-588)173954820 |4 aut | |
710 | 2 | |a Wiley-VCH |0 (DE-588)16179388-5 |4 pbl | |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, PDF |z 978-3-527-81660-6 |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, EPUB |z 978-3-527-81662-0 |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, oBook |z 978-3-527-81663-7 |
856 | 4 | 2 | |m X:MVB |u http://www.wiley-vch.de/publish/dt/books/ISBN978-3-527-34463-5/ |
856 | 4 | 2 | |m DNB Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=032295856&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
999 | |a oai:aleph.bib-bvb.de:BVB01-032295856 |
Datensatz im Suchindex
_version_ | 1804181747074596864 |
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adam_text | V
CONTENTS
PREFACE
XVII
LIST
OF
ABBREVIATIONS
AND
SYMBOLS
XIX
ABOUT
THE
AUTHORS
XXIII
1
INTRODUCTION
1
2
PRINCIPLES
OF
X-RAY
SPECTROMETRY
7
2.1
ANALYTICAL
PERFORMANCE
7
2.2
X-RAY
RADIATION
AND
THEIR
INTERACTION
11
2.2.1
PARTS OF
AN
X-RAY
SPECTRUM
11
2.2.2
INTENSITY
OF
THE
CHARACTERISTIC
RADIATION
13
2.2.3
NOMENCLATURE
OF
X-RAY
LINES
15
2.2.4
INTERACTION
OF
X-RAYS
WITH
MATTER
15
2.2.4.1
ABSORPTION
16
2.2.4.2
SCATTERING
17
2.2.5
DETECTION
OF
X-RAY
SPECTRA
20
2.3
THE
DEVELOPMENT
OF
X-RAY
SPECTROMETRY
21
2.4
CARRYING
OUT
AN
ANALYSIS
26
2.4.1
ANALYSIS
METHOD
26
2.4.2
SEQUENCE
OF
AN
ANALYSIS
27
2.4.2.1
QUALITY
OF
THE
SAMPLE
MATERIAL
27
2.4.2.2
SAMPLE
PREPARATION
27
2.4.2.3
ANALYSIS
TASK
28
2.4.2.4
MEASUREMENT
AND
EVALUATION
OF
THE
MEASUREMENT
DATA
28
2.4.2.5
CREATION OF
AN
ANALYSIS
REPORT
29
3
SAMPLE
PREPARATION
31
3.1
OBJECTIVES
OF
SAMPLE
PREPARATION
31
3.2
PREPARATION
TECHNIQUES
32
3.2.1
PREPARATION
TECHNIQUES
FOR
SOLID
SAMPLES
32
3.2.2
INFORMATION
DEPTH
AND
ANALYZED
VOLUME 32
3.2.3
INFINITE
THICKNESS
36
3.2.4
CONTAMINATIONS
37
3.2.5
HOMOGENEITY
38
VI
CONTENTS
3.3
PREPARATION
OF
COMPACT
AND
HOMOGENEOUS
MATERIALS
39
3.3.1
METALS
39
3.3.2
GLASSES
40
3.4
SMALL
PARTS
MATERIALS
41
3.4.1
GRINDING
OF
SMALL
PARTS
MATERIAL
42
3.4.2
PREPARATION
BY
POURING
LOOSE
POWDER
INTO
A
SAMPLE
CUP
43
3.4.3
PREPARATION
OF
THE
MEASUREMENT
SAMPLE BY
PRESSING
INTO
A
PELLET
44
3.4.4
PREPARATION
OF
THE
SAMPLE
BY
FUSION
BEADS
48
3.4.4.1
IMPROVING
THE
QUALITY
OF
THE
ANALYSIS
48
3.4.4.2
STEPS
FOR
THE
PRODUCTION OF
FUSION
BEADS
49
3.4.4.3
LOSS
OF
IGNITION
53
3.4.4.4
QUALITY
CRITERIA
FOR
FUSION
BEADS
53
3.4.4.5
PREPARATION
OF
SPECIAL
MATERIALS
54
3.5
LIQUID
SAMPLES
55
3.5.1
DIRECT
MEASUREMENT
OF
LIQUIDS
55
3.5.2
SPECIAL
PROCESSING
PROCEDURES
FOR LIQUID
SAMPLES
58
3.6
BIOLOGICAL
MATERIALS
58
3.7
SMALL
PARTICLES,
DUST,
AND
AEROSOLS
59
4
XRF
INSTRUMENT
TYPES
61
4.1
GENERAL
DESIGN
OF
AN
X-RAY
SPECTROMETER
61
4.2
COMPARISON
OF
WAVELENGTH-
AND
ENERGY-DISPERSIVE
X-RAY
SPECTROMETERS
63
4.2.1
DATA
ACQUISITION
63
4.2.2
RESOLUTION
64
4.2.2.1
COMPARISON OF
WAVELENGTH-
AND
ENERGY-DISPERSIVE
SPECTROMETRY
64
4.2.2.2
RESOLUTION
OF
WDS
INSTRUMENTS
66
4.2.2.3
RESOLUTION
OF
EDS
INSTRUMENTS
68
4.2.3
DETECTION
EFFICIENCY
70
4.2.4
COUNT
RATE
CAPABILITY
71
4.2.4.1
OPTIMUM
THROUGHPUT
IN
ED
SPECTROMETERS
71
4.2.4.2
SATURATION
EFFECTS
IN WDSS
72
4.2.4.3
OPTIMAL
SENSITIVITY
OF
ED
SPECTROMETERS
73
4.2.4.4
EFFECT
OF
THE
PULSE
THROUGHPUT
ON
THE
MEASURING
TIME
74
4.2.5
RADIATION
FLUX
75
4.2.6
SPECTRA
ARTIFACTS
76
4.2.6.1
ESCAPE
PEAKS
76
4.2.6.2
PILE-UP
PEAK
77
4.2.6.3
DIFFRACTION
PEAKS
77
4.2.6.4
SHELF
AND
TAIL
79
4.2.7
MECHANICAL
DESIGN
AND
OPERATING
COSTS
79
4.2.8
SETTING
PARAMETERS
80
4.3
TYPE
OF
INSTRUMENTS
80
4.3.1
ED
INSTRUMENTS
81
4.3.1.1
HANDHELD
INSTRUMENTS
82
4.3.1.2
PORTABLE
INSTRUMENTS
83
CONTENTS
VII
4.3.1.3
TABLETOP
INSTRUMENTS
84
4.3.2
WAVELENGTH-DISPERSIVE
INSTRUMENTS
85
4.3.2.1
SEQUENTIAL
SPECTROMETERS
85
4.3.2.2
MULTICHANNEL
SPECTROMETERS
87
4.3.3
SPECIAL
TYPE
X-RAY
SPECTROMETERS
87
4.3.3.1
TOTAL
REFLECTION
INSTRUMENTS
88
4.3.3.2
EXCITATION
BY
MONOENERGETIC
RADIATION
90
4.3.3.3
EXCITATION
WITH
POLARIZED
RADIATION
91
4.3.3.4
INSTRUMENTS
FOR
POSITION-SENSITIVE
ANALYSIS
93
4.3.3.5
MACRO
X-RAY
FLUORESCENCE
SPECTROMETER
94
4.3.3.6
MICRO
X-RAY
FLUORESCENCE
WITH
CONFOCAL
GEOMETRY
95
4.3.3.7
HIGH-RESOLUTION
X-RAY
SPECTROMETERS
96
4.3.3.8
ANGLE
RESOLVED
SPECTROSCOPY
-
GRAZING
INCIDENCE
AND
GRAZING
EXIT
96
4.4
COMMERCIALLY
AVAILABLE
INSTRUMENT
TYPES
98
5
MEASUREMENT
AND
EVALUATION
OF
X-RAY
SPECTRA
99
5.1
INFORMATION
CONTENT
OF
THE
SPECTRA
99
5.2
PROCEDURAL
STEPS
TO
EXECUTE
A
MEASUREMENT
101
5.3
SELECTING
THE
MEASUREMENT
CONDITIONS
102
5.3.1
OPTIMIZATION
CRITERIA
FOR
THE
MEASUREMENT
102
5.3.2
TUBE
PARAMETERS
103
5.3.2.1
TARGET
MATERIAL
103
5.3.2.2
EXCITATION
CONDITIONS
104
5.3.2.3
INFLUENCING
THE
ENERGY
DISTRIBUTION OF
THE
PRIMARY
SPECTRUM
105
5.3.3
MEASUREMENT
MEDIUM
107
5.3.4
MEASUREMENT
TIME
108
5.3.4.1
MEASUREMENT
TIME
AND
STATISTICAL
ERROR
108
5.3.4.2
MEASUREMENT
STRATEGIES
108
5.3.4.3
REAL
AND
LIVE
TIME
109
5.3.5
X-RAY
LINES
110
5.4
DETERMINATION
OF
PEAK
INTENSITY
112
5.4.1
INTENSITY
DATA
112
5.4.2
TREATMENT
OF
PEAK
OVERLAPS
112
5.4.3
SPECTRAL
BACKGROUND
114
5.5
QUANTIFICATION
MODELS
117
5.5.1
GENERAL
REMARKS
117
5.5.2
CONVENTIONAL
CALIBRATION
MODELS
118
5.5.3
FUNDAMENTAL
PARAMETER
MODELS
121
5.5.4
MONTE
CARLO
QUANTIFICATIONS
124
5.5.5
HIGHLY
PRECISE
QUANTIFICATION
BY
RECONSTITUTION
124
5.5.6
EVALUATION
OF
AN
ANALYTICAL
METHOD
126
5.5.6.1
DEGREE
OF
DETERMINATION
126
5.5.6.2
WORKING
RANGE,
LIMITS
OF
DETECTION
(LOD)
AND
OF
QUANTIFICATION
127
5.5.6.3
FIGURE
OF
MERIT
129
5.5.7
COMPARISON OF
THE
VARIOUS
QUANTIFICATION
MODELS
129
VIII
CONTENTS
5.5.8
5.5.9
5.6
5.6.1
5.6.2
5.6.3
5.7
5.7.1
5.7.2
5.7.3
5.8
5.8.1
5.8.2
AVAILABLE
REFERENCE
MATERIALS
131
OBTAINABLE
ACCURACIES
132
CHARACTERIZATION
OF
LAYERED
MATERIALS
133
GENERAL
FORM
OF
THE
CALIBRATION
CURVE
133
BASIC
CONDITIONS
FOR
LAYER
ANALYSIS
135
QUANTIFICATION
MODELS
FOR
THE
ANALYSIS
OF
LAYERS
138
CHEMOMETRIC
METHODS
FOR
MATERIAL
CHARACTERIZATION
140
SPECTRA
MATCHING
AND
MATERIAL
IDENTIFICATION
141
PHASE
ANALYSIS
141
REGRESSION
METHODS
143
CREATION
OF
AN
APPLICATION
143
ANALYSIS
OF
UNKNOWN
SAMPLE
QUALITIES
143
REPEATED
ANALYSES
ON
KNOWN
SAMPLES
144
6
6.1
6.1.1
6.1.2
6.1.3
6.1.4
6.2
6.2.1
6.2.2
6.3
6.3.1
6.3.2
6.3.3
6.3.3.1
6.3.3.2
6.4
ANALYTICAL
ERRORS
149
GENERAL
CONSIDERATIONS
149
PRECISION
OF
A
MEASUREMENT
151
LONG-TERM
STABILITY
OF
THE MEASUREMENTS
153
PRECISION
AND
PROCESS
CAPABILITY
154
TRUENESS
OF
THE
RESULT
156
TYPES
OF
ERRORS
156
RANDOMLY
DISTRIBUTED
ERRORS
157
SYSTEMATIC
ERRORS
158
ACCOUNTING
FOR
SYSTEMATIC
ERRORS
159
THE
CONCEPT
OF
MEASUREMENT
UNCERTAINTIES
159
ERROR
PROPAGATION
160
DETERMINATION
OF
MEASUREMENT
UNCERTAINTIES
161
BOTTOM-UP
METHOD
161
TOP-DOWN
METHOD
162
RECORDING
OF
ERROR
INFORMATION
164
7
7.1
7.2
7.3
7.3.1
7.3.2
7.3.3
7.4
7.5
7.6
OTHER
ELEMENT
ANALYTICAL
METHODS
167
OVERVIEW
167
ATOMIC
ABSORPTION
SPECTROMETRY
(AAS)
168
OPTICAL
EMISSION
SPECTROMETRY
169
EXCITATION
WITH
A
SPARK
DISCHARGE
(OES)
169
EXCITATION
IN
AN
INDUCTIVELY
COUPLED
PLASMA
(ICP-OES)
170
LASER-INDUCED
BREAKDOWN
SPECTROSCOPY
(LIBS)
171
MASS
SPECTROMETRY
(MS)
172
X-RAY
SPECTROMETRY
BY
PARTICLE
EXCITATION
(SEM-EDS,
PIXE)
173
COMPARISON OF
METHODS
175
8
8.1
8.2
8.3
RADIATION
PROTECTION
177
BASIC
PRINCIPLES
177
EFFECTS
OF
IONIZING
RADIATION
ON
HUMAN
TISSUE
178
NATURAL
RADIATION
EXPOSURE
179
CONTENTS
IX
8.4
8.4.1
RADIATION
PROTECTION
REGULATIONS
181
LEGAL
REGULATIONS
181
9
9.1
9.1.1
9.1.2
9.1.3
9.1.4
9.2
9.3
9.3.1
9.3.2
9.3.3
9.4
9.5
9.5.1
9.5.1.1
9.5.1.2
9.5.1.3
9.5.2
9.5.3
9.6
9.6.1
9.6.1.1
9.6.1.2
9.6.1.3
9.6.1.4
9.6.2
9.7
9.7.1
9.7.2
9.7.3
9.7.4
9.8
9.8.1
9.8.2
9.8.3
9.8.4
9.8.4.1
9.8.4.2
9.9
ANALYSIS
OF
HOMOGENEOUS
SOLID
SAMPLES
183
IRON
ALLOYS
183
ANALYTICAL
PROBLEM
AND
SAMPLE
PREPARATION
183
ANALYSIS
OF
PIG
AND
CAST
IRON
184
ANALYSIS
OF
LOW-ALLOY
STEEL
185
ANALYSIS
OF
HIGH-ALLOY
STEEL
187
NI-FE-CO
ALLOYS
188
COPPER
ALLOYS
189
ANALYTICAL
TASK
189
ANALYSIS
OF
COMPACT
SAMPLES
189
ANALYSIS
OF
DISSOLVED
SAMPLES
189
ALUMINUM
ALLOYS
191
SPECIAL
METALS
192
REFRACTORIES
192
ANALYTICAL
PROBLEM
192
SAMPLE
PREPARATION
OF
HARD
METALS
192
ANALYSIS
OF
HARD
METALS
193
TITANIUM
ALLOYS
194
SOLDER
ALLOYS
194
PRECIOUS
METALS
195
ANALYSIS
OF
PRECIOUS METAL
JEWELRY
195
ANALYTICAL
TASK
195
SAMPLE
SHAPE
AND
PREPARATION
196
ANALYTICAL
EQUIPMENT
197
ACCURACY
OF
THE
ANALYSIS
198
ANALYSIS
OF
PURE
ELEMENTS
198
GLASS
MATERIAL
199
ANALYTICAL
TASK
199
SAMPLE
PREPARATION
200
MEASUREMENT
EQUIPMENT
202
ACHIEVABLE
ACCURACIES
202
POLYMERS
203
ANALYTICAL
TASK
203
SAMPLE
PREPARATION
204
INSTRUMENTS
205
QUANTIFICATION
PROCEDURES
205
STANDARD-BASED
METHODS
205
CHEMOMETRIC
METHODS
206
ABRASION
ANALYSIS
209
10
10.1
ANALYSIS
OF
POWDER
SAMPLES
213
GEOLOGICAL
SAMPLES
213
CONTENTS
10.1,1
ANALYTICAL
TASK
213
10.1.2
SAMPLE
PREPARATION
214
10.1.3
MEASUREMENT
TECHNIQUE
275
10.1.4
DETECTION
LIMITS
AND
TRUENESS
275
10.2
ORES
276
10.2.1
ANALYTICAL
TASK
276
10.2.2
IRON
ORES
276
10.2.3
MN,
CO,
NI,
CU,
ZN,
AND
PB
ORES
277
10.2.4
BAUXITE
AND
ALUMINA
218
10.2.5
ORES
OF
PRECIOUS
METALS
AND
RARE
EARTHS
27
9
10.3
SOILS
AND
SEWAGE
SLUDGES
227
10.3.1
ANALYTICAL
TASK
227
10.3.2
SAMPLE
PREPARATION
227
10.3.3
MEASUREMENT
TECHNOLOGY
AND
ANALYTICAL
PERFORMANCE
222
10.4
QUARTZ
SAND
223
10.5
CEMENT
223
10.5.1
ANALYTICAL
TASK
223
10.5.2
SAMPLE
PREPARATION
224
10.5.3
MEASUREMENT
TECHNOLOGY
225
10.5.4
ANALYTICAL
PERFORMANCE
226
10.5.5
DETERMINATION OF
FREE
LIME
IN
CLINKER
227
10.6
COAL
AND
COKE
227
10.6.1
ANALYTICAL
TASK
227
10.6.2
SAMPLE
PREPARATION
228
10.6.3
MEASUREMENT
TECHNOLOGY
AND
ANALYTICAL
PERFORMANCE
229
10.7
FERROALLOYS
230
10.7.1
ANALYTICAL
TASK
230
10.7.2
SAMPLE
PREPARATION
230
10.7.3
ANALYSIS
TECHNOLOGY
232
10.7.4
ANALYTICAL
PERFORMANCE
234
10.8
SLAGS
235
10.8.1
ANALYTICAL
TASK
235
10.8.2
SAMPLE
PREPARATION
235
10.8.3
MEASUREMENT
TECHNOLOGY
AND
ANALYTICAL
ACCURACY
236
10.9
CERAMICS
AND
REFRACTORY
MATERIALS
237
10.9.1
ANALYTICAL
TASK
237
10.9.2
SAMPLE
PREPARATION
237
10.9.3
MEASUREMENT
TECHNOLOGY
AND
ANALYTICAL
PERFORMANCE
238
10.10
DUSTS
239
10.10.1
ANALYTICAL
PROBLEM
AND
DUST
COLLECTION
239
10.10.2
MEASUREMENT
242
10.11
FOOD
242
10.11.1
ANALYTICAL
TASK
242
10.11.2
MONITORING
OF
ANIMAL
FEED
243
10.11.3
CONTROL OF
INFANT
FOOD
244
10.12
PHARMACEUTICALS
245
10.12.1
ANALYTICAL
TASK
245
CONTENTS
XI
10.12.2
SAMPLE
PREPARATION
AND
ANALYSIS
METHOD
245
10.13
SECONDARY
FUELS
246
10.13.1
ANALYTICAL
TASK
246
10.13.2
SAMPLE
PREPARATION
247
10.13.2.1
SOLID
SECONDARY
RAW
MATERIALS
247
10.13.2.2
LIQUID
SECONDARY
RAW
MATERIALS
249
10.13.3
INSTRUMENTATION
AND
MEASUREMENT
CONDITIONS
250
10.13.4
MEASUREMENT UNCERTAINTIES
IN
THE
ANALYSIS
OF
SOLID
SECONDARY
RAW
MATERIALS
251
10.13.5
MEASUREMENT
UNCERTAINTIES
FOR
THE
ANALYSIS
OF
LIQUID
SECONDARY
RAW
MATERIALS
252
11
ANALYSIS
OF
LIQUIDS
253
11.1
MULTIELEMENT
ANALYSIS
OF
LIQUIDS
254
11.1.1
ANALYTICAL
TASK
254
11.1.2
SAMPLE
PREPARATION
254
11.1.3
MEASUREMENT
TECHNOLOGY
254
11.1.4
QUANTIFICATION
255
11.2
FUELS
AND
OILS
255
11.2.1
ANALYSIS
OF
TOXIC
ELEMENTS
IN
FUELS
256
11.2.1.1
MEASUREMENT
TECHNOLOGY
256
11.2.1.2
ANALYTICAL
PERFORMANCE
258
11.2.2
ANALYSIS
OF
ADDITIVES
IN
LUBRICATING
OILS
258
11.2.3
IDENTIFICATION
OF
ABRASIVE
PARTICLES
IN
USED
LUBRICANTS
260
11.3
TRACE
ANALYSIS
IN
LIQUIDS
261
11.3.1
ANALYTICAL
TASK
261
11.3.2
PREPARATION
BY
DRYING
261
11.3.3
QUANTIFICATION
262
11.4
SPECIAL
PREPARATION
TECHNIQUES
FOR
LIQUID
SAMPLES
263
11.4.1
DETERMINATION
OF
LIGHT
ELEMENTS
IN
LIQUIDS
263
11.4.2
ENRICHMENT
THROUGH
ABSORPTION AND
COMPLEX
FORMATION
264
12
TRACE
ANALYSIS
USING
TOTAL
REFLECTION
X-RAY
FLUORESCENCE
267
12.1
SPECIAL
FEATURES
OF
TXRF
267
12.2
SAMPLE
PREPARATION
FOR
TXRF
269
12.3
EVALUATION
OF
THE
SPECTRA
271
12.3.1
SPECTRUM
PREPARATION
AND
QUANTIFICATION
271
12.3.2
CONDITIONS
FOR
NEGLECTING
THE
MATRIX
INTERACTION
272
12.3.3
LIMITS
OF
DETECTION
273
12.4
TYPICAL
APPLICATIONS
OF
THE
TXRF
274
12.4.1
ANALYSIS
OF
AQUEOUS
SOLUTIONS
274
12.4.1.1
ANALYTICAL
PROBLEM
AND
PREPARATION
POSSIBILITIES
274
12.4.1.2
EXAMPLE:
ANALYSIS
OF
A
FRESH
WATER
STANDARD
SAMPLE
275
12.4.1.3
EXAMPLE:
DETECTION
OF
MERCURY
IN
WATER
277
12.4.2
ANALYSIS
OF
THE
SMALLEST
SAMPLE
QUANTITIES
278
12.4.2.1
EXAMPLE:
PIGMENT
ANALYSIS
278
XII
CONTENTS
12.4.2.2
12.4.2.3
12.4.3
12.4.3.1
12.4.3.2
12.4.4
12.4.5
12.4.5.1
12.4.5.2
EXAMPLE:
AEROSOL
ANALYSIS
279
EXAMPLE:
ANALYSIS
OF
NANOPARTICLES
279
TRACE
ELEMENT
ANALYSIS
ON
HUMAN
ORGANS
280
EXAMPLE:
ANALYSIS
OF
BLOOD
AND
BLOOD
SERUM
280
EXAMPLE:
ANALYSIS
OF
TRACE
ELEMENTS
IN
BODY
TISSUE
282
TRACE
ANALYSIS
OF
INORGANIC
AND
ORGANIC
CHEMICAL
PRODUCTS
283
ANALYSIS
OF
SEMICONDUCTOR
ELECTRONICS
284
ULTRA-TRACE
ANALYSIS
ON
SI
WAFERS
WITH
VPD
284
DEPTH
PROFILE
ANALYSIS
BY
ETCHING
285
13
13.1
13.2
13.3
NONHOMOGENEOUS
SAMPLES
287
MEASUREMENT
MODES
287
INSTRUMENT
REQUIREMENTS
288
DATA
EVALUATION
290
14
14.1
14.2
14.3
14.4
14.4.1
14.4.2
14.4.3
14.4.3.1
14.4.3.2
14.4.3.3
14.4.3.4
14.4.4
14.4.5
14.4.5.1
14.4.5.2
14.4.5.3
14.4.5.4
14.4.6
14.4.6.1
14.4.6.2
14.4.6.3
COATING
ANALYSIS
291
ANALYTICAL
TASK
291
SAMPLE
HANDLING
292
MEASUREMENT
TECHNOLOGY
293
THE
ANALYSIS
EXAMPLES
OF
COATED
SAMPLES
294
SINGLE-LAYER
SYSTEMS:
EMISSION
MODE
294
SINGLE-LAYER
SYSTEMS:
ABSORPTION
MODE
297
SINGLE-LAYER
SYSTEMS:
RELATIVE
MODE
298
ANALYTICAL
PROBLEM
298
VARIATION
OF
THE
SPECIFIED
WORKING
DISTANCE
298
SAMPLE
SIZE
AND
SPOT
SIZE
MISMATCH
299
NON-DETECTABLE
ELEMENTS
IN
THE
LAYER:
NIP
LAYERS
300
CHARACTERIZATION
OF
ULTRATHIN
LAYERS
302
MULTILAYER
SYSTEMS
304
LAYER
SYSTEMS
304
MEASUREMENT
TECHNOLOGY
305
EXAMPLE:
ANALYSIS
OF
CIGS
SOLAR
CELLS
305
EXAMPLE:
ANALYSIS
OF
SOLDER
STRUCTURES
306
SAMPLES
WITH
UNKNOWN
COATING
SYSTEMS
307
PREPARATION
OF
CROSS
SECTIONS
308
EXCITATION
AT
GRAZING
INCIDENCE
WITH
VARYING
ANGLES
309
MEASUREMENT
IN
CONFOCAL
GEOMETRY
311
15
15.1
15.1.1
15.1.2
15.1.3
15.1.4
15.1.5
SPOT
ANALYSES
313
PARTICLE
ANALYSES
313
ANALYTICAL
TASK
313
SAMPLE
PREPARATION
314
ANALYSIS
TECHNOLOGY
315
APPLICATION
EXAMPLE:
WEAR PARTICLES
IN
USED
OIL
315
APPLICATION
EXAMPLE:
IDENTIFICATION
OF
GLASS
PARTICLES
BY
CHEMOMETRICS
316
15.2
IDENTIFICATION
OF
INCLUSIONS
318
CONTENTS
XIII
15.3
15.3.1
15.3.2
15.3.3
15.3.4
15.3.5
15.3.5.1
15.3.5.2
15.3.5.3
15.3.5.4
15.3.5.5
15.3.5.6
15.4
MATERIAL
IDENTIFICATION
WITH
HANDHELD
INSTRUMENTS
318
ANALYTICAL
TASKS
318
ANALYSIS
TECHNOLOGY
319
SAMPLE
PREPARATION
AND
TEST
CONDITIONS
320
ANALYTICAL
ACCURACY
320
APPLICATION
EXAMPLES
321
EXAMPLE:
LEAD
IN
PAINT
321
EXAMPLE:
SCRAP
SORTING
321
EXAMPLE:
MATERIAL
INSPECTION
AND
SORTING
322
EXAMPLE:
PRECIOUS
METAL
ANALYSIS
322
EXAMPLE:
PROSPECTING
AND
SCREENING
IN
GEOLOGY
323
EXAMPLE:
INVESTIGATION
OF
WORKS
OF
ART
323
DETERMINATION
OF
TOXIC
ELEMENTS
IN
CONSUMER
PRODUCTS:
ROHS
MONITORING
324
15.4.1
15.4.2
15.4.3
15.5
15.5.1
15.5.2
15.5.3
ANALYTICAL
TASK
324
ANALYSIS
TECHNOLOGY
325
ANALYSIS
ACCURACY
327
TOXIC
ELEMENTS
IN
TOYS:
TOYS
STANDARD
328
ANALYTICAL
TASK
328
SAMPLE
PREPARATION
328
ANALYSIS
TECHNOLOGY
330
16
16.1
16.2
16.3
16.3.1
16.3.2
16.3.3
16.3.3.1
16.3.3.2
16.3.3.3
16.3.3.4
16.3.4
16.4
16.5
16.5.1
16.5.2
16.5.3
16.5.4
16.6
16.6.1
16.6.2
16.6.3
ANALYSIS
OF
ELEMENT
DISTRIBUTIONS
331
GENERAL
REMARKS
331
MEASUREMENT
CONDITIONS
332
GEOLOGY
333
SAMPLES
TYPES
333
SAMPLE
PREPARATION
AND
POSITIONING
333
MEASUREMENTS ON COMPACT
ROCK
SAMPLES
334
SUM
SPECTRUM
AND ELEMENT
DISTRIBUTIONS
334
OBJECT
SPECTRA
335
TREATMENT
OF
LINE
OVERLAPS
336
MAXIMUM
PIXEL
SPECTRUM
339
THIN
SECTIONS
OF
GEOLOGICAL
SAMPLES
340
ELECTRONICS
342
ARCHEOMETRIC
INVESTIGATIONS
344
ANALYTICAL
TASKS
344
SELECTION
OF
AN
APPROPRIATE
SPECTROMETER
346
INVESTIGATIONS
OF
COINS
347
INVESTIGATIONS
OF
PAINTING
PIGMENTS
349
HOMOGENEITY
TESTS
350
ANALYTICAL
TASK
350
HOMOGENEITY
STUDIES
USING
DISTRIBUTION
ANALYSIS
351
HOMOGENEITY
STUDIES
USING
MULTI-POINT
MEASUREMENTS
352
17
17.1
SPECIAL
APPLICATIONS
OF
THE
XRF
355
HIGH-THROUGHPUT
SCREENING
AND
COMBINATORIAL
ANALYSIS
355
XIV
CONTENTS
17.1.1
HIGH-THROUGHPUT
SCREENING
355
17.1.2
COMBINATORIAL
ANALYSIS
FOR
DRUG
DEVELOPMENT
357
17.2
CHEMOMETRIC
SPECTRAL
EVALUATION
358
17.3
HIGH-RESOLUTION
SPECTROSCOPY
FOR
SPECIATION
ANALYSIS
361
17.3.1
ANALYTICAL
TASK
361
17.3.2
INSTRUMENT
TECHNOLOGY
361
17.3.3
APPLICATION
EXAMPLES
362
17.3.3.1
ANALYSIS
OF
DIFFERENT
SULFUR
COMPOUNDS
362
17.3.3.2
SPECIATION
OF
ALUMINUM
INCLUSIONS
IN
STEEL
363
17.3.3.3
DETERMINATION
OF
SIO
2
IN
SIC
365
18
PROCESS
CONTROL
AND
AUTOMATION
367
18.1
GENERAL
OBJECTIVES
367
18.2
OFF-LINE
AND
AT-LINE
ANALYSIS
369
18.2.1
SAMPLE
SUPPLY
AND
ANALYSIS
369
18.2.2
AUTOMATED
SAMPLE
PREPARATION
371
18.3
IN-LINE
AND
ON-LINE
ANALYSIS
376
19
QUALITY
MANAGEMENT
AND
VALIDATION
379
19.1
MOTIVATION
379
19.2
VALIDATION
380
19.2.1
PARAMETERS
384
19.2.2
UNCERTAINTY
385
APPENDIX
A
TABLES
387
APPENDIX
B
IMPORTANT
INFORMATION
419
B.L
COORDINATES
OF
MAIN
MANUFACTURERS OF
INSTRUMENTS
AND
PREPARATION
TOOLS
419
B.2
MAIN
SUPPLIERS
OF
STANDARD
MATERIALS
422
B.2.1
GEOLOGICAL
MATERIALS
AND
METALS
422
B.2.2
STRATIFIED
MATERIALS
423
B.2.3
POLYMER
STANDARDS
424
B.2.4
HIGH
PURITY
MATERIALS
424
B.2.5
PRECIOUS
METAL
ALLOYS
425
B.3
IMPORTANT
WEBSITES
425
B.3.1
INFORMATION
ABOUT
X-RAY
ANALYTICS
AND
FUNDAMENTAL
PARAMETERS
425
B.3.2
INFORMATION
ABOUT
REFERENCE
MATERIALS
426
B.3.3
SCIENTIFIC
JOURNALS
427
B.4
LAWS
AND
ACTS,
WHICH
ARE
IMPORTANT
FOR
X-RAY
FLUORESCENCE
427
B.4.1
RADIATION
PROTECTION
427
B.4.2
REGULATIONS
FOR
ENVIRONMENTAL
CONTROL
428
B.4.3
REGULATIONS
FOR
PERFORMING
ANALYSIS
428
B.4.4
USE
OF
X-RAY
FLUORESCENCE
FOR
THE
CHEMICAL
ANALYSIS
428
B.4.4.1
GENERAL
REGULATIONS
428
CONTENTS
XV
B.4.4.2
ANALYSIS
OF
MINERALS
429
B.4.4.3
ANALYSIS
OF
OILS,
LIQUID
FUELS,
GREASE
430
B.4.4.4
ANALYSIS
OF
SOLID
FUELS
432
B.4.4.5
COATING
ANALYSIS
433
B.4.4.6
METALLURGY
433
B.4.4.7
ANALYSIS
OF
ELECTRONIC
COMPONENTS
434
REFERENCES
435
INDEX
453
|
adam_txt |
V
CONTENTS
PREFACE
XVII
LIST
OF
ABBREVIATIONS
AND
SYMBOLS
XIX
ABOUT
THE
AUTHORS
XXIII
1
INTRODUCTION
1
2
PRINCIPLES
OF
X-RAY
SPECTROMETRY
7
2.1
ANALYTICAL
PERFORMANCE
7
2.2
X-RAY
RADIATION
AND
THEIR
INTERACTION
11
2.2.1
PARTS OF
AN
X-RAY
SPECTRUM
11
2.2.2
INTENSITY
OF
THE
CHARACTERISTIC
RADIATION
13
2.2.3
NOMENCLATURE
OF
X-RAY
LINES
15
2.2.4
INTERACTION
OF
X-RAYS
WITH
MATTER
15
2.2.4.1
ABSORPTION
16
2.2.4.2
SCATTERING
17
2.2.5
DETECTION
OF
X-RAY
SPECTRA
20
2.3
THE
DEVELOPMENT
OF
X-RAY
SPECTROMETRY
21
2.4
CARRYING
OUT
AN
ANALYSIS
26
2.4.1
ANALYSIS
METHOD
26
2.4.2
SEQUENCE
OF
AN
ANALYSIS
27
2.4.2.1
QUALITY
OF
THE
SAMPLE
MATERIAL
27
2.4.2.2
SAMPLE
PREPARATION
27
2.4.2.3
ANALYSIS
TASK
28
2.4.2.4
MEASUREMENT
AND
EVALUATION
OF
THE
MEASUREMENT
DATA
28
2.4.2.5
CREATION OF
AN
ANALYSIS
REPORT
29
3
SAMPLE
PREPARATION
31
3.1
OBJECTIVES
OF
SAMPLE
PREPARATION
31
3.2
PREPARATION
TECHNIQUES
32
3.2.1
PREPARATION
TECHNIQUES
FOR
SOLID
SAMPLES
32
3.2.2
INFORMATION
DEPTH
AND
ANALYZED
VOLUME 32
3.2.3
INFINITE
THICKNESS
36
3.2.4
CONTAMINATIONS
37
3.2.5
HOMOGENEITY
38
VI
CONTENTS
3.3
PREPARATION
OF
COMPACT
AND
HOMOGENEOUS
MATERIALS
39
3.3.1
METALS
39
3.3.2
GLASSES
40
3.4
SMALL
PARTS
MATERIALS
41
3.4.1
GRINDING
OF
SMALL
PARTS
MATERIAL
42
3.4.2
PREPARATION
BY
POURING
LOOSE
POWDER
INTO
A
SAMPLE
CUP
43
3.4.3
PREPARATION
OF
THE
MEASUREMENT
SAMPLE BY
PRESSING
INTO
A
PELLET
44
3.4.4
PREPARATION
OF
THE
SAMPLE
BY
FUSION
BEADS
48
3.4.4.1
IMPROVING
THE
QUALITY
OF
THE
ANALYSIS
48
3.4.4.2
STEPS
FOR
THE
PRODUCTION OF
FUSION
BEADS
49
3.4.4.3
LOSS
OF
IGNITION
53
3.4.4.4
QUALITY
CRITERIA
FOR
FUSION
BEADS
53
3.4.4.5
PREPARATION
OF
SPECIAL
MATERIALS
54
3.5
LIQUID
SAMPLES
55
3.5.1
DIRECT
MEASUREMENT
OF
LIQUIDS
55
3.5.2
SPECIAL
PROCESSING
PROCEDURES
FOR LIQUID
SAMPLES
58
3.6
BIOLOGICAL
MATERIALS
58
3.7
SMALL
PARTICLES,
DUST,
AND
AEROSOLS
59
4
XRF
INSTRUMENT
TYPES
61
4.1
GENERAL
DESIGN
OF
AN
X-RAY
SPECTROMETER
61
4.2
COMPARISON
OF
WAVELENGTH-
AND
ENERGY-DISPERSIVE
X-RAY
SPECTROMETERS
63
4.2.1
DATA
ACQUISITION
63
4.2.2
RESOLUTION
64
4.2.2.1
COMPARISON OF
WAVELENGTH-
AND
ENERGY-DISPERSIVE
SPECTROMETRY
64
4.2.2.2
RESOLUTION
OF
WDS
INSTRUMENTS
66
4.2.2.3
RESOLUTION
OF
EDS
INSTRUMENTS
68
4.2.3
DETECTION
EFFICIENCY
70
4.2.4
COUNT
RATE
CAPABILITY
71
4.2.4.1
OPTIMUM
THROUGHPUT
IN
ED
SPECTROMETERS
71
4.2.4.2
SATURATION
EFFECTS
IN WDSS
72
4.2.4.3
OPTIMAL
SENSITIVITY
OF
ED
SPECTROMETERS
73
4.2.4.4
EFFECT
OF
THE
PULSE
THROUGHPUT
ON
THE
MEASURING
TIME
74
4.2.5
RADIATION
FLUX
75
4.2.6
SPECTRA
ARTIFACTS
76
4.2.6.1
ESCAPE
PEAKS
76
4.2.6.2
PILE-UP
PEAK
77
4.2.6.3
DIFFRACTION
PEAKS
77
4.2.6.4
SHELF
AND
TAIL
79
4.2.7
MECHANICAL
DESIGN
AND
OPERATING
COSTS
79
4.2.8
SETTING
PARAMETERS
80
4.3
TYPE
OF
INSTRUMENTS
80
4.3.1
ED
INSTRUMENTS
81
4.3.1.1
HANDHELD
INSTRUMENTS
82
4.3.1.2
PORTABLE
INSTRUMENTS
83
CONTENTS
VII
4.3.1.3
TABLETOP
INSTRUMENTS
84
4.3.2
WAVELENGTH-DISPERSIVE
INSTRUMENTS
85
4.3.2.1
SEQUENTIAL
SPECTROMETERS
85
4.3.2.2
MULTICHANNEL
SPECTROMETERS
87
4.3.3
SPECIAL
TYPE
X-RAY
SPECTROMETERS
87
4.3.3.1
TOTAL
REFLECTION
INSTRUMENTS
88
4.3.3.2
EXCITATION
BY
MONOENERGETIC
RADIATION
90
4.3.3.3
EXCITATION
WITH
POLARIZED
RADIATION
91
4.3.3.4
INSTRUMENTS
FOR
POSITION-SENSITIVE
ANALYSIS
93
4.3.3.5
MACRO
X-RAY
FLUORESCENCE
SPECTROMETER
94
4.3.3.6
MICRO
X-RAY
FLUORESCENCE
WITH
CONFOCAL
GEOMETRY
95
4.3.3.7
HIGH-RESOLUTION
X-RAY
SPECTROMETERS
96
4.3.3.8
ANGLE
RESOLVED
SPECTROSCOPY
-
GRAZING
INCIDENCE
AND
GRAZING
EXIT
96
4.4
COMMERCIALLY
AVAILABLE
INSTRUMENT
TYPES
98
5
MEASUREMENT
AND
EVALUATION
OF
X-RAY
SPECTRA
99
5.1
INFORMATION
CONTENT
OF
THE
SPECTRA
99
5.2
PROCEDURAL
STEPS
TO
EXECUTE
A
MEASUREMENT
101
5.3
SELECTING
THE
MEASUREMENT
CONDITIONS
102
5.3.1
OPTIMIZATION
CRITERIA
FOR
THE
MEASUREMENT
102
5.3.2
TUBE
PARAMETERS
103
5.3.2.1
TARGET
MATERIAL
103
5.3.2.2
EXCITATION
CONDITIONS
104
5.3.2.3
INFLUENCING
THE
ENERGY
DISTRIBUTION OF
THE
PRIMARY
SPECTRUM
105
5.3.3
MEASUREMENT
MEDIUM
107
5.3.4
MEASUREMENT
TIME
108
5.3.4.1
MEASUREMENT
TIME
AND
STATISTICAL
ERROR
108
5.3.4.2
MEASUREMENT
STRATEGIES
108
5.3.4.3
REAL
AND
LIVE
TIME
109
5.3.5
X-RAY
LINES
110
5.4
DETERMINATION
OF
PEAK
INTENSITY
112
5.4.1
INTENSITY
DATA
112
5.4.2
TREATMENT
OF
PEAK
OVERLAPS
112
5.4.3
SPECTRAL
BACKGROUND
114
5.5
QUANTIFICATION
MODELS
117
5.5.1
GENERAL
REMARKS
117
5.5.2
CONVENTIONAL
CALIBRATION
MODELS
118
5.5.3
FUNDAMENTAL
PARAMETER
MODELS
121
5.5.4
MONTE
CARLO
QUANTIFICATIONS
124
5.5.5
HIGHLY
PRECISE
QUANTIFICATION
BY
RECONSTITUTION
124
5.5.6
EVALUATION
OF
AN
ANALYTICAL
METHOD
126
5.5.6.1
DEGREE
OF
DETERMINATION
126
5.5.6.2
WORKING
RANGE,
LIMITS
OF
DETECTION
(LOD)
AND
OF
QUANTIFICATION
127
5.5.6.3
FIGURE
OF
MERIT
129
5.5.7
COMPARISON OF
THE
VARIOUS
QUANTIFICATION
MODELS
129
VIII
CONTENTS
5.5.8
5.5.9
5.6
5.6.1
5.6.2
5.6.3
5.7
5.7.1
5.7.2
5.7.3
5.8
5.8.1
5.8.2
AVAILABLE
REFERENCE
MATERIALS
131
OBTAINABLE
ACCURACIES
132
CHARACTERIZATION
OF
LAYERED
MATERIALS
133
GENERAL
FORM
OF
THE
CALIBRATION
CURVE
133
BASIC
CONDITIONS
FOR
LAYER
ANALYSIS
135
QUANTIFICATION
MODELS
FOR
THE
ANALYSIS
OF
LAYERS
138
CHEMOMETRIC
METHODS
FOR
MATERIAL
CHARACTERIZATION
140
SPECTRA
MATCHING
AND
MATERIAL
IDENTIFICATION
141
PHASE
ANALYSIS
141
REGRESSION
METHODS
143
CREATION
OF
AN
APPLICATION
143
ANALYSIS
OF
UNKNOWN
SAMPLE
QUALITIES
143
REPEATED
ANALYSES
ON
KNOWN
SAMPLES
144
6
6.1
6.1.1
6.1.2
6.1.3
6.1.4
6.2
6.2.1
6.2.2
6.3
6.3.1
6.3.2
6.3.3
6.3.3.1
6.3.3.2
6.4
ANALYTICAL
ERRORS
149
GENERAL
CONSIDERATIONS
149
PRECISION
OF
A
MEASUREMENT
151
LONG-TERM
STABILITY
OF
THE MEASUREMENTS
153
PRECISION
AND
PROCESS
CAPABILITY
154
TRUENESS
OF
THE
RESULT
156
TYPES
OF
ERRORS
156
RANDOMLY
DISTRIBUTED
ERRORS
157
SYSTEMATIC
ERRORS
158
ACCOUNTING
FOR
SYSTEMATIC
ERRORS
159
THE
CONCEPT
OF
MEASUREMENT
UNCERTAINTIES
159
ERROR
PROPAGATION
160
DETERMINATION
OF
MEASUREMENT
UNCERTAINTIES
161
BOTTOM-UP
METHOD
161
TOP-DOWN
METHOD
162
RECORDING
OF
ERROR
INFORMATION
164
7
7.1
7.2
7.3
7.3.1
7.3.2
7.3.3
7.4
7.5
7.6
OTHER
ELEMENT
ANALYTICAL
METHODS
167
OVERVIEW
167
ATOMIC
ABSORPTION
SPECTROMETRY
(AAS)
168
OPTICAL
EMISSION
SPECTROMETRY
169
EXCITATION
WITH
A
SPARK
DISCHARGE
(OES)
169
EXCITATION
IN
AN
INDUCTIVELY
COUPLED
PLASMA
(ICP-OES)
170
LASER-INDUCED
BREAKDOWN
SPECTROSCOPY
(LIBS)
171
MASS
SPECTROMETRY
(MS)
172
X-RAY
SPECTROMETRY
BY
PARTICLE
EXCITATION
(SEM-EDS,
PIXE)
173
COMPARISON OF
METHODS
175
8
8.1
8.2
8.3
RADIATION
PROTECTION
177
BASIC
PRINCIPLES
177
EFFECTS
OF
IONIZING
RADIATION
ON
HUMAN
TISSUE
178
NATURAL
RADIATION
EXPOSURE
179
CONTENTS
IX
8.4
8.4.1
RADIATION
PROTECTION
REGULATIONS
181
LEGAL
REGULATIONS
181
9
9.1
9.1.1
9.1.2
9.1.3
9.1.4
9.2
9.3
9.3.1
9.3.2
9.3.3
9.4
9.5
9.5.1
9.5.1.1
9.5.1.2
9.5.1.3
9.5.2
9.5.3
9.6
9.6.1
9.6.1.1
9.6.1.2
9.6.1.3
9.6.1.4
9.6.2
9.7
9.7.1
9.7.2
9.7.3
9.7.4
9.8
9.8.1
9.8.2
9.8.3
9.8.4
9.8.4.1
9.8.4.2
9.9
ANALYSIS
OF
HOMOGENEOUS
SOLID
SAMPLES
183
IRON
ALLOYS
183
ANALYTICAL
PROBLEM
AND
SAMPLE
PREPARATION
183
ANALYSIS
OF
PIG
AND
CAST
IRON
184
ANALYSIS
OF
LOW-ALLOY
STEEL
185
ANALYSIS
OF
HIGH-ALLOY
STEEL
187
NI-FE-CO
ALLOYS
188
COPPER
ALLOYS
189
ANALYTICAL
TASK
189
ANALYSIS
OF
COMPACT
SAMPLES
189
ANALYSIS
OF
DISSOLVED
SAMPLES
189
ALUMINUM
ALLOYS
191
SPECIAL
METALS
192
REFRACTORIES
192
ANALYTICAL
PROBLEM
192
SAMPLE
PREPARATION
OF
HARD
METALS
192
ANALYSIS
OF
HARD
METALS
193
TITANIUM
ALLOYS
194
SOLDER
ALLOYS
194
PRECIOUS
METALS
195
ANALYSIS
OF
PRECIOUS METAL
JEWELRY
195
ANALYTICAL
TASK
195
SAMPLE
SHAPE
AND
PREPARATION
196
ANALYTICAL
EQUIPMENT
197
ACCURACY
OF
THE
ANALYSIS
198
ANALYSIS
OF
PURE
ELEMENTS
198
GLASS
MATERIAL
199
ANALYTICAL
TASK
199
SAMPLE
PREPARATION
200
MEASUREMENT
EQUIPMENT
202
ACHIEVABLE
ACCURACIES
202
POLYMERS
203
ANALYTICAL
TASK
203
SAMPLE
PREPARATION
204
INSTRUMENTS
205
QUANTIFICATION
PROCEDURES
205
STANDARD-BASED
METHODS
205
CHEMOMETRIC
METHODS
206
ABRASION
ANALYSIS
209
10
10.1
ANALYSIS
OF
POWDER
SAMPLES
213
GEOLOGICAL
SAMPLES
213
CONTENTS
10.1,1
ANALYTICAL
TASK
213
10.1.2
SAMPLE
PREPARATION
214
10.1.3
MEASUREMENT
TECHNIQUE
275
10.1.4
DETECTION
LIMITS
AND
TRUENESS
275
10.2
ORES
276
10.2.1
ANALYTICAL
TASK
276
10.2.2
IRON
ORES
276
10.2.3
MN,
CO,
NI,
CU,
ZN,
AND
PB
ORES
277
10.2.4
BAUXITE
AND
ALUMINA
218
10.2.5
ORES
OF
PRECIOUS
METALS
AND
RARE
EARTHS
27
9
10.3
SOILS
AND
SEWAGE
SLUDGES
227
10.3.1
ANALYTICAL
TASK
227
10.3.2
SAMPLE
PREPARATION
227
10.3.3
MEASUREMENT
TECHNOLOGY
AND
ANALYTICAL
PERFORMANCE
222
10.4
QUARTZ
SAND
223
10.5
CEMENT
223
10.5.1
ANALYTICAL
TASK
223
10.5.2
SAMPLE
PREPARATION
224
10.5.3
MEASUREMENT
TECHNOLOGY
225
10.5.4
ANALYTICAL
PERFORMANCE
226
10.5.5
DETERMINATION OF
FREE
LIME
IN
CLINKER
227
10.6
COAL
AND
COKE
227
10.6.1
ANALYTICAL
TASK
227
10.6.2
SAMPLE
PREPARATION
228
10.6.3
MEASUREMENT
TECHNOLOGY
AND
ANALYTICAL
PERFORMANCE
229
10.7
FERROALLOYS
230
10.7.1
ANALYTICAL
TASK
230
10.7.2
SAMPLE
PREPARATION
230
10.7.3
ANALYSIS
TECHNOLOGY
232
10.7.4
ANALYTICAL
PERFORMANCE
234
10.8
SLAGS
235
10.8.1
ANALYTICAL
TASK
235
10.8.2
SAMPLE
PREPARATION
235
10.8.3
MEASUREMENT
TECHNOLOGY
AND
ANALYTICAL
ACCURACY
236
10.9
CERAMICS
AND
REFRACTORY
MATERIALS
237
10.9.1
ANALYTICAL
TASK
237
10.9.2
SAMPLE
PREPARATION
237
10.9.3
MEASUREMENT
TECHNOLOGY
AND
ANALYTICAL
PERFORMANCE
238
10.10
DUSTS
239
10.10.1
ANALYTICAL
PROBLEM
AND
DUST
COLLECTION
239
10.10.2
MEASUREMENT
242
10.11
FOOD
242
10.11.1
ANALYTICAL
TASK
242
10.11.2
MONITORING
OF
ANIMAL
FEED
243
10.11.3
CONTROL OF
INFANT
FOOD
244
10.12
PHARMACEUTICALS
245
10.12.1
ANALYTICAL
TASK
245
CONTENTS
XI
10.12.2
SAMPLE
PREPARATION
AND
ANALYSIS
METHOD
245
10.13
SECONDARY
FUELS
246
10.13.1
ANALYTICAL
TASK
246
10.13.2
SAMPLE
PREPARATION
247
10.13.2.1
SOLID
SECONDARY
RAW
MATERIALS
247
10.13.2.2
LIQUID
SECONDARY
RAW
MATERIALS
249
10.13.3
INSTRUMENTATION
AND
MEASUREMENT
CONDITIONS
250
10.13.4
MEASUREMENT UNCERTAINTIES
IN
THE
ANALYSIS
OF
SOLID
SECONDARY
RAW
MATERIALS
251
10.13.5
MEASUREMENT
UNCERTAINTIES
FOR
THE
ANALYSIS
OF
LIQUID
SECONDARY
RAW
MATERIALS
252
11
ANALYSIS
OF
LIQUIDS
253
11.1
MULTIELEMENT
ANALYSIS
OF
LIQUIDS
254
11.1.1
ANALYTICAL
TASK
254
11.1.2
SAMPLE
PREPARATION
254
11.1.3
MEASUREMENT
TECHNOLOGY
254
11.1.4
QUANTIFICATION
255
11.2
FUELS
AND
OILS
255
11.2.1
ANALYSIS
OF
TOXIC
ELEMENTS
IN
FUELS
256
11.2.1.1
MEASUREMENT
TECHNOLOGY
256
11.2.1.2
ANALYTICAL
PERFORMANCE
258
11.2.2
ANALYSIS
OF
ADDITIVES
IN
LUBRICATING
OILS
258
11.2.3
IDENTIFICATION
OF
ABRASIVE
PARTICLES
IN
USED
LUBRICANTS
260
11.3
TRACE
ANALYSIS
IN
LIQUIDS
261
11.3.1
ANALYTICAL
TASK
261
11.3.2
PREPARATION
BY
DRYING
261
11.3.3
QUANTIFICATION
262
11.4
SPECIAL
PREPARATION
TECHNIQUES
FOR
LIQUID
SAMPLES
263
11.4.1
DETERMINATION
OF
LIGHT
ELEMENTS
IN
LIQUIDS
263
11.4.2
ENRICHMENT
THROUGH
ABSORPTION AND
COMPLEX
FORMATION
264
12
TRACE
ANALYSIS
USING
TOTAL
REFLECTION
X-RAY
FLUORESCENCE
267
12.1
SPECIAL
FEATURES
OF
TXRF
267
12.2
SAMPLE
PREPARATION
FOR
TXRF
269
12.3
EVALUATION
OF
THE
SPECTRA
271
12.3.1
SPECTRUM
PREPARATION
AND
QUANTIFICATION
271
12.3.2
CONDITIONS
FOR
NEGLECTING
THE
MATRIX
INTERACTION
272
12.3.3
LIMITS
OF
DETECTION
273
12.4
TYPICAL
APPLICATIONS
OF
THE
TXRF
274
12.4.1
ANALYSIS
OF
AQUEOUS
SOLUTIONS
274
12.4.1.1
ANALYTICAL
PROBLEM
AND
PREPARATION
POSSIBILITIES
274
12.4.1.2
EXAMPLE:
ANALYSIS
OF
A
FRESH
WATER
STANDARD
SAMPLE
275
12.4.1.3
EXAMPLE:
DETECTION
OF
MERCURY
IN
WATER
277
12.4.2
ANALYSIS
OF
THE
SMALLEST
SAMPLE
QUANTITIES
278
12.4.2.1
EXAMPLE:
PIGMENT
ANALYSIS
278
XII
CONTENTS
12.4.2.2
12.4.2.3
12.4.3
12.4.3.1
12.4.3.2
12.4.4
12.4.5
12.4.5.1
12.4.5.2
EXAMPLE:
AEROSOL
ANALYSIS
279
EXAMPLE:
ANALYSIS
OF
NANOPARTICLES
279
TRACE
ELEMENT
ANALYSIS
ON
HUMAN
ORGANS
280
EXAMPLE:
ANALYSIS
OF
BLOOD
AND
BLOOD
SERUM
280
EXAMPLE:
ANALYSIS
OF
TRACE
ELEMENTS
IN
BODY
TISSUE
282
TRACE
ANALYSIS
OF
INORGANIC
AND
ORGANIC
CHEMICAL
PRODUCTS
283
ANALYSIS
OF
SEMICONDUCTOR
ELECTRONICS
284
ULTRA-TRACE
ANALYSIS
ON
SI
WAFERS
WITH
VPD
284
DEPTH
PROFILE
ANALYSIS
BY
ETCHING
285
13
13.1
13.2
13.3
NONHOMOGENEOUS
SAMPLES
287
MEASUREMENT
MODES
287
INSTRUMENT
REQUIREMENTS
288
DATA
EVALUATION
290
14
14.1
14.2
14.3
14.4
14.4.1
14.4.2
14.4.3
14.4.3.1
14.4.3.2
14.4.3.3
14.4.3.4
14.4.4
14.4.5
14.4.5.1
14.4.5.2
14.4.5.3
14.4.5.4
14.4.6
14.4.6.1
14.4.6.2
14.4.6.3
COATING
ANALYSIS
291
ANALYTICAL
TASK
291
SAMPLE
HANDLING
292
MEASUREMENT
TECHNOLOGY
293
THE
ANALYSIS
EXAMPLES
OF
COATED
SAMPLES
294
SINGLE-LAYER
SYSTEMS:
EMISSION
MODE
294
SINGLE-LAYER
SYSTEMS:
ABSORPTION
MODE
297
SINGLE-LAYER
SYSTEMS:
RELATIVE
MODE
298
ANALYTICAL
PROBLEM
298
VARIATION
OF
THE
SPECIFIED
WORKING
DISTANCE
298
SAMPLE
SIZE
AND
SPOT
SIZE
MISMATCH
299
NON-DETECTABLE
ELEMENTS
IN
THE
LAYER:
NIP
LAYERS
300
CHARACTERIZATION
OF
ULTRATHIN
LAYERS
302
MULTILAYER
SYSTEMS
304
LAYER
SYSTEMS
304
MEASUREMENT
TECHNOLOGY
305
EXAMPLE:
ANALYSIS
OF
CIGS
SOLAR
CELLS
305
EXAMPLE:
ANALYSIS
OF
SOLDER
STRUCTURES
306
SAMPLES
WITH
UNKNOWN
COATING
SYSTEMS
307
PREPARATION
OF
CROSS
SECTIONS
308
EXCITATION
AT
GRAZING
INCIDENCE
WITH
VARYING
ANGLES
309
MEASUREMENT
IN
CONFOCAL
GEOMETRY
311
15
15.1
15.1.1
15.1.2
15.1.3
15.1.4
15.1.5
SPOT
ANALYSES
313
PARTICLE
ANALYSES
313
ANALYTICAL
TASK
313
SAMPLE
PREPARATION
314
ANALYSIS
TECHNOLOGY
315
APPLICATION
EXAMPLE:
WEAR PARTICLES
IN
USED
OIL
315
APPLICATION
EXAMPLE:
IDENTIFICATION
OF
GLASS
PARTICLES
BY
CHEMOMETRICS
316
15.2
IDENTIFICATION
OF
INCLUSIONS
318
CONTENTS
XIII
15.3
15.3.1
15.3.2
15.3.3
15.3.4
15.3.5
15.3.5.1
15.3.5.2
15.3.5.3
15.3.5.4
15.3.5.5
15.3.5.6
15.4
MATERIAL
IDENTIFICATION
WITH
HANDHELD
INSTRUMENTS
318
ANALYTICAL
TASKS
318
ANALYSIS
TECHNOLOGY
319
SAMPLE
PREPARATION
AND
TEST
CONDITIONS
320
ANALYTICAL
ACCURACY
320
APPLICATION
EXAMPLES
321
EXAMPLE:
LEAD
IN
PAINT
321
EXAMPLE:
SCRAP
SORTING
321
EXAMPLE:
MATERIAL
INSPECTION
AND
SORTING
322
EXAMPLE:
PRECIOUS
METAL
ANALYSIS
322
EXAMPLE:
PROSPECTING
AND
SCREENING
IN
GEOLOGY
323
EXAMPLE:
INVESTIGATION
OF
WORKS
OF
ART
323
DETERMINATION
OF
TOXIC
ELEMENTS
IN
CONSUMER
PRODUCTS:
ROHS
MONITORING
324
15.4.1
15.4.2
15.4.3
15.5
15.5.1
15.5.2
15.5.3
ANALYTICAL
TASK
324
ANALYSIS
TECHNOLOGY
325
ANALYSIS
ACCURACY
327
TOXIC
ELEMENTS
IN
TOYS:
TOYS
STANDARD
328
ANALYTICAL
TASK
328
SAMPLE
PREPARATION
328
ANALYSIS
TECHNOLOGY
330
16
16.1
16.2
16.3
16.3.1
16.3.2
16.3.3
16.3.3.1
16.3.3.2
16.3.3.3
16.3.3.4
16.3.4
16.4
16.5
16.5.1
16.5.2
16.5.3
16.5.4
16.6
16.6.1
16.6.2
16.6.3
ANALYSIS
OF
ELEMENT
DISTRIBUTIONS
331
GENERAL
REMARKS
331
MEASUREMENT
CONDITIONS
332
GEOLOGY
333
SAMPLES
TYPES
333
SAMPLE
PREPARATION
AND
POSITIONING
333
MEASUREMENTS ON COMPACT
ROCK
SAMPLES
334
SUM
SPECTRUM
AND ELEMENT
DISTRIBUTIONS
334
OBJECT
SPECTRA
335
TREATMENT
OF
LINE
OVERLAPS
336
MAXIMUM
PIXEL
SPECTRUM
339
THIN
SECTIONS
OF
GEOLOGICAL
SAMPLES
340
ELECTRONICS
342
ARCHEOMETRIC
INVESTIGATIONS
344
ANALYTICAL
TASKS
344
SELECTION
OF
AN
APPROPRIATE
SPECTROMETER
346
INVESTIGATIONS
OF
COINS
347
INVESTIGATIONS
OF
PAINTING
PIGMENTS
349
HOMOGENEITY
TESTS
350
ANALYTICAL
TASK
350
HOMOGENEITY
STUDIES
USING
DISTRIBUTION
ANALYSIS
351
HOMOGENEITY
STUDIES
USING
MULTI-POINT
MEASUREMENTS
352
17
17.1
SPECIAL
APPLICATIONS
OF
THE
XRF
355
HIGH-THROUGHPUT
SCREENING
AND
COMBINATORIAL
ANALYSIS
355
XIV
CONTENTS
17.1.1
HIGH-THROUGHPUT
SCREENING
355
17.1.2
COMBINATORIAL
ANALYSIS
FOR
DRUG
DEVELOPMENT
357
17.2
CHEMOMETRIC
SPECTRAL
EVALUATION
358
17.3
HIGH-RESOLUTION
SPECTROSCOPY
FOR
SPECIATION
ANALYSIS
361
17.3.1
ANALYTICAL
TASK
361
17.3.2
INSTRUMENT
TECHNOLOGY
361
17.3.3
APPLICATION
EXAMPLES
362
17.3.3.1
ANALYSIS
OF
DIFFERENT
SULFUR
COMPOUNDS
362
17.3.3.2
SPECIATION
OF
ALUMINUM
INCLUSIONS
IN
STEEL
363
17.3.3.3
DETERMINATION
OF
SIO
2
IN
SIC
365
18
PROCESS
CONTROL
AND
AUTOMATION
367
18.1
GENERAL
OBJECTIVES
367
18.2
OFF-LINE
AND
AT-LINE
ANALYSIS
369
18.2.1
SAMPLE
SUPPLY
AND
ANALYSIS
369
18.2.2
AUTOMATED
SAMPLE
PREPARATION
371
18.3
IN-LINE
AND
ON-LINE
ANALYSIS
376
19
QUALITY
MANAGEMENT
AND
VALIDATION
379
19.1
MOTIVATION
379
19.2
VALIDATION
380
19.2.1
PARAMETERS
384
19.2.2
UNCERTAINTY
385
APPENDIX
A
TABLES
387
APPENDIX
B
IMPORTANT
INFORMATION
419
B.L
COORDINATES
OF
MAIN
MANUFACTURERS OF
INSTRUMENTS
AND
PREPARATION
TOOLS
419
B.2
MAIN
SUPPLIERS
OF
STANDARD
MATERIALS
422
B.2.1
GEOLOGICAL
MATERIALS
AND
METALS
422
B.2.2
STRATIFIED
MATERIALS
423
B.2.3
POLYMER
STANDARDS
424
B.2.4
HIGH
PURITY
MATERIALS
424
B.2.5
PRECIOUS
METAL
ALLOYS
425
B.3
IMPORTANT
WEBSITES
425
B.3.1
INFORMATION
ABOUT
X-RAY
ANALYTICS
AND
FUNDAMENTAL
PARAMETERS
425
B.3.2
INFORMATION
ABOUT
REFERENCE
MATERIALS
426
B.3.3
SCIENTIFIC
JOURNALS
427
B.4
LAWS
AND
ACTS,
WHICH
ARE
IMPORTANT
FOR
X-RAY
FLUORESCENCE
427
B.4.1
RADIATION
PROTECTION
427
B.4.2
REGULATIONS
FOR
ENVIRONMENTAL
CONTROL
428
B.4.3
REGULATIONS
FOR
PERFORMING
ANALYSIS
428
B.4.4
USE
OF
X-RAY
FLUORESCENCE
FOR
THE
CHEMICAL
ANALYSIS
428
B.4.4.1
GENERAL
REGULATIONS
428
CONTENTS
XV
B.4.4.2
ANALYSIS
OF
MINERALS
429
B.4.4.3
ANALYSIS
OF
OILS,
LIQUID
FUELS,
GREASE
430
B.4.4.4
ANALYSIS
OF
SOLID
FUELS
432
B.4.4.5
COATING
ANALYSIS
433
B.4.4.6
METALLURGY
433
B.4.4.7
ANALYSIS
OF
ELECTRONIC
COMPONENTS
434
REFERENCES
435
INDEX
453 |
any_adam_object | 1 |
any_adam_object_boolean | 1 |
author | Haschke, Michael 1948- Flock, Jörg Haller, Michael 1974- |
author_GND | (DE-588)1128449366 (DE-588)1128449544 (DE-588)173954820 |
author_facet | Haschke, Michael 1948- Flock, Jörg Haller, Michael 1974- |
author_role | aut aut aut |
author_sort | Haschke, Michael 1948- |
author_variant | m h mh j f jf m h mh |
building | Verbundindex |
bvnumber | BV046885941 |
classification_rvk | VG 8750 VG 8970 |
ctrlnum | (OCoLC)1241667553 (DE-599)DNB1207011274 |
discipline | Chemie / Pharmazie |
discipline_str_mv | Chemie / Pharmazie |
format | Book |
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id | DE-604.BV046885941 |
illustrated | Illustrated |
index_date | 2024-07-03T15:19:33Z |
indexdate | 2024-07-10T08:56:34Z |
institution | BVB |
institution_GND | (DE-588)16179388-5 |
isbn | 9783527344635 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032295856 |
oclc_num | 1241667553 |
open_access_boolean | |
owner | DE-11 DE-29 DE-19 DE-BY-UBM DE-634 |
owner_facet | DE-11 DE-29 DE-19 DE-BY-UBM DE-634 |
physical | xxiii, 464 Seiten Illustrationen, Diagramme |
publishDate | 2021 |
publishDateSearch | 2021 |
publishDateSort | 2021 |
publisher | Wiley-VCH |
record_format | marc |
spelling | Haschke, Michael 1948- Verfasser (DE-588)1128449366 aut X-ray fluorescence spectroscopy for laboratory applications Michael Haschke, Jörg Flock, Michael Haller Weinheim Wiley-VCH [2021] © 2021 xxiii, 464 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Röntgenfluoreszenzspektroskopie (DE-588)4135992-6 gnd rswk-swf Analytical Chemistry Analytische Chemie Biotechnologie Biotechnologie i. d. Biowissenschaften Biotechnology Biowissenschaften Chemie Chemistry Life Sciences Materials Characterization Materials Science Materialwissenschaften Werkstoffprüfung CH10: Analytische Chemie LS35: Biotechnologie i. d. Biowissenschaften MSA0: Werkstoffprüfung Röntgenfluoreszenzspektroskopie (DE-588)4135992-6 s DE-604 Flock, Jörg Verfasser (DE-588)1128449544 aut Haller, Michael 1974- Verfasser (DE-588)173954820 aut Wiley-VCH (DE-588)16179388-5 pbl Erscheint auch als Online-Ausgabe, PDF 978-3-527-81660-6 Erscheint auch als Online-Ausgabe, EPUB 978-3-527-81662-0 Erscheint auch als Online-Ausgabe, oBook 978-3-527-81663-7 X:MVB http://www.wiley-vch.de/publish/dt/books/ISBN978-3-527-34463-5/ DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=032295856&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Haschke, Michael 1948- Flock, Jörg Haller, Michael 1974- X-ray fluorescence spectroscopy for laboratory applications Röntgenfluoreszenzspektroskopie (DE-588)4135992-6 gnd |
subject_GND | (DE-588)4135992-6 |
title | X-ray fluorescence spectroscopy for laboratory applications |
title_auth | X-ray fluorescence spectroscopy for laboratory applications |
title_exact_search | X-ray fluorescence spectroscopy for laboratory applications |
title_exact_search_txtP | X-ray fluorescence spectroscopy for laboratory applications |
title_full | X-ray fluorescence spectroscopy for laboratory applications Michael Haschke, Jörg Flock, Michael Haller |
title_fullStr | X-ray fluorescence spectroscopy for laboratory applications Michael Haschke, Jörg Flock, Michael Haller |
title_full_unstemmed | X-ray fluorescence spectroscopy for laboratory applications Michael Haschke, Jörg Flock, Michael Haller |
title_short | X-ray fluorescence spectroscopy for laboratory applications |
title_sort | x ray fluorescence spectroscopy for laboratory applications |
topic | Röntgenfluoreszenzspektroskopie (DE-588)4135992-6 gnd |
topic_facet | Röntgenfluoreszenzspektroskopie |
url | http://www.wiley-vch.de/publish/dt/books/ISBN978-3-527-34463-5/ http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=032295856&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT haschkemichael xrayfluorescencespectroscopyforlaboratoryapplications AT flockjorg xrayfluorescencespectroscopyforlaboratoryapplications AT hallermichael xrayfluorescencespectroscopyforlaboratoryapplications AT wileyvch xrayfluorescencespectroscopyforlaboratoryapplications |