Advanced computing in electron microscopy:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham
Springer
[2020]
|
| Edition: | Third edition |
| Subjects: | |
| Online Access: | BFB01 TUM01 UBM01 UBT01 UBY01 UER01 Volltext |
| Physical Description: | 1 Online-Ressource (xii, 354 Seiten) Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9783030332600 |
| DOI: | 10.1007/978-3-030-33260-0 |
Staff View
MARC
| LEADER | 00000nmm a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV046652504 | ||
| 003 | DE-604 | ||
| 005 | 20220517 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 200402s2020 |||| o||u| ||||||eng d | ||
| 020 | |a 9783030332600 |c Online |9 978-3-030-33260-0 | ||
| 024 | 7 | |a 10.1007/978-3-030-33260-0 |2 doi | |
| 035 | |a (ZDB-2-PHA)9783030332600 | ||
| 035 | |a (OCoLC)1197107180 | ||
| 035 | |a (DE-599)BVBBV046652504 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-19 |a DE-706 |a DE-703 |a DE-29 |a DE-522 |a DE-11 | ||
| 082 | 0 | |a 621.36 |2 23 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a PHY 000 |2 stub | ||
| 100 | 1 | |a Kirkland, Earl J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Advanced computing in electron microscopy |c Earl J. Kirkland |
| 250 | |a Third edition | ||
| 264 | 1 | |a Cham |b Springer |c [2020] | |
| 264 | 4 | |c © 2020 | |
| 300 | |a 1 Online-Ressource (xii, 354 Seiten) |b Illustrationen, Diagramme (teilweise farbig) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Image Processing and Computer Vision | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Biological Microscopy | |
| 650 | 4 | |a Spectroscopy/Spectrometry | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Optical data processing | |
| 650 | 4 | |a Materials science | |
| 650 | 0 | 7 | |a Computersimulation |0 (DE-588)4148259-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 1 | |a Computersimulation |0 (DE-588)4148259-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-030-33259-4 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-030-33260-0 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-PHA |a ZDB-30-PQE | ||
| 940 | 1 | |q ZDB-2-PHA_2020_Fremddaten | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-032063708 | ||
| 966 | e | |u https://doi.org/10.1007/978-3-030-33260-0 |l BFB01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-33260-0 |l TUM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-33260-0 |l UBM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-33260-0 |l UBT01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-030-33260-0 |l UBY01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://ebookcentral.proquest.com/lib/erlangen/detail.action?docID=6134017 |l UER01 |p ZDB-30-PQE |q UER_Einzelkauf |x Aggregator |3 Volltext | |
Record in the Search Index
| _version_ | 1804181356430753792 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Kirkland, Earl J. |
| author_facet | Kirkland, Earl J. |
| author_role | aut |
| author_sort | Kirkland, Earl J. |
| author_variant | e j k ej ejk |
| building | Verbundindex |
| bvnumber | BV046652504 |
| classification_rvk | UH 6300 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA ZDB-30-PQE |
| ctrlnum | (ZDB-2-PHA)9783030332600 (OCoLC)1197107180 (DE-599)BVBBV046652504 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-030-33260-0 |
| edition | Third edition |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02604nmm a2200625 c 4500</leader><controlfield tag="001">BV046652504</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220517 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">200402s2020 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783030332600</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-030-33260-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-030-33260-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-PHA)9783030332600</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1197107180</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046652504</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-522</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.36</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kirkland, Earl J.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced computing in electron microscopy</subfield><subfield code="c">Earl J. Kirkland</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Third edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield><subfield code="c">[2020]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2020</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xii, 354 Seiten)</subfield><subfield code="b">Illustrationen, Diagramme (teilweise farbig)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy and Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Image Processing and Computer Vision</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Biological Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy/Spectrometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials science</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-33259-4</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-030-33260-0</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield><subfield code="a">ZDB-30-PQE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_2020_Fremddaten</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032063708</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-33260-0</subfield><subfield code="l">BFB01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-33260-0</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-33260-0</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-33260-0</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-33260-0</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/erlangen/detail.action?docID=6134017</subfield><subfield code="l">UER01</subfield><subfield code="p">ZDB-30-PQE</subfield><subfield code="q">UER_Einzelkauf</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV046652504 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T14:17:18Z |
| indexdate | 2024-07-10T08:50:21Z |
| institution | BVB |
| isbn | 9783030332600 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032063708 |
| oclc_num | 1197107180 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-706 DE-703 DE-29 DE-522 DE-11 |
| owner_facet | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-706 DE-703 DE-29 DE-522 DE-11 |
| physical | 1 Online-Ressource (xii, 354 Seiten) Illustrationen, Diagramme (teilweise farbig) |
| psigel | ZDB-2-PHA ZDB-30-PQE ZDB-2-PHA_2020_Fremddaten ZDB-30-PQE UER_Einzelkauf |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Springer |
| record_format | marc |
| spelling | Kirkland, Earl J. Verfasser aut Advanced computing in electron microscopy Earl J. Kirkland Third edition Cham Springer [2020] © 2020 1 Online-Ressource (xii, 354 Seiten) Illustrationen, Diagramme (teilweise farbig) txt rdacontent c rdamedia cr rdacarrier Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry Spectroscopy Microscopy Optical data processing Materials science Computersimulation (DE-588)4148259-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Computersimulation (DE-588)4148259-1 s DE-604 Erscheint auch als Druck-Ausgabe 978-3-030-33259-4 https://doi.org/10.1007/978-3-030-33260-0 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Kirkland, Earl J. Advanced computing in electron microscopy Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry Spectroscopy Microscopy Optical data processing Materials science Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4148259-1 (DE-588)4014327-2 |
| title | Advanced computing in electron microscopy |
| title_auth | Advanced computing in electron microscopy |
| title_exact_search | Advanced computing in electron microscopy |
| title_exact_search_txtP | Advanced computing in electron microscopy |
| title_full | Advanced computing in electron microscopy Earl J. Kirkland |
| title_fullStr | Advanced computing in electron microscopy Earl J. Kirkland |
| title_full_unstemmed | Advanced computing in electron microscopy Earl J. Kirkland |
| title_short | Advanced computing in electron microscopy |
| title_sort | advanced computing in electron microscopy |
| topic | Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry Spectroscopy Microscopy Optical data processing Materials science Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry Spectroscopy Microscopy Optical data processing Materials science Computersimulation Elektronenmikroskopie |
| url | https://doi.org/10.1007/978-3-030-33260-0 |
| work_keys_str_mv | AT kirklandearlj advancedcomputinginelectronmicroscopy |