Forster, C. (2019). Metamodel-based methodology for the application fitness analysis of microelectronic devices in automative applications.
Chicago Style (17th ed.) CitationForster, Christine. Metamodel-based Methodology for the Application Fitness Analysis of Microelectronic Devices in Automative Applications. München, 2019.
MLA (9th ed.) CitationForster, Christine. Metamodel-based Methodology for the Application Fitness Analysis of Microelectronic Devices in Automative Applications. 2019.
Warning: These citations may not always be 100% accurate.