Advanced Computing in Electron Microscopy:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Cham
Springer
[2020]
|
Ausgabe: | Third edition |
Schlagworte: | |
Beschreibung: | xii, 354 Seiten Illustrationen, Diagramme (teilweise farbig) 235 mm |
ISBN: | 9783030332594 |
Internformat
MARC
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245 | 1 | 0 | |a Advanced Computing in Electron Microscopy |c Earl J. Kirkland |
250 | |a Third edition | ||
264 | 1 | |a Cham |b Springer |c [2020] | |
264 | 4 | |c © 2020 | |
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650 | 4 | |a Spectroscopy | |
650 | 4 | |a Microscopy | |
650 | 4 | |a Optical data processing | |
650 | 4 | |a Materials science | |
650 | 4 | |a Microscopy | |
650 | 4 | |a Spectroscopy | |
650 | 4 | |a Physics | |
650 | 0 | 7 | |a Computersimulation |0 (DE-588)4148259-1 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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any_adam_object | |
author | Kirkland, Earl J. |
author_facet | Kirkland, Earl J. |
author_role | aut |
author_sort | Kirkland, Earl J. |
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building | Verbundindex |
bvnumber | BV046349620 |
classification_rvk | UH 6300 |
ctrlnum | (OCoLC)1153988701 (DE-599)BVBBV046349620 |
discipline | Physik |
edition | Third edition |
format | Book |
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id | DE-604.BV046349620 |
illustrated | Illustrated |
indexdate | 2024-07-10T08:42:23Z |
institution | BVB |
isbn | 9783030332594 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031726140 |
oclc_num | 1153988701 |
open_access_boolean | |
owner | DE-29T DE-11 |
owner_facet | DE-29T DE-11 |
physical | xii, 354 Seiten Illustrationen, Diagramme (teilweise farbig) 235 mm |
publishDate | 2020 |
publishDateSearch | 2020 |
publishDateSort | 2020 |
publisher | Springer |
record_format | marc |
spelling | Kirkland, Earl J. Verfasser aut Advanced Computing in Electron Microscopy Earl J. Kirkland Third edition Cham Springer [2020] © 2020 xii, 354 Seiten Illustrationen, Diagramme (teilweise farbig) 235 mm txt rdacontent n rdamedia nc rdacarrier bicssc bisacsh Spectroscopy Microscopy Optical data processing Materials science Physics Computersimulation (DE-588)4148259-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Hardcover, Softcover / Physik, Astronomie/Mechanik, Akustik Elektronenmikroskopie (DE-588)4014327-2 s Computersimulation (DE-588)4148259-1 s DE-604 Erscheint auch als Online-Ausgabe 978-3-030-33260-0 |
spellingShingle | Kirkland, Earl J. Advanced Computing in Electron Microscopy bicssc bisacsh Spectroscopy Microscopy Optical data processing Materials science Physics Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
subject_GND | (DE-588)4148259-1 (DE-588)4014327-2 |
title | Advanced Computing in Electron Microscopy |
title_auth | Advanced Computing in Electron Microscopy |
title_exact_search | Advanced Computing in Electron Microscopy |
title_full | Advanced Computing in Electron Microscopy Earl J. Kirkland |
title_fullStr | Advanced Computing in Electron Microscopy Earl J. Kirkland |
title_full_unstemmed | Advanced Computing in Electron Microscopy Earl J. Kirkland |
title_short | Advanced Computing in Electron Microscopy |
title_sort | advanced computing in electron microscopy |
topic | bicssc bisacsh Spectroscopy Microscopy Optical data processing Materials science Physics Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
topic_facet | bicssc bisacsh Spectroscopy Microscopy Optical data processing Materials science Physics Computersimulation Elektronenmikroskopie |
work_keys_str_mv | AT kirklandearlj advancedcomputinginelectronmicroscopy |