Holdings: Microgrid: operation, control, monitoring and protection

Microgrid: operation, control, monitoring and protection:

Saved in:

Bibliographic Details
Other Authors:	Ray, Papia (Editor), Biswal, Monalisa (Editor)
Format:	Electronic eBook
Language:	English
Published:	Singapore Springer [2020]
Edition:	1st ed. 2020
Series:	Lecture notes in electrical engineering 625
Subjects:	Power Electronics, Electrical Machines and Networks Electronics and Microelectronics, Instrumentation Mechatronics Quality Control, Reliability, Safety and Risk Power electronics Electronics Microelectronics Quality control Reliability Industrial safety
Online Access:	DE-634 DE-1043 DE-1046 DE-Aug4 DE-1050 DE-573 DE-M347 DE-92 DE-898 DE-859 DE-860 DE-861 DE-863 DE-862 DE-523 DE-91 DE-706 Volltext Buchcover
Physical Description:	1 Online-Ressource (XV, 339 Seiten)
ISBN:	9789811517815
ISSN:	1876-1100
DOI:	10.1007/978-981-15-1781-5

Staff View

MARC


LEADER	00000nam a2200000zcb4500
001	BV046403265
003	DE-604
005	20250401
007	cr\|uuu---uuuuu
008	200203s2020 xx o\|\|\|\| 00\|\|\| eng d
020			\|a 9789811517815 \|c Online \|9 978-981-15-1781-5
024	7		\|a 10.1007/978-981-15-1781-5 \|2 doi
035			\|a (ZDB-2-ENG)9789811517815
035			\|a (OCoLC)1140145621
035			\|a (DE-599)BVBBV046403265
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-860 \|a DE-91 \|a DE-1046 \|a DE-1043 \|a DE-Aug4 \|a DE-898 \|a DE-861 \|a DE-523 \|a DE-859 \|a DE-863 \|a DE-1050 \|a DE-862 \|a DE-92 \|a DE-573 \|a DE-M347 \|a DE-706 \|a DE-634 \|a DE-83
082	0		\|a 621.317 \|2 23
084			\|a ELT 000 \|2 stub
084			\|a MAS 000 \|2 stub
245	1	0	\|a Microgrid: operation, control, monitoring and protection \|c Papia Ray, Monalisa Biswal, editors
264		1	\|a Singapore \|b Springer \|c [2020]
264		4	\|c © 2020
300			\|a 1 Online-Ressource (XV, 339 Seiten)
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
490	1		\|a Lecture notes in electrical engineering \|v 625
650		4	\|a Power Electronics, Electrical Machines and Networks
650		4	\|a Electronics and Microelectronics, Instrumentation
650		4	\|a Mechatronics
650		4	\|a Quality Control, Reliability, Safety and Risk
650		4	\|a Power electronics
650		4	\|a Electronics
650		4	\|a Microelectronics
650		4	\|a Mechatronics
650		4	\|a Quality control
650		4	\|a Reliability
650		4	\|a Industrial safety
700	1		\|a Ray, Papia \|4 edt
700	1		\|a Biswal, Monalisa \|4 edt
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-981-15-1780-8
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-981-15-1782-2
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-981-15-1783-9
830		0	\|a Lecture notes in electrical engineering \|v 625 \|w (DE-604)BV042385829 \|9 625
856	4	0	\|u https://doi.org/10.1007/978-981-15-1781-5 \|x Verlag \|z URL des Erstveröffentlichers \|3 Volltext
856	4	2	\|m SWB Datenaustausch \|q application/pdf \|u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031815987&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA \|3 Buchcover
912			\|a ZDB-2-ENG
940	1		\|q ZDB-2-ENG_2020_Fremddaten
943	1		\|a oai:aleph.bib-bvb.de:BVB01-031815987
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-634 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-1043 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-1046 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-Aug4 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-1050 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-573 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-M347 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-92 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-898 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-859 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-860 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-861 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-863 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-862 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-523 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-91 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-981-15-1781-5 \|l DE-706 \|p ZDB-2-ENG \|x Verlag \|3 Volltext

Record in the Search Index

DE-BY-FWS_katkey	747939
_version_	1828254373311938561
adam_text
any_adam_object	1
author2	Ray, Papia Biswal, Monalisa
author2_role	edt edt
author2_variant	p r pr m b mb
author_facet	Ray, Papia Biswal, Monalisa
building	Verbundindex
bvnumber	BV046403265
classification_tum	ELT 000 MAS 000
collection	ZDB-2-ENG
ctrlnum	(ZDB-2-ENG)9789811517815 (OCoLC)1140145621 (DE-599)BVBBV046403265
dewey-full	621.317
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.317
dewey-search	621.317
dewey-sort	3621.317
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau
doi_str_mv	10.1007/978-981-15-1781-5
edition	1st ed. 2020
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000zcb4500</leader><controlfield tag="001">BV046403265</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20250401</controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">200203s2020 xx o\|\|\|\| 00\|\|\| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789811517815</subfield><subfield code="c">Online</subfield><subfield code="9">978-981-15-1781-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-981-15-1781-5</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9789811517815</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1140145621</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046403265</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-860</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.317</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microgrid: operation, control, monitoring and protection</subfield><subfield code="c">Papia Ray, Monalisa Biswal, editors</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Springer</subfield><subfield code="c">[2020]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2020</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XV, 339 Seiten)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Lecture notes in electrical engineering</subfield><subfield code="v">625</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Power Electronics, Electrical Machines and Networks</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mechatronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality Control, Reliability, Safety and Risk</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Power electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mechatronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality control</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Industrial safety</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ray, Papia</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Biswal, Monalisa</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-15-1780-8</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-15-1782-2</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-15-1783-9</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Lecture notes in electrical engineering</subfield><subfield code="v">625</subfield><subfield code="w">(DE-604)BV042385829</subfield><subfield code="9">625</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">SWB Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031815987&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Buchcover</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2020_Fremddaten</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031815987</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-634</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-1043</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-1046</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-Aug4</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-1050</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-573</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-M347</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-92</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-898</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-859</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-860</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-861</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-863</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-862</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-523</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">DE-706</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id	DE-604.BV046403265
illustrated	Not Illustrated
indexdate	2025-04-02T04:00:39Z
institution	BVB
isbn	9789811517815
issn	1876-1100
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-031815987
oclc_num	1140145621
open_access_boolean
owner	DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 DE-83
owner_facet	DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 DE-83
physical	1 Online-Ressource (XV, 339 Seiten)
psigel	ZDB-2-ENG ZDB-2-ENG_2020_Fremddaten
publishDate	2020
publishDateSearch	2020
publishDateSort	2020
publisher	Springer
record_format	marc
series	Lecture notes in electrical engineering
series2	Lecture notes in electrical engineering
spellingShingle	Microgrid: operation, control, monitoring and protection Power Electronics, Electrical Machines and Networks Electronics and Microelectronics, Instrumentation Mechatronics Quality Control, Reliability, Safety and Risk Power electronics Electronics Microelectronics Quality control Reliability Industrial safety Lecture notes in electrical engineering
title	Microgrid: operation, control, monitoring and protection
title_auth	Microgrid: operation, control, monitoring and protection
title_exact_search	Microgrid: operation, control, monitoring and protection
title_full	Microgrid: operation, control, monitoring and protection Papia Ray, Monalisa Biswal, editors
title_fullStr	Microgrid: operation, control, monitoring and protection Papia Ray, Monalisa Biswal, editors
title_full_unstemmed	Microgrid: operation, control, monitoring and protection Papia Ray, Monalisa Biswal, editors
title_short	Microgrid: operation, control, monitoring and protection
title_sort	microgrid operation control monitoring and protection
topic	Power Electronics, Electrical Machines and Networks Electronics and Microelectronics, Instrumentation Mechatronics Quality Control, Reliability, Safety and Risk Power electronics Electronics Microelectronics Quality control Reliability Industrial safety
topic_facet	Power Electronics, Electrical Machines and Networks Electronics and Microelectronics, Instrumentation Mechatronics Quality Control, Reliability, Safety and Risk Power electronics Electronics Microelectronics Quality control Reliability Industrial safety
url	https://doi.org/10.1007/978-981-15-1781-5 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031815987&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
volume_link	(DE-604)BV042385829
work_keys_str_mv	AT raypapia microgridoperationcontrolmonitoringandprotection AT biswalmonalisa microgridoperationcontrolmonitoringandprotection

Holdings

Get full text

MARC

Record in the Search Index

Similar Items