Thermal Conductivity Measurements in Atomically Thin Materials and Devices:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore
Springer Singapore
2020
Singapore Springer |
Ausgabe: | 1st ed. 2020 |
Schriftenreihe: | Nanoscience and Nanotechnology
|
Schlagworte: | |
Online-Zugang: | BTU01 FAB01 FAW01 FHA01 FHD01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 URL des Erstveröffentlichers |
Beschreibung: | 1 Online-Ressource (XV, 50 p. 24 illus., 21 illus. in color) |
ISBN: | 9789811553486 |
ISSN: | 2196-1670 |
DOI: | 10.1007/978-981-15-5348-6 |
Internformat
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discipline | Elektrotechnik Maschinenbau |
discipline_str_mv | Elektrotechnik Maschinenbau |
doi_str_mv | 10.1007/978-981-15-5348-6 |
edition | 1st ed. 2020 |
format | Electronic eBook |
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illustrated | Not Illustrated |
index_date | 2024-07-03T14:41:10Z |
indexdate | 2025-02-20T07:00:10Z |
institution | BVB |
isbn | 9789811553486 |
issn | 2196-1670 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032157338 |
oclc_num | 1164609317 |
open_access_boolean | |
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physical | 1 Online-Ressource (XV, 50 p. 24 illus., 21 illus. in color) |
psigel | ZDB-2-ENG ZDB-2-ENG_2020_Fremddaten |
publishDate | 2020 |
publishDateSearch | 2020 |
publishDateSort | 2020 |
publisher | Springer Singapore Springer |
record_format | marc |
series2 | Nanoscience and Nanotechnology |
spellingShingle | Kasirga, T. Serkan Thermal Conductivity Measurements in Atomically Thin Materials and Devices Nanoscale Science and Technology Optical and Electronic Materials Engineering Thermodynamics, Heat and Mass Transfer Surface and Interface Science, Thin Films Solid State Physics Surfaces and Interfaces, Thin Films Nanoscale science Nanoscience Nanostructures Optical materials Electronic materials Thermodynamics Heat engineering Heat transfer Mass transfer Surfaces (Physics) Interfaces (Physical sciences) Thin films Solid state physics Materials—Surfaces |
title | Thermal Conductivity Measurements in Atomically Thin Materials and Devices |
title_auth | Thermal Conductivity Measurements in Atomically Thin Materials and Devices |
title_exact_search | Thermal Conductivity Measurements in Atomically Thin Materials and Devices |
title_exact_search_txtP | Thermal Conductivity Measurements in Atomically Thin Materials and Devices |
title_full | Thermal Conductivity Measurements in Atomically Thin Materials and Devices by T. Serkan Kasirga |
title_fullStr | Thermal Conductivity Measurements in Atomically Thin Materials and Devices by T. Serkan Kasirga |
title_full_unstemmed | Thermal Conductivity Measurements in Atomically Thin Materials and Devices by T. Serkan Kasirga |
title_short | Thermal Conductivity Measurements in Atomically Thin Materials and Devices |
title_sort | thermal conductivity measurements in atomically thin materials and devices |
topic | Nanoscale Science and Technology Optical and Electronic Materials Engineering Thermodynamics, Heat and Mass Transfer Surface and Interface Science, Thin Films Solid State Physics Surfaces and Interfaces, Thin Films Nanoscale science Nanoscience Nanostructures Optical materials Electronic materials Thermodynamics Heat engineering Heat transfer Mass transfer Surfaces (Physics) Interfaces (Physical sciences) Thin films Solid state physics Materials—Surfaces |
topic_facet | Nanoscale Science and Technology Optical and Electronic Materials Engineering Thermodynamics, Heat and Mass Transfer Surface and Interface Science, Thin Films Solid State Physics Surfaces and Interfaces, Thin Films Nanoscale science Nanoscience Nanostructures Optical materials Electronic materials Thermodynamics Heat engineering Heat transfer Mass transfer Surfaces (Physics) Interfaces (Physical sciences) Thin films Solid state physics Materials—Surfaces |
url | https://doi.org/10.1007/978-981-15-5348-6 |
work_keys_str_mv | AT kasirgatserkan thermalconductivitymeasurementsinatomicallythinmaterialsanddevices |