Electromagnetic compatibility (EMC) design and test case analysis:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
[Beijing]
Publishing House of Electronics Industry
2019
Hoboken, NJ, USA ; Singapore Wiley |
Schlagworte: | |
Online-Zugang: | TUM01 |
Beschreibung: | Description based on publisher supplied metadata and other sources |
Beschreibung: | 1 Online-Ressource (473 Seiten) Illustrationen, Diagramme, Pläne |
ISBN: | 9781118956854 9781118956830 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV046730493 | ||
003 | DE-604 | ||
005 | 20240216 | ||
007 | cr|uuu---uuuuu | ||
008 | 200522s2019 |||| o||u| ||||||eng d | ||
020 | |a 9781118956854 |q PDF |9 978-1-118-95685-4 | ||
020 | |a 9781118956830 |q EPUB |9 978-1-118-95683-0 | ||
035 | |a (ZDB-30-PQE)EBC5702864 | ||
035 | |a (ZDB-89-EBL)EBL5702864 | ||
035 | |a (OCoLC)1086380840 | ||
035 | |a (DE-599)BVBBV046730493 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-91 | ||
082 | 0 | |a 621.38224 | |
084 | |a ZN 4050 |0 (DE-625)157345: |2 rvk | ||
084 | |a ELT 242 |2 stub | ||
100 | 1 | |a Zheng, Junqi |d 1975- |e Verfasser |0 (DE-588)1190669080 |4 aut | |
245 | 1 | 0 | |a Electromagnetic compatibility (EMC) design and test case analysis |c Junqi Zhang |
264 | 1 | |a [Beijing] |b Publishing House of Electronics Industry |c 2019 | |
264 | 1 | |a Hoboken, NJ, USA ; Singapore |b Wiley | |
264 | 4 | |c © 2019 | |
300 | |a 1 Online-Ressource (473 Seiten) |b Illustrationen, Diagramme, Pläne | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
500 | |a Description based on publisher supplied metadata and other sources | ||
650 | 4 | |a Electromagnetic compatibility. | |
650 | 4 | |a Electromagnetic interference | |
650 | 0 | 7 | |a Elektromagnetische Verträglichkeit |0 (DE-588)4138552-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Fallstudiensammlung |0 (DE-588)4522595-3 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Elektromagnetische Verträglichkeit |0 (DE-588)4138552-4 |D s |
689 | 0 | 1 | |a Fallstudiensammlung |0 (DE-588)4522595-3 |D s |
689 | 0 | |5 DE-604 | |
776 | 0 | 8 | |i Erscheint auch als |a Zheng, Junqi |t Electromagnetic Compatibility (EMC) Design and Test Case Analysis |d Newark : John Wiley & Sons, Incorporated,c2019 |n Druck-Ausgabe, Hardcover |z 978-1-118-95682-3 |
912 | |a ZDB-30-PQE | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-032140562 | ||
966 | e | |u https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=5702864 |l TUM01 |p ZDB-30-PQE |q TUM_PDA_PQE_Kauf |x Aggregator |3 Volltext |
Datensatz im Suchindex
_version_ | 1804181477282283520 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Zheng, Junqi 1975- |
author_GND | (DE-588)1190669080 |
author_facet | Zheng, Junqi 1975- |
author_role | aut |
author_sort | Zheng, Junqi 1975- |
author_variant | j z jz |
building | Verbundindex |
bvnumber | BV046730493 |
classification_rvk | ZN 4050 |
classification_tum | ELT 242 |
collection | ZDB-30-PQE |
ctrlnum | (ZDB-30-PQE)EBC5702864 (ZDB-89-EBL)EBL5702864 (OCoLC)1086380840 (DE-599)BVBBV046730493 |
dewey-full | 621.38224 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.38224 |
dewey-search | 621.38224 |
dewey-sort | 3621.38224 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02034nmm a2200481zc 4500</leader><controlfield tag="001">BV046730493</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20240216 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">200522s2019 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118956854</subfield><subfield code="q">PDF</subfield><subfield code="9">978-1-118-95685-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118956830</subfield><subfield code="q">EPUB</subfield><subfield code="9">978-1-118-95683-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PQE)EBC5702864</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL5702864</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1086380840</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046730493</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.38224</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4050</subfield><subfield code="0">(DE-625)157345:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 242</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Zheng, Junqi</subfield><subfield code="d">1975-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1190669080</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electromagnetic compatibility (EMC) design and test case analysis</subfield><subfield code="c">Junqi Zhang</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">[Beijing]</subfield><subfield code="b">Publishing House of Electronics Industry</subfield><subfield code="c">2019</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, NJ, USA ; Singapore</subfield><subfield code="b">Wiley</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2019</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (473 Seiten)</subfield><subfield code="b">Illustrationen, Diagramme, Pläne</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on publisher supplied metadata and other sources</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electromagnetic compatibility.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electromagnetic interference</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektromagnetische Verträglichkeit</subfield><subfield code="0">(DE-588)4138552-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fallstudiensammlung</subfield><subfield code="0">(DE-588)4522595-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektromagnetische Verträglichkeit</subfield><subfield code="0">(DE-588)4138552-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Fallstudiensammlung</subfield><subfield code="0">(DE-588)4522595-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="a">Zheng, Junqi</subfield><subfield code="t">Electromagnetic Compatibility (EMC) Design and Test Case Analysis</subfield><subfield code="d">Newark : John Wiley & Sons, Incorporated,c2019</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-1-118-95682-3</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PQE</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032140562</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=5702864</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-30-PQE</subfield><subfield code="q">TUM_PDA_PQE_Kauf</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV046730493 |
illustrated | Not Illustrated |
index_date | 2024-07-03T14:36:28Z |
indexdate | 2024-07-10T08:52:16Z |
institution | BVB |
isbn | 9781118956854 9781118956830 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032140562 |
oclc_num | 1086380840 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | 1 Online-Ressource (473 Seiten) Illustrationen, Diagramme, Pläne |
psigel | ZDB-30-PQE ZDB-30-PQE TUM_PDA_PQE_Kauf |
publishDate | 2019 |
publishDateSearch | 2019 |
publishDateSort | 2019 |
publisher | Publishing House of Electronics Industry Wiley |
record_format | marc |
spelling | Zheng, Junqi 1975- Verfasser (DE-588)1190669080 aut Electromagnetic compatibility (EMC) design and test case analysis Junqi Zhang [Beijing] Publishing House of Electronics Industry 2019 Hoboken, NJ, USA ; Singapore Wiley © 2019 1 Online-Ressource (473 Seiten) Illustrationen, Diagramme, Pläne txt rdacontent c rdamedia cr rdacarrier Description based on publisher supplied metadata and other sources Electromagnetic compatibility. Electromagnetic interference Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd rswk-swf Fallstudiensammlung (DE-588)4522595-3 gnd rswk-swf Elektromagnetische Verträglichkeit (DE-588)4138552-4 s Fallstudiensammlung (DE-588)4522595-3 s DE-604 Erscheint auch als Zheng, Junqi Electromagnetic Compatibility (EMC) Design and Test Case Analysis Newark : John Wiley & Sons, Incorporated,c2019 Druck-Ausgabe, Hardcover 978-1-118-95682-3 |
spellingShingle | Zheng, Junqi 1975- Electromagnetic compatibility (EMC) design and test case analysis Electromagnetic compatibility. Electromagnetic interference Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd Fallstudiensammlung (DE-588)4522595-3 gnd |
subject_GND | (DE-588)4138552-4 (DE-588)4522595-3 |
title | Electromagnetic compatibility (EMC) design and test case analysis |
title_auth | Electromagnetic compatibility (EMC) design and test case analysis |
title_exact_search | Electromagnetic compatibility (EMC) design and test case analysis |
title_exact_search_txtP | Electromagnetic compatibility (EMC) design and test case analysis |
title_full | Electromagnetic compatibility (EMC) design and test case analysis Junqi Zhang |
title_fullStr | Electromagnetic compatibility (EMC) design and test case analysis Junqi Zhang |
title_full_unstemmed | Electromagnetic compatibility (EMC) design and test case analysis Junqi Zhang |
title_short | Electromagnetic compatibility (EMC) design and test case analysis |
title_sort | electromagnetic compatibility emc design and test case analysis |
topic | Electromagnetic compatibility. Electromagnetic interference Elektromagnetische Verträglichkeit (DE-588)4138552-4 gnd Fallstudiensammlung (DE-588)4522595-3 gnd |
topic_facet | Electromagnetic compatibility. Electromagnetic interference Elektromagnetische Verträglichkeit Fallstudiensammlung |
work_keys_str_mv | AT zhengjunqi electromagneticcompatibilityemcdesignandtestcaseanalysis |