Noise in Nanoscale Semiconductor Devices:
Gespeichert in:
Weitere Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Cham
Springer International Publishing
2020
|
Ausgabe: | 1st ed. 2020 |
Schlagworte: | |
Beschreibung: | VI, 729 Seiten |
ISBN: | 9783030374990 |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
001 | BV046804897 | ||
003 | DE-604 | ||
005 | 20210104 | ||
007 | t | ||
008 | 200713s2020 |||| 00||| eng d | ||
020 | |a 9783030374990 |9 978-3-030-37499-0 | ||
035 | |a (OCoLC)1230235960 | ||
035 | |a (DE-599)BVBBV046804897 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-83 | ||
082 | 0 | |a 621.3815 |2 23 | |
084 | |a ZN 4035 |0 (DE-625)157342: |2 rvk | ||
245 | 1 | 0 | |a Noise in Nanoscale Semiconductor Devices |c edited by Tibor Grasser |
250 | |a 1st ed. 2020 | ||
264 | 1 | |a Cham |b Springer International Publishing |c 2020 | |
300 | |a VI, 729 Seiten | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Circuits and Systems | |
650 | 4 | |a Electronic Circuits and Devices | |
650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
650 | 4 | |a Electronic circuits | |
650 | 4 | |a Electronics | |
650 | 4 | |a Microelectronics | |
650 | 0 | 7 | |a CMOS |0 (DE-588)4010319-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a RAM |0 (DE-588)4176909-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronisches Rauschen |0 (DE-588)4151926-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Nanometerbereich |0 (DE-588)4327473-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a MOS-FET |0 (DE-588)4207266-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Statisches RAM |0 (DE-588)4381052-4 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Elektronisches Rauschen |0 (DE-588)4151926-7 |D s |
689 | 0 | 1 | |a Nanometerbereich |0 (DE-588)4327473-0 |D s |
689 | 0 | 2 | |a MOS-FET |0 (DE-588)4207266-9 |D s |
689 | 0 | 3 | |a RAM |0 (DE-588)4176909-0 |D s |
689 | 0 | 4 | |a Statisches RAM |0 (DE-588)4381052-4 |D s |
689 | 0 | 5 | |a CMOS |0 (DE-588)4010319-5 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Grasser, Tibor |d 1970- |0 (DE-588)136012345 |4 edt | |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-030-37500-3 |
999 | |a oai:aleph.bib-bvb.de:BVB01-032213562 |
Datensatz im Suchindex
_version_ | 1804181605359550464 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author2 | Grasser, Tibor 1970- |
author2_role | edt |
author2_variant | t g tg |
author_GND | (DE-588)136012345 |
author_facet | Grasser, Tibor 1970- |
building | Verbundindex |
bvnumber | BV046804897 |
classification_rvk | ZN 4035 |
ctrlnum | (OCoLC)1230235960 (DE-599)BVBBV046804897 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | 1st ed. 2020 |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01862nam a2200529zc 4500</leader><controlfield tag="001">BV046804897</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20210104 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">200713s2020 |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783030374990</subfield><subfield code="9">978-3-030-37499-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1230235960</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046804897</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4035</subfield><subfield code="0">(DE-625)157342:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Noise in Nanoscale Semiconductor Devices</subfield><subfield code="c">edited by Tibor Grasser</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2020</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2020</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 729 Seiten</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">RAM</subfield><subfield code="0">(DE-588)4176909-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronisches Rauschen</subfield><subfield code="0">(DE-588)4151926-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nanometerbereich</subfield><subfield code="0">(DE-588)4327473-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">MOS-FET</subfield><subfield code="0">(DE-588)4207266-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Statisches RAM</subfield><subfield code="0">(DE-588)4381052-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronisches Rauschen</subfield><subfield code="0">(DE-588)4151926-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Nanometerbereich</subfield><subfield code="0">(DE-588)4327473-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">MOS-FET</subfield><subfield code="0">(DE-588)4207266-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">RAM</subfield><subfield code="0">(DE-588)4176909-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="4"><subfield code="a">Statisches RAM</subfield><subfield code="0">(DE-588)4381052-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="5"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Grasser, Tibor</subfield><subfield code="d">1970-</subfield><subfield code="0">(DE-588)136012345</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-3-030-37500-3</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032213562</subfield></datafield></record></collection> |
id | DE-604.BV046804897 |
illustrated | Not Illustrated |
index_date | 2024-07-03T14:57:07Z |
indexdate | 2024-07-10T08:54:19Z |
institution | BVB |
isbn | 9783030374990 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032213562 |
oclc_num | 1230235960 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | VI, 729 Seiten |
publishDate | 2020 |
publishDateSearch | 2020 |
publishDateSort | 2020 |
publisher | Springer International Publishing |
record_format | marc |
spelling | Noise in Nanoscale Semiconductor Devices edited by Tibor Grasser 1st ed. 2020 Cham Springer International Publishing 2020 VI, 729 Seiten txt rdacontent n rdamedia nc rdacarrier Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Electronic circuits Electronics Microelectronics CMOS (DE-588)4010319-5 gnd rswk-swf RAM (DE-588)4176909-0 gnd rswk-swf Elektronisches Rauschen (DE-588)4151926-7 gnd rswk-swf Nanometerbereich (DE-588)4327473-0 gnd rswk-swf MOS-FET (DE-588)4207266-9 gnd rswk-swf Statisches RAM (DE-588)4381052-4 gnd rswk-swf Elektronisches Rauschen (DE-588)4151926-7 s Nanometerbereich (DE-588)4327473-0 s MOS-FET (DE-588)4207266-9 s RAM (DE-588)4176909-0 s Statisches RAM (DE-588)4381052-4 s CMOS (DE-588)4010319-5 s DE-604 Grasser, Tibor 1970- (DE-588)136012345 edt Erscheint auch als Online-Ausgabe 978-3-030-37500-3 |
spellingShingle | Noise in Nanoscale Semiconductor Devices Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Electronic circuits Electronics Microelectronics CMOS (DE-588)4010319-5 gnd RAM (DE-588)4176909-0 gnd Elektronisches Rauschen (DE-588)4151926-7 gnd Nanometerbereich (DE-588)4327473-0 gnd MOS-FET (DE-588)4207266-9 gnd Statisches RAM (DE-588)4381052-4 gnd |
subject_GND | (DE-588)4010319-5 (DE-588)4176909-0 (DE-588)4151926-7 (DE-588)4327473-0 (DE-588)4207266-9 (DE-588)4381052-4 |
title | Noise in Nanoscale Semiconductor Devices |
title_auth | Noise in Nanoscale Semiconductor Devices |
title_exact_search | Noise in Nanoscale Semiconductor Devices |
title_exact_search_txtP | Noise in Nanoscale Semiconductor Devices |
title_full | Noise in Nanoscale Semiconductor Devices edited by Tibor Grasser |
title_fullStr | Noise in Nanoscale Semiconductor Devices edited by Tibor Grasser |
title_full_unstemmed | Noise in Nanoscale Semiconductor Devices edited by Tibor Grasser |
title_short | Noise in Nanoscale Semiconductor Devices |
title_sort | noise in nanoscale semiconductor devices |
topic | Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Electronic circuits Electronics Microelectronics CMOS (DE-588)4010319-5 gnd RAM (DE-588)4176909-0 gnd Elektronisches Rauschen (DE-588)4151926-7 gnd Nanometerbereich (DE-588)4327473-0 gnd MOS-FET (DE-588)4207266-9 gnd Statisches RAM (DE-588)4381052-4 gnd |
topic_facet | Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Electronic circuits Electronics Microelectronics CMOS RAM Elektronisches Rauschen Nanometerbereich MOS-FET Statisches RAM |
work_keys_str_mv | AT grassertibor noiseinnanoscalesemiconductordevices |