An introduction to surface analysis by XPS and AES:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hoboken, NJ ; Chichester, West Sussex
Wiley
2020
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| Edition: | Second edition |
| Subjects: | |
| Online Access: | DE-91 |
| Item Description: | Description based on publisher supplied metadata and other sources |
| Physical Description: | 1 Online-Ressource (288 Seiten) Illustrationen |
| ISBN: | 9781119417620 9781119417644 |
Staff View
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| 250 | |a Second edition | ||
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Record in the Search Index
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| dewey-full | 620.44 |
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| discipline | Chemie / Pharmazie Physik Werkstoffwissenschaften |
| discipline_str_mv | Physik Werkstoffwissenschaften |
| edition | Second edition |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| index_date | 2024-07-03T14:36:31Z |
| indexdate | 2024-07-20T04:02:57Z |
| institution | BVB |
| isbn | 9781119417620 9781119417644 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032141213 |
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| physical | 1 Online-Ressource (288 Seiten) Illustrationen |
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| spelling | Watts, John F. Verfasser (DE-588)140940685 aut An introduction to surface analysis by XPS and AES John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK Second edition Hoboken, NJ ; Chichester, West Sussex Wiley 2020 © 2020 1 Online-Ressource (288 Seiten) Illustrationen txt rdacontent c rdamedia cr rdacarrier Description based on publisher supplied metadata and other sources Surfaces (Technology)-Analysis Elektronenspektroskopie (DE-588)4014332-6 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd rswk-swf Auger-Spektroskopie (DE-588)4122843-1 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Elektronenspektroskopie (DE-588)4014332-6 s DE-604 Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 s Auger-Spektroskopie (DE-588)4122843-1 s Wolstenholme, John Sonstige oth Erscheint auch als Watts, John F. An Introduction to Surface Analysis by XPS and AES Newark : John Wiley & Sons, Incorporated,c2019 Druck-Ausgabe, Hardcover 978-1-119-41758-3 |
| spellingShingle | Watts, John F. An introduction to surface analysis by XPS and AES Surfaces (Technology)-Analysis Elektronenspektroskopie (DE-588)4014332-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd |
| subject_GND | (DE-588)4014332-6 (DE-588)4172243-7 (DE-588)4076787-5 (DE-588)4122843-1 |
| title | An introduction to surface analysis by XPS and AES |
| title_auth | An introduction to surface analysis by XPS and AES |
| title_exact_search | An introduction to surface analysis by XPS and AES |
| title_exact_search_txtP | An introduction to surface analysis by XPS and AES |
| title_full | An introduction to surface analysis by XPS and AES John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK |
| title_fullStr | An introduction to surface analysis by XPS and AES John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK |
| title_full_unstemmed | An introduction to surface analysis by XPS and AES John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK |
| title_short | An introduction to surface analysis by XPS and AES |
| title_sort | an introduction to surface analysis by xps and aes |
| topic | Surfaces (Technology)-Analysis Elektronenspektroskopie (DE-588)4014332-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd |
| topic_facet | Surfaces (Technology)-Analysis Elektronenspektroskopie Oberflächenanalyse Röntgen-Photoelektronenspektroskopie Auger-Spektroskopie |
| work_keys_str_mv | AT wattsjohnf anintroductiontosurfaceanalysisbyxpsandaes AT wolstenholmejohn anintroductiontosurfaceanalysisbyxpsandaes |