Advanced computing in electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2020]
|
| Ausgabe: | Third edition |
| Schlagworte: | |
| Online-Zugang: | BFB01 TUM01 UBM01 UBT01 UBY01 UER01 Volltext |
| Beschreibung: | 1 Online-Ressource (xii, 354 Seiten) Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9783030332600 |
| DOI: | 10.1007/978-3-030-33260-0 |
Internformat
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| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Biological Microscopy | |
| 650 | 4 | |a Spectroscopy/Spectrometry | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
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Datensatz im Suchindex
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| author | Kirkland, Earl J. |
| author_facet | Kirkland, Earl J. |
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| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
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| dewey-search | 621.36 |
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| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-030-33260-0 |
| edition | Third edition |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| index_date | 2024-07-03T14:17:18Z |
| indexdate | 2024-07-10T08:50:21Z |
| institution | BVB |
| isbn | 9783030332600 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032063708 |
| oclc_num | 1197107180 |
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| physical | 1 Online-Ressource (xii, 354 Seiten) Illustrationen, Diagramme (teilweise farbig) |
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| publishDate | 2020 |
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| publisher | Springer |
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| spelling | Kirkland, Earl J. Verfasser aut Advanced computing in electron microscopy Earl J. Kirkland Third edition Cham Springer [2020] © 2020 1 Online-Ressource (xii, 354 Seiten) Illustrationen, Diagramme (teilweise farbig) txt rdacontent c rdamedia cr rdacarrier Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry Spectroscopy Microscopy Optical data processing Materials science Computersimulation (DE-588)4148259-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Computersimulation (DE-588)4148259-1 s DE-604 Erscheint auch als Druck-Ausgabe 978-3-030-33259-4 https://doi.org/10.1007/978-3-030-33260-0 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Kirkland, Earl J. Advanced computing in electron microscopy Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry Spectroscopy Microscopy Optical data processing Materials science Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4148259-1 (DE-588)4014327-2 |
| title | Advanced computing in electron microscopy |
| title_auth | Advanced computing in electron microscopy |
| title_exact_search | Advanced computing in electron microscopy |
| title_exact_search_txtP | Advanced computing in electron microscopy |
| title_full | Advanced computing in electron microscopy Earl J. Kirkland |
| title_fullStr | Advanced computing in electron microscopy Earl J. Kirkland |
| title_full_unstemmed | Advanced computing in electron microscopy Earl J. Kirkland |
| title_short | Advanced computing in electron microscopy |
| title_sort | advanced computing in electron microscopy |
| topic | Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry Spectroscopy Microscopy Optical data processing Materials science Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry Spectroscopy Microscopy Optical data processing Materials science Computersimulation Elektronenmikroskopie |
| url | https://doi.org/10.1007/978-3-030-33260-0 |
| work_keys_str_mv | AT kirklandearlj advancedcomputinginelectronmicroscopy |