Characterisation and control of defects in semiconductors:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
London
<<The>> Institution of Engineering and Technology
2019
|
| Schriftenreihe: | IET materials, circuits and devices series
45 |
| Schlagworte: | |
| Online-Zugang: | FWS01 FWS02 UBT01 UBY01 UER01 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (596 Seiten) Illustrationen, Diagramme |
| ISBN: | 9781785616563 |
| DOI: | 10.1049/PBCS045E |
Internformat
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| id | DE-604.BV046317120 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-01T15:31:09Z |
| institution | BVB |
| isbn | 9781785616563 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031694192 |
| oclc_num | 1135412742 |
| open_access_boolean | |
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| owner_facet | DE-29 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-703 DE-706 |
| physical | 1 Online-Ressource (596 Seiten) Illustrationen, Diagramme |
| psigel | ZDB-100-IET ZDB-100-IET UBT_PDA_IET_Kauf |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | <<The>> Institution of Engineering and Technology |
| record_format | marc |
| series | IET materials, circuits and devices series |
| series2 | IET materials, circuits and devices series |
| spellingShingle | Characterisation and control of defects in semiconductors IET materials, circuits and devices series Semiconductors / Defects Semiconductors / Analysis Semiconductors / Analysis fast Semiconductors / Defects fast |
| title | Characterisation and control of defects in semiconductors |
| title_auth | Characterisation and control of defects in semiconductors |
| title_exact_search | Characterisation and control of defects in semiconductors |
| title_full | Characterisation and control of defects in semiconductors edited by Filip Tuomisto |
| title_fullStr | Characterisation and control of defects in semiconductors edited by Filip Tuomisto |
| title_full_unstemmed | Characterisation and control of defects in semiconductors edited by Filip Tuomisto |
| title_short | Characterisation and control of defects in semiconductors |
| title_sort | characterisation and control of defects in semiconductors |
| topic | Semiconductors / Defects Semiconductors / Analysis Semiconductors / Analysis fast Semiconductors / Defects fast |
| topic_facet | Semiconductors / Defects Semiconductors / Analysis |
| url | https://doi.org/10.1049/PBCS045E |
| volume_link | (DE-604)BV044007507 |
| work_keys_str_mv | AT tuomistofilip characterisationandcontrolofdefectsinsemiconductors |