Microgrid: Operation, Control, Monitoring and Protection:
Gespeichert in:
Weitere Verfasser: | , |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore
Springer Singapore
2020
Singapore Springer |
Ausgabe: | 1st ed. 2020 |
Schriftenreihe: | Lecture Notes in Electrical Engineering
625 |
Schlagworte: | |
Online-Zugang: | BTU01 FAB01 FAW01 FHA01 FHD01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 Volltext Buchcover |
Beschreibung: | 1 Online-Ressource (XV, 339 p) |
ISBN: | 9789811517815 |
ISSN: | 1876-1100 |
DOI: | 10.1007/978-981-15-1781-5 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV046403265 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 200203s2020 |||| o||u| ||||||eng d | ||
020 | |a 9789811517815 |c Online |9 978-981-151-781-5 | ||
024 | 7 | |a 10.1007/978-981-15-1781-5 |2 doi | |
035 | |a (ZDB-2-ENG)9789811517815 | ||
035 | |a (OCoLC)1140145621 | ||
035 | |a (DE-599)BVBBV046403265 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-860 |a DE-91 |a DE-1046 |a DE-1043 |a DE-Aug4 |a DE-898 |a DE-861 |a DE-523 |a DE-859 |a DE-863 |a DE-1050 |a DE-862 |a DE-92 |a DE-573 |a DE-M347 |a DE-706 |a DE-634 | ||
082 | 0 | |a 621.317 |2 23 | |
084 | |a MAS 000 |2 stub | ||
084 | |a ELT 000 |2 stub | ||
245 | 1 | 0 | |a Microgrid: Operation, Control, Monitoring and Protection |c edited by Papia Ray, Monalisa Biswal |
250 | |a 1st ed. 2020 | ||
264 | 1 | |a Singapore |b Springer Singapore |c 2020 | |
264 | 1 | |a Singapore |b Springer | |
300 | |a 1 Online-Ressource (XV, 339 p) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Lecture Notes in Electrical Engineering |v 625 |x 1876-1100 | |
650 | 4 | |a Power Electronics, Electrical Machines and Networks | |
650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
650 | 4 | |a Mechatronics | |
650 | 4 | |a Quality Control, Reliability, Safety and Risk | |
650 | 4 | |a Power electronics | |
650 | 4 | |a Electronics | |
650 | 4 | |a Microelectronics | |
650 | 4 | |a Mechatronics | |
650 | 4 | |a Quality control | |
650 | 4 | |a Reliability | |
650 | 4 | |a Industrial safety | |
700 | 1 | |a Ray, Papia |4 edt | |
700 | 1 | |a Biswal, Monalisa |4 edt | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-151-780-8 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-151-782-2 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-151-783-9 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-981-15-1781-5 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
856 | 4 | 2 | |m SWB Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031815987&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Buchcover |
912 | |a ZDB-2-ENG | ||
940 | 1 | |q ZDB-2-ENG_2020_Fremddaten | |
999 | |a oai:aleph.bib-bvb.de:BVB01-031815987 | ||
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FAB01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FAW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FHA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FHD01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FHM01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FKE01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FLA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FRO01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FWS01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l FWS02 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l HTW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l TUM01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-15-1781-5 |l UBY01 |p ZDB-2-ENG |x Verlag |3 Volltext |
Datensatz im Suchindex
DE-BY-FWS_katkey | 747939 |
---|---|
_version_ | 1806190623840010240 |
any_adam_object | 1 |
author2 | Ray, Papia Biswal, Monalisa |
author2_role | edt edt |
author2_variant | p r pr m b mb |
author_facet | Ray, Papia Biswal, Monalisa |
building | Verbundindex |
bvnumber | BV046403265 |
classification_tum | MAS 000 ELT 000 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)9789811517815 (OCoLC)1140145621 (DE-599)BVBBV046403265 |
dewey-full | 621.317 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.317 |
dewey-search | 621.317 |
dewey-sort | 3621.317 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
doi_str_mv | 10.1007/978-981-15-1781-5 |
edition | 1st ed. 2020 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03911nmm a2200781zcb4500</leader><controlfield tag="001">BV046403265</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">200203s2020 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789811517815</subfield><subfield code="c">Online</subfield><subfield code="9">978-981-151-781-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-981-15-1781-5</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9789811517815</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1140145621</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046403265</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-860</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.317</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microgrid: Operation, Control, Monitoring and Protection</subfield><subfield code="c">edited by Papia Ray, Monalisa Biswal</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2020</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Springer Singapore</subfield><subfield code="c">2020</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XV, 339 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Lecture Notes in Electrical Engineering</subfield><subfield code="v">625</subfield><subfield code="x">1876-1100</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Power Electronics, Electrical Machines and Networks</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mechatronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality Control, Reliability, Safety and Risk</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Power electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mechatronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality control</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Industrial safety</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ray, Papia</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Biswal, Monalisa</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-151-780-8</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-151-782-2</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-151-783-9</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">SWB Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031815987&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Buchcover</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2020_Fremddaten</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031815987</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FAB01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FHD01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FHM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">HTW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-15-1781-5</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV046403265 |
illustrated | Not Illustrated |
indexdate | 2024-08-01T15:06:48Z |
institution | BVB |
isbn | 9789811517815 |
issn | 1876-1100 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031815987 |
oclc_num | 1140145621 |
open_access_boolean | |
owner | DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
owner_facet | DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
physical | 1 Online-Ressource (XV, 339 p) |
psigel | ZDB-2-ENG ZDB-2-ENG_2020_Fremddaten |
publishDate | 2020 |
publishDateSearch | 2020 |
publishDateSort | 2020 |
publisher | Springer Singapore Springer |
record_format | marc |
series2 | Lecture Notes in Electrical Engineering |
spellingShingle | Microgrid: Operation, Control, Monitoring and Protection Power Electronics, Electrical Machines and Networks Electronics and Microelectronics, Instrumentation Mechatronics Quality Control, Reliability, Safety and Risk Power electronics Electronics Microelectronics Quality control Reliability Industrial safety |
title | Microgrid: Operation, Control, Monitoring and Protection |
title_auth | Microgrid: Operation, Control, Monitoring and Protection |
title_exact_search | Microgrid: Operation, Control, Monitoring and Protection |
title_full | Microgrid: Operation, Control, Monitoring and Protection edited by Papia Ray, Monalisa Biswal |
title_fullStr | Microgrid: Operation, Control, Monitoring and Protection edited by Papia Ray, Monalisa Biswal |
title_full_unstemmed | Microgrid: Operation, Control, Monitoring and Protection edited by Papia Ray, Monalisa Biswal |
title_short | Microgrid: Operation, Control, Monitoring and Protection |
title_sort | microgrid operation control monitoring and protection |
topic | Power Electronics, Electrical Machines and Networks Electronics and Microelectronics, Instrumentation Mechatronics Quality Control, Reliability, Safety and Risk Power electronics Electronics Microelectronics Quality control Reliability Industrial safety |
topic_facet | Power Electronics, Electrical Machines and Networks Electronics and Microelectronics, Instrumentation Mechatronics Quality Control, Reliability, Safety and Risk Power electronics Electronics Microelectronics Quality control Reliability Industrial safety |
url | https://doi.org/10.1007/978-981-15-1781-5 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031815987&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT raypapia microgridoperationcontrolmonitoringandprotection AT biswalmonalisa microgridoperationcontrolmonitoringandprotection |