An introduction to surface analysis by XPS and AES:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Hoboken, NJ ; Chichester, West Sussex
Wiley
2020
|
| Ausgabe: | Second edition |
| Schlagworte: | |
| Online-Zugang: | DE-91 |
| Beschreibung: | Description based on publisher supplied metadata and other sources |
| Beschreibung: | 1 Online-Ressource (288 Seiten) Illustrationen |
| ISBN: | 9781119417620 9781119417644 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV046731144 | ||
| 003 | DE-604 | ||
| 005 | 20200610 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 200522s2020 |||| o||u| ||||||eng d | ||
| 020 | |a 9781119417620 |c Online |9 978-1-119-41762-0 | ||
| 020 | |a 9781119417644 |c Online |9 978-1-119-41764-4 | ||
| 035 | |a (ZDB-30-PQE)EBC5855523 | ||
| 035 | |a (ZDB-89-EBL)EBL5855523 | ||
| 035 | |a (OCoLC)1104910635 | ||
| 035 | |a (DE-599)BVBBV046731144 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 | ||
| 082 | 0 | |a 620.44 | |
| 084 | |a UP 7500 |0 (DE-625)146433: |2 rvk | ||
| 084 | |a UP 9330 |0 (DE-625)146460: |2 rvk | ||
| 084 | |a VG 8700 |0 (DE-625)147225:253 |2 rvk | ||
| 084 | |a VG 9700 |0 (DE-625)147242:253 |2 rvk | ||
| 084 | |a PHY 160f |2 stub | ||
| 084 | |a WER 770f |2 stub | ||
| 084 | |a PHY 116f |2 stub | ||
| 100 | 1 | |a Watts, John F. |e Verfasser |0 (DE-588)140940685 |4 aut | |
| 245 | 1 | 0 | |a An introduction to surface analysis by XPS and AES |c John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK |
| 250 | |a Second edition | ||
| 264 | 1 | |a Hoboken, NJ ; Chichester, West Sussex |b Wiley |c 2020 | |
| 264 | 4 | |c © 2020 | |
| 300 | |a 1 Online-Ressource (288 Seiten) |b Illustrationen | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Description based on publisher supplied metadata and other sources | ||
| 650 | 4 | |a Surfaces (Technology)-Analysis | |
| 650 | 0 | 7 | |a Elektronenspektroskopie |0 (DE-588)4014332-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgen-Photoelektronenspektroskopie |0 (DE-588)4076787-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Auger-Spektroskopie |0 (DE-588)4122843-1 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
| 689 | 0 | 1 | |a Elektronenspektroskopie |0 (DE-588)4014332-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
| 689 | 1 | 1 | |a Röntgen-Photoelektronenspektroskopie |0 (DE-588)4076787-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
| 689 | 2 | 1 | |a Auger-Spektroskopie |0 (DE-588)4122843-1 |D s |
| 689 | 2 | |5 DE-604 | |
| 700 | 1 | |a Wolstenholme, John |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |a Watts, John F. |t An Introduction to Surface Analysis by XPS and AES |d Newark : John Wiley & Sons, Incorporated,c2019 |n Druck-Ausgabe, Hardcover |z 978-1-119-41758-3 |
| 912 | |a ZDB-30-PQE | ||
| 966 | e | |u https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=5855523 |l DE-91 |p ZDB-30-PQE |q TUM_PDA_PQE_Kauf |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1805069244387295232 |
|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Watts, John F. |
| author_GND | (DE-588)140940685 |
| author_facet | Watts, John F. |
| author_role | aut |
| author_sort | Watts, John F. |
| author_variant | j f w jf jfw |
| building | Verbundindex |
| bvnumber | BV046731144 |
| classification_rvk | UP 7500 UP 9330 VG 8700 VG 9700 |
| classification_tum | PHY 160f WER 770f PHY 116f |
| collection | ZDB-30-PQE |
| ctrlnum | (ZDB-30-PQE)EBC5855523 (ZDB-89-EBL)EBL5855523 (OCoLC)1104910635 (DE-599)BVBBV046731144 |
| dewey-full | 620.44 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.44 |
| dewey-search | 620.44 |
| dewey-sort | 3620.44 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Physik Werkstoffwissenschaften |
| discipline_str_mv | Physik Werkstoffwissenschaften |
| edition | Second edition |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV046731144</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20200610</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">200522s2020 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119417620</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-119-41762-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119417644</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-119-41764-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PQE)EBC5855523</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL5855523</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1104910635</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046731144</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.44</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7500</subfield><subfield code="0">(DE-625)146433:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 9330</subfield><subfield code="0">(DE-625)146460:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 8700</subfield><subfield code="0">(DE-625)147225:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9700</subfield><subfield code="0">(DE-625)147242:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 160f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WER 770f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 116f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Watts, John F.</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)140940685</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">An introduction to surface analysis by XPS and AES</subfield><subfield code="c">John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Second edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, NJ ; Chichester, West Sussex</subfield><subfield code="b">Wiley</subfield><subfield code="c">2020</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2020</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (288 Seiten)</subfield><subfield code="b">Illustrationen</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on publisher supplied metadata and other sources</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Technology)-Analysis</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenspektroskopie</subfield><subfield code="0">(DE-588)4014332-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgen-Photoelektronenspektroskopie</subfield><subfield code="0">(DE-588)4076787-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Auger-Spektroskopie</subfield><subfield code="0">(DE-588)4122843-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronenspektroskopie</subfield><subfield code="0">(DE-588)4014332-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Röntgen-Photoelektronenspektroskopie</subfield><subfield code="0">(DE-588)4076787-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Auger-Spektroskopie</subfield><subfield code="0">(DE-588)4122843-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wolstenholme, John</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="a">Watts, John F.</subfield><subfield code="t">An Introduction to Surface Analysis by XPS and AES</subfield><subfield code="d">Newark : John Wiley & Sons, Incorporated,c2019</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-1-119-41758-3</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PQE</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=5855523</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-30-PQE</subfield><subfield code="q">TUM_PDA_PQE_Kauf</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV046731144 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T14:36:31Z |
| indexdate | 2024-07-20T04:02:57Z |
| institution | BVB |
| isbn | 9781119417620 9781119417644 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032141213 |
| oclc_num | 1104910635 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (288 Seiten) Illustrationen |
| psigel | ZDB-30-PQE ZDB-30-PQE TUM_PDA_PQE_Kauf |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Wiley |
| record_format | marc |
| spelling | Watts, John F. Verfasser (DE-588)140940685 aut An introduction to surface analysis by XPS and AES John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK Second edition Hoboken, NJ ; Chichester, West Sussex Wiley 2020 © 2020 1 Online-Ressource (288 Seiten) Illustrationen txt rdacontent c rdamedia cr rdacarrier Description based on publisher supplied metadata and other sources Surfaces (Technology)-Analysis Elektronenspektroskopie (DE-588)4014332-6 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd rswk-swf Auger-Spektroskopie (DE-588)4122843-1 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Elektronenspektroskopie (DE-588)4014332-6 s DE-604 Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 s Auger-Spektroskopie (DE-588)4122843-1 s Wolstenholme, John Sonstige oth Erscheint auch als Watts, John F. An Introduction to Surface Analysis by XPS and AES Newark : John Wiley & Sons, Incorporated,c2019 Druck-Ausgabe, Hardcover 978-1-119-41758-3 |
| spellingShingle | Watts, John F. An introduction to surface analysis by XPS and AES Surfaces (Technology)-Analysis Elektronenspektroskopie (DE-588)4014332-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd |
| subject_GND | (DE-588)4014332-6 (DE-588)4172243-7 (DE-588)4076787-5 (DE-588)4122843-1 |
| title | An introduction to surface analysis by XPS and AES |
| title_auth | An introduction to surface analysis by XPS and AES |
| title_exact_search | An introduction to surface analysis by XPS and AES |
| title_exact_search_txtP | An introduction to surface analysis by XPS and AES |
| title_full | An introduction to surface analysis by XPS and AES John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK |
| title_fullStr | An introduction to surface analysis by XPS and AES John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK |
| title_full_unstemmed | An introduction to surface analysis by XPS and AES John F. Watts, University of Surrey, UK, John Wolstenholme, Crowborough, UK |
| title_short | An introduction to surface analysis by XPS and AES |
| title_sort | an introduction to surface analysis by xps and aes |
| topic | Surfaces (Technology)-Analysis Elektronenspektroskopie (DE-588)4014332-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Auger-Spektroskopie (DE-588)4122843-1 gnd |
| topic_facet | Surfaces (Technology)-Analysis Elektronenspektroskopie Oberflächenanalyse Röntgen-Photoelektronenspektroskopie Auger-Spektroskopie |
| work_keys_str_mv | AT wattsjohnf anintroductiontosurfaceanalysisbyxpsandaes AT wolstenholmejohn anintroductiontosurfaceanalysisbyxpsandaes |