Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
Springer Singapore
2020
Singapore Springer |
| Schlagworte: | |
| Online-Zugang: | BTU01 FFW01 TUM01 Volltext |
| Beschreibung: | 1 Online-Ressource (XI, 139 p. 120 illus., 64 illus. in color) |
| ISBN: | 9789811522178 |
| DOI: | 10.1007/978-981-15-2217-8 |
Internformat
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| 245 | 1 | 0 | |a Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |c by Rui Lan |
| 264 | 1 | |a Singapore |b Springer Singapore |c 2020 | |
| 264 | 1 | |a Singapore |b Springer | |
| 300 | |a 1 Online-Ressource (XI, 139 p. 120 illus., 64 illus. in color) | ||
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| 650 | 4 | |a Characterization and Evaluation of Materials | |
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| 650 | 4 | |a Phase transitions (Statistical physics) | |
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Datensatz im Suchindex
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| any_adam_object | |
| author | Lan, Rui |
| author_facet | Lan, Rui |
| author_role | aut |
| author_sort | Lan, Rui |
| author_variant | r l rl |
| building | Verbundindex |
| bvnumber | BV046403410 |
| classification_tum | CHE 000 |
| collection | ZDB-2-CMS |
| ctrlnum | (ZDB-2-CMS)9789811522178 (OCoLC)1140124959 (DE-599)BVBBV046403410 |
| dewey-full | 620.11 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
| dewey-search | 620.11 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie |
| doi_str_mv | 10.1007/978-981-15-2217-8 |
| format | Electronic eBook |
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| id | DE-604.BV046403410 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:43:40Z |
| institution | BVB |
| isbn | 9789811522178 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031816132 |
| oclc_num | 1140124959 |
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| physical | 1 Online-Ressource (XI, 139 p. 120 illus., 64 illus. in color) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2020 |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Springer Singapore Springer |
| record_format | marc |
| spelling | Lan, Rui Verfasser aut Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory by Rui Lan Singapore Springer Singapore 2020 Singapore Springer 1 Online-Ressource (XI, 139 p. 120 illus., 64 illus. in color) txt rdacontent c rdamedia cr rdacarrier Characterization and Evaluation of Materials Optical and Electronic Materials Semiconductors Materials Engineering Electronic Circuits and Devices Phase Transitions and Multiphase Systems Materials science Optical materials Electronic materials Engineering—Materials Electronic circuits Phase transitions (Statistical physics) Erscheint auch als Druck-Ausgabe 978-981-152-216-1 Erscheint auch als Druck-Ausgabe 978-981-152-218-5 Erscheint auch als Druck-Ausgabe 978-981-152-219-2 https://doi.org/10.1007/978-981-15-2217-8 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Lan, Rui Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory Characterization and Evaluation of Materials Optical and Electronic Materials Semiconductors Materials Engineering Electronic Circuits and Devices Phase Transitions and Multiphase Systems Materials science Optical materials Electronic materials Engineering—Materials Electronic circuits Phase transitions (Statistical physics) |
| title | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |
| title_auth | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |
| title_exact_search | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |
| title_full | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory by Rui Lan |
| title_fullStr | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory by Rui Lan |
| title_full_unstemmed | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory by Rui Lan |
| title_short | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |
| title_sort | thermophysical properties and measuring technique of ge sb te alloys for phase change memory |
| topic | Characterization and Evaluation of Materials Optical and Electronic Materials Semiconductors Materials Engineering Electronic Circuits and Devices Phase Transitions and Multiphase Systems Materials science Optical materials Electronic materials Engineering—Materials Electronic circuits Phase transitions (Statistical physics) |
| topic_facet | Characterization and Evaluation of Materials Optical and Electronic Materials Semiconductors Materials Engineering Electronic Circuits and Devices Phase Transitions and Multiphase Systems Materials science Optical materials Electronic materials Engineering—Materials Electronic circuits Phase transitions (Statistical physics) |
| url | https://doi.org/10.1007/978-981-15-2217-8 |
| work_keys_str_mv | AT lanrui thermophysicalpropertiesandmeasuringtechniqueofgesbtealloysforphasechangememory |